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Evaluation of a VNA-based materials characterization kit at frequencies from 0.75 THz to 1.1 THz.

Khalid, A*; Cummings, D*; Clarke, R*; Li, C*; Ridler, N M (2016) Evaluation of a VNA-based materials characterization kit at frequencies from 0.75 THz to 1.1 THz. In: 2016 IEEE 9th UK-Europe-China Workshop on Millimetre Waves and Terahertz Technologies (UCMMT), 5-7 September 2016, Qingdao, China.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Identification number/DOI: 10.1109/UCMMT.2016.7873952
Last Modified: 02 Feb 2018 13:13
URI: http://eprintspublications.npl.co.uk/id/eprint/7524

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