Shang, X; Ridler, N M; Ding, J; Geen, M (2021) Introductory guide to making planar S-parameter measurements at millimetre-wave frequencies. Other. National Physical Laboratory.

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Abstract

This Introductory Guide aims to provide guidance to end users on implementing straightforward methods to perform reliable on-wafer calibration and measurement at millimetre-wave frequencies. High frequency on-wafer measurement is challenging and remains an active area of research. This guide will briefly review key considerations affecting the accuracy of measurement and these include experimental setup, choice of calibration methods, testing environment, crosstalk/isolation between probes, measurement verification, and design considerations for TRL calibration kits.

Item Type:	Report/Guide (Other)
Keywords:	Calibration, on-wafer measurement, planar measurement, S-parameters, millimetre-wave, probes, traceability, vector network analyzer (VNA)
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Publisher:	National Physical Laboratory
Identification number/DOI:	10.47120/npl.9001
Last Modified:	13 Jan 2021 09:46
URI:	http://eprintspublications.npl.co.uk/id/eprint/9001

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