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Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards.

Salter, M J; Harper, M R; Ridler, N M (2008) Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards. In: 72nd ARFTG Microwave Measurement Conference Digest, 9-12 December 2008, Portland, OR, USA.

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Abstract

This paper presents a comparison of two methods for measuring the electrical loss for transmission lines on printed circuit boards (PCBs). The two methods are (i) the Root Impulse Energy (RIE) method which is a time-domain reflectometry (TDR)-based method using a pulse generator and a sampling oscilloscope and (ii) a method based on the use of a vector network analyzer (VNA) to measure the S-parameters of the line in the frequency domain. Results and uncertainties obtained by the two methods for connectorized microstrip lines on flexible FR4 are presented and compared.

Item Type: Conference or Workshop Item (UNSPECIFIED)
Keywords: Printed circuit testing, Scattering parameters, Time domain reflectometry
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:15
URI: http://eprintspublications.npl.co.uk/id/eprint/4294

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