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A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies

Lozar, R; Ohlrogge, M; Weber, R; Ridler, N M; Shang, X B; Probst, T; Arz, U (2019) A Comparative Study of On-Wafer and Waveguide Module S-Parameter Measurements at D-Band Frequencies. IEEE Transactions on Microwave Theory and Techniques, 67 (8). pp. 3475-3484. ISSN 0018-9480

Full text not available from this repository.
Item Type: Article
Subjects: Electromagnetics > RF and Microwave
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1109/TMTT.2019.2919538
Last Modified: 31 Oct 2019 15:20
URI: http://eprintspublications.npl.co.uk/id/eprint/8553

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