Ridler, N M (2002) Evaluating and expressing uncertainty in complex S-parameter measurements. In: ARFTG/NIST Measurements Short Course on Microwave Measurements and Instrumentation, 3-4 December 2002, Washington D.C, USA.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/2760 |
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