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A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model

Liu, C; Wu, A; Li, C; Ridler, N M (2018) A New SOLT Calibration Method for Leaky On-Wafer Measurements Using a 10-Term Error Model. IEEE Transactions on Microwave Theory and Techniques, 66 (8). pp. 3894-3900. ISSN 0018-9480

Full text not available from this repository.
Item Type: Article
Subjects: Electromagnetics > RF and Microwave
Divisions: Engineering, Materials & Electrical Science
Identification number/DOI: 10.1109/TMTT.2018.2832052
Last Modified: 08 Oct 2018 13:59
URI: http://eprintspublications.npl.co.uk/id/eprint/8096

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