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Verification concepts in S-parameter measurements,

Mubarak, F*; Zeier, M*; Hoffmann, J*; Ridler, N M; Salter, M J; Kuhlmann, K* (2016) Verification concepts in S-parameter measurements,. In: 2016 Conference on Precision Electromagnetic Measurements (CPEM), 10-15 July 2016, Ottawa, Canada.

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Verification is an important step in scattering parameter (S-parameter) measurements to ensure the validity of the calibration of a vector network analyzer. This paper discusses specific aspects of vector network analyzer verification concepts that have been established recently as part of a European metrology research project.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: Verification, scattering parameter, vector network analyzer
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/CPEM.2016.7540508
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7217

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