Salter, M J; Ridler, N M; Stewart, J N* (2000) Using data visualisation techniques to explore the random error distribution of two-port VNA measurements. In: 31st Automated RF and Microwave Measurements Society (ARMMS) Conference, 22-23 May 2000, Dudley.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1971 |
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