Salter, M J; Harper, M R; Ridler, N M (2008) Comparison between root-impulse-energy and vector network analyzer methods for measuring loss on printed circuit boards. In: 72nd ARFTG Microwave Measurement Conference Digest, 9-12 December 2008, Portland, OR, USA.
Full text not available from this repository.Abstract
This paper presents a comparison of two methods for measuring the electrical loss for transmission lines on printed circuit boards (PCBs). The two methods are (i) the Root Impulse Energy (RIE) method which is a time-domain reflectometry (TDR)-based method using a pulse generator and a sampling oscilloscope and (ii) a method based on the use of a vector network analyzer (VNA) to measure the S-parameters of the line in the frequency domain. Results and uncertainties obtained by the two methods for connectorized microstrip lines on flexible FR4 are presented and compared.
Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Keywords: | Printed circuit testing, Scattering parameters, Time domain reflectometry |
Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:15 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/4294 |
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