< back to main site

Publications

Using data visualisation techniques to explore the random error distribution of two-port VNA measurements.

Salter, M J; Ridler, N M; Stewart, J N* (2000) Using data visualisation techniques to explore the random error distribution of two-port VNA measurements. In: 31st Automated RF and Microwave Measurements Society (ARMMS) Conference, 22-23 May 2000, Dudley.

Full text not available from this repository.

Abstract

No abstract available

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/1971

Actions (login required)

View Item View Item