Ridler, N M (2001) Evaluating and expressing uncertainty in complex S-parameter measurements. In: ARFTG/NIST Measurements Short Course on RF Measurements for Wireless World, 27-28 November 2001, San Diego, CA, USA.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Electromagnetics Electromagnetics > RF and Microwave
Last Modified:	02 Feb 2018 13:17
URI:	http://eprintspublications.npl.co.uk/id/eprint/2724

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