Koo, H; Salter, M; Kang, N W; Ridler, N M; Hong, Y P (2021) Uncertainty of S-parameter Measurements on PCBs due to Imperfections in the TRL Line Standard. Journal of Electromagnetic Engineering and Science, 21 (5). pp. 369-378.

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Abstract

This paper evaluates the uncertainty of S-parameter measurements on multilayer printed circuit boards (PCBs) due to the uncertainties of the dimensions and dielectric properties of the line standard in the Through-Reflect-Line (TRL) calibration. This evaluation has been done in two ways: one is based on repeated TRL calibrations with a randomly perturbed line standard, and the other is based on equations given by Stumper. The two methods require the uncertainties of the S-parameters of the TRL line standard, which are obtained from the uncertainties of the dimensions and dielectric properties using three-dimensional (3D) electromagnetic (EM) Monte Carlo simulation. The two methods agree well with each other. This work also shows how to apply impedance renormalization in Stumper’s equations. We designed the TRL standard lines and the devices under test (DUTs) in PCB stripline, and measured precisely the cross-sectional dimensions of the fabricated striplines. Uncertainty analysis based on the measured values enables us to investigate the impact of realistic deviations in the dimensions of the TRL line standard on the S-parameter measurement uncertainty of the DUTs. Lastly, as an example, we evaluated the uncertainty in measured S-parameters of a Beatty line on the fabricated PCB.

Item Type:	Article
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Electromagnetic & Electrochemical Technologies
Last Modified:	15 Sep 2023 14:07
URI:	http://eprintspublications.npl.co.uk/id/eprint/9815

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