Liu, C; Wu, A; Li, C; Ridler, N M (2018) A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model. IEEE Transactions on Microwave Theory and Techniques, 66 (8). pp. 3894-3900. ISSN 0018-9480

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Item Type:	Article
Subjects:	Electromagnetics > RF and Microwave
Divisions:	Engineering, Materials & Electrical Science
Identification number/DOI:	10.1109/TMTT.2018.2832052
Last Modified:	08 Oct 2018 13:59
URI:	http://eprintspublications.npl.co.uk/id/eprint/8096

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