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An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies

Clarke, R G; Li, C; Ridler, N M (2017) An intra-laboratory investigation of on-wafer measurement reproducibility at millimeter-wave frequencies. In: 2017 90th ARFTG Microwave Measurement Symposium (ARFTG), 28 November 2017 - 01 December 2017, Boulder, CO, USA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Electromagnetics > RF and Microwave
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/ARFTG.2017.8255866
Last Modified: 12 Jun 2018 12:52
URI: http://eprintspublications.npl.co.uk/id/eprint/7925

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