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Towards traceability to UK national standards for complex reflection coefficient parameters at lower RF2.

Ridler, N M; Young, P R (1998) Towards traceability to UK national standards for complex reflection coefficient parameters at lower RF2. In: 27th Automated RF and Microwave Measurements Society (ARMMS) Conference, 25-26 April 1998.

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Abstract

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Item Type: Conference or Workshop Item (UNSPECIFIED)
Subjects: Electromagnetics
Electromagnetics > RF and Microwave
Last Modified: 02 Feb 2018 13:18
URI: http://eprintspublications.npl.co.uk/id/eprint/1989

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