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Analyzing uncertainty matrices associated with multiple S-parameter measurements.

Ridler, N M; Salter, M J (2015) Analyzing uncertainty matrices associated with multiple S-parameter measurements. In: 85th ARFTG Microwave Measurement Conference Proceedings, 22 May 2015, Phoenix, Az, USA.

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Abstract

No abstract available

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/ARFTG.2015.7162898
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/6766

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