Liu, C; Wu, A; Li, C; Ridler, N M (2018) A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model. IEEE Transactions on Microwave Theory and Techniques, 66 (8). pp. 3894-3900. ISSN 0018-9480
Full text not available from this repository.
Official URL: https://doi.org/10.1109/TMTT.2018.2832052
Item Type: | Article |
---|---|
Subjects: | Electromagnetics > RF and Microwave |
Divisions: | Engineering, Materials & Electrical Science |
Identification number/DOI: | 10.1109/TMTT.2018.2832052 |
Last Modified: | 08 Oct 2018 13:59 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/8096 |
Actions (login required)
![]() |
View Item |