Skinner, J; Ridler, N M; Miller, N; Brokenshire, S; Bayley, N; Young, P (2023) Benchmarking Seamless Sub-mmWave and Terahertz Rectangular Metallic Waveguide. Microwave Journal, 66 (11). pp. 60-68.

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Abstract

A new range of seamless waveguide sections for sub-mmWave/terahertz (THz) frequency bands have recently been developed by Flann Microwave Ltd. Both 1 in. and 2 in. sections designed for operation at these frequencies have been manufactured using proprietary techniques. A selection of these sections in the WM-380-band (500 to 750 GHz) have been tested at the U.K.’s National Physical Laboratory (NPL) where they were measured electrically using a vector network analyzer (VNA) calibrated using NPL’s primary reference standards. The results were benchmarked against measurements of equivalent devices in this waveguide size from another manufacturer representing the industry standard. They were also compared with modeled results calculated using reference values of resistivity for the waveguide conductor as a benchmark representing the “ideal” case. The results demonstrate the successful manufacture of these sub-mmWave/THz waveguides and their suitability for applications operating at these frequencies.

Item Type:	Article
Keywords:	waveguide terahertz VNA benchmarking
Subjects:	Electromagnetics > Electrical Measurement
Divisions:	Electromagnetic & Electrochemical Technologies
Last Modified:	15 Feb 2024 14:07
URI:	http://eprintspublications.npl.co.uk/id/eprint/9925

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