Ridler, N M; Salter, M J (2002) An approach to the treatment of uncertainty in complex S-parameter measurements. Metrologia, 39 (3). pp. 295-302.
Full text not available from this repository.Abstract
This paper presents methods for evaluating, expressing and using the uncertainty associated with complex S-parameter measurements. The methods are based in internationally recommended guidelines, published by the International Organization for Standardization (ISO), with extensions to accommodate the complex nature of the measurands. The treatment of measurements of both one-port and multi-port devices is presented and this is used to propagate uncertainty from complex-valued S-parameters to other qualities that occur elsewhere in other radio frequency (RF) and microwave measurement applications. A simple example, involving the comparison loss correction used during a microwave power meter calibration, is included to demonstrate the principles of propagating the uncertainty in complex S-parameter measurements.
Item Type: | Article |
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Keywords: | S-paramater, uncertainty of measurement, complex quantities |
Subjects: | Electromagnetics |
Last Modified: | 02 Feb 2018 13:17 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/2727 |
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