Ridler, N M; Young, P R (1998) Towards traceability to UK national standards for complex reflection coefficient parameters at lower RF2. In: 27th Automated RF and Microwave Measurements Society (ARMMS) Conference, 25-26 April 1998.
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Item Type: | Conference or Workshop Item (UNSPECIFIED) |
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Subjects: | Electromagnetics Electromagnetics > RF and Microwave |
Last Modified: | 02 Feb 2018 13:18 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/1989 |
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