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Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration

Wang, Y; Shang, X; Ridler, N M; Naftaly, M; Dimitriadis, A I; Huang, T; Wu, W (2020) Material Measurements Using VNA-Based Material Characterization Kits Subject to Thru-Reflect-Line Calibration. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 466-473. ISSN 2156-342X

Full text not available from this repository.
Item Type: Article
Subjects: Electromagnetics > Electromagnetic Materials
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1109/TTHZ.2020.2999631
Last Modified: 09 Nov 2020 15:40
URI: http://eprintspublications.npl.co.uk/id/eprint/8963

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