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Traceability to National Standards for S parameter measurements of waveguide devices from 110 GHz to 170 GHz.

Ridler, N M; Salter, M J; Wilson, A; Pollard, R*; Clarke, R* (2009) Traceability to National Standards for S parameter measurements of waveguide devices from 110 GHz to 170 GHz. In: 73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, USA.

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Abstract

This paper describes a new facilitiy that has been introduced recently to provide high precision scattering coefficient measurements of waveguide devices in the frequency range from 110 GHz to 170 GHz. The facility comprises measurement instrumentation situated at the University of Leeds and associated primary reference standards owned by NPL. Typical measurements, with uncertainties, are given to illustrate the current state-of-the-art for measurements of this type.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4452

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