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Some Recent Advancements in Measurements at Millimeter-wave and Terahertz Frequencies: Advanced in High Frequency Measurements

Shang, X; Ridler, N M; Stokes, D; Skinner, J; Mubarak, F; Arz, U; Phung, G N; Kuhlmann, K; Kazemipour, A; Hudlicka, M; Ziade, F (2024) Some Recent Advancements in Measurements at Millimeter-wave and Terahertz Frequencies: Advanced in High Frequency Measurements. IEEE Microwave Magazine, 25 (1). pp. 58-71.

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Abstract

The millimeter-wave and terahertz regions of the electromagnetic spectrum are seeing an increase in prominence, with a range of established and emerging applications - wireless backhaul for mobile networks for 5G and 6G infrastructure, automotive radar sensors, space-deployed radiometers for earth observation, climate monitoring and weather forecasting - now looking to exploit these frequencies. Measurement techniques informed by the latest metrological understanding of the field of electromagnetics underpin the development of components and circuits for such applications by enabling accurate and consistent measurement results to be obtained.

However, achieving accurate measurements at these frequencies is no simple task. Therefore, the EMPIR TEMMT project (Traceability for Electrical Measurements at Millimetre-wave and Terahertz Frequencies for Communications and Electronics Technologies) [1], which ran from 2019 to 2022, brought together metrology institutes of various nations, industrial partners and university faculties with the aim of establishing traceability to the SI (International System of Units) for three very important electrical measurement quantities; (i) S-parameters (in various transmission line media), (ii) power and (iii) complex permittivity of dielectric materials, at millimeter-wave and terahertz (THz) frequencies. This article summarizes the main outcomes from TEMMT, along with other notable advancements in this field.

Item Type: Article
Subjects: Electromagnetics > RF and Microwave
Divisions: Electromagnetic & Electrochemical Technologies
Identification number/DOI: 10.1109/MMM.2023.3321516
Last Modified: 19 Feb 2024 15:11
URI: http://eprintspublications.npl.co.uk/id/eprint/9937

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