< back to main site

Publications

Evaluating and expressing uncertainty in complex S-parameter measurements.

Ridler, N M (2002) Evaluating and expressing uncertainty in complex S-parameter measurements. In: ARFTG/NIST Measurements Short Course on Microwave Measurements and Instrumentation, 3-4 December 2002, Washington D.C, USA.

Full text not available from this repository.

Abstract

No abstract available

Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:17
URI: http://eprintspublications.npl.co.uk/id/eprint/2760

Actions (login required)

View Item View Item