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An Interferometric Characterization Technique for Extreme Impedance Microwave Devices

Votsi, H; Stant, L T; Matei, C; Salter, M J; Li, C; Ridler, N M; Aaen, P H (2020) An Interferometric Characterization Technique for Extreme Impedance Microwave Devices. In: 2020 94th ARFTG Microwave Measurement Symposium (ARFTG), 26-29 January 2020, San Antonio, Texas, USA.

Full text not available from this repository.
Item Type: Conference or Workshop Item (Paper)
Subjects: Electromagnetics > RF and Microwave
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1109/ARFTG47584.2020.9071748
Last Modified: 12 Nov 2020 15:50
URI: http://eprintspublications.npl.co.uk/id/eprint/8976

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