< back to main site

Publications

An active interferometric method for extreme impedance on-wafer device measurements

Votsi, H; Li, C; Aaen, P; Ridler, N M (2017) An active interferometric method for extreme impedance on-wafer device measurements. IEEE Microwave and Wireless Components Letters, 27 (11). pp. 1034-1036.

Full text not available from this repository.
Item Type: Article
Subjects: Electromagnetics > RF and Microwave
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/LMWC.2017.2750086
Last Modified: 08 Mar 2018 15:56
URI: http://eprintspublications.npl.co.uk/id/eprint/7799

Actions (login required)

View Item View Item