Report/Guide

Gilmore, I S (2022) Metrology Research Roadmap. Other.

Gurdak, E; Salter, T L; Smith, S A; Seah, M P; Gilmore, I S; Green, F M (2013) A VAMAS interlaboratory study for Desorption Electrospray Ionisation (DESI) intensity repeatability and constancy: protocol for analysis. NPL Report. AS 73

Lee, J L S; Gilmore, I S; Seah, M P; Shard, A G (2009) VAMAS project A3(d) static SIMS interlaboratory study - Part I: linearity of the intensity scale - protocol for analysis. NPL Report. AS 31

Green, F M; Lee, J L S; Gilmore, I S; Seah, M P (2006) VAMAS 2006: static SIMS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification - protocol for anaylisis. NPL Report. DQL-AS 029

Gilmore, I S; Seah, M P (2001) VAMAS 2002: Static ToF SIMS inter-laboratory study - protocol for analysis. NPL Report. COAM 6

Gilmore, I S; Seah, M P (1998) Energy and spatial dependence of Ion detection efficiencies for single channel electron multipliers used in mass spectrometries. NPL Report. CMMT(A)87

Seah, M P; Gilmore, I S; Beamson, G* (1997) XPS: Binding energy calibration of electron spectrometers, 5 - A re-evaluation of the reference energies. NPL Report. CMMT(A)88

Seah, M P; Gilmore, I S; Spencer, S J (1997) XPS: Binding energy calibration of electron spectrometers 4 - an assessment of effects for different x-ray sources, analyser resolutions and angles of emission and of the overall uncertainties. NPL Report. CMMT(A)57

Article

Zhou, Y; Franquet, A; Spampinato, V; Merkulov, A; Keenan, M R; van der Heide, P A W; Trindade, G F; Vandervorst, W; Gilmore, I S (2024) OrbiSIMS depth profiling of semiconductor materials - useful yield and depth resolution. Journal of Vacuum Science & Technology A, 42 (5). 053208

Trindade, G; Sul, S; Kim, J; Havelund, R; Eyres, A; Park, S; Shin, Y; Bae, H J; Sung, Y M; Matjacic, L; Jung, Y; Won, J; Jeon, W S; Choi, H; Lee, H S; Lee, J-C; Kim, J-H; Gilmore, I S (2023) Direct identification of interfacial degradation in blue OLEDs using nanoscale chemical depth profiling. Nature Communications, 14. 8066

Belsey, N; Dexter, A; Vorng, J-L; Tsikritsis, D; Nikula, C J; Murta, T; Tiddia, M-V; Zhang, J; Gurdak, E; Trindade, G F; Gilmore, I S; Page, L; Roper, C S; Guy, R H; Bettex, M B (2023) Visualisation of drug distribution in skin using correlative optical spectroscopy and mass spectrometry imaging. Journal of Controlled Release, 364. pp. 79-89.

Paladino, E; Doerr, F J S; Bordos, E; Onyemelukwe, I I; Lamprou, D A; Florence, A J; Gilmore, I S; Halbert, G W (2022) High spatial resolution ToF-SIMS imaging and image analysis strategies to monitor and quantify early phase separation in amorphous solid dispersions. International Journal of Pharmaceutics, 628. 122191

Marchesini, S; Reed, B P; Jones, H; Matjacic, L; Rosser, T E; Zhou, Y; Brennan, B; Tiddia, M; Jervis, R; Loveridge, M J; Raccichini, R; Park, J; Wain, A J; Hinds, G; Gilmore, I S; Shard, A G; Pollard, A P (2022) Surface Analysis of Pristine and Cycled NMC/Graphite Lithium-Ion Battery Electrodes: Addressing the Measurement Challenges. ACS Applied Materials & Interfaces, 14 (47). pp. 52779-52793.

Matjacic, L; Seah, M P; Trindade, G F; Pirkl, A; Havelund, R; Vorng, J L; Niehuis, E; Gilmore, I S (2022) OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure. Surface and Interface Analysis, 54 (4). pp. 331-340.

Rakowska, P D; Tiddia, M; Faruqui, N; Bankier, C; Pei, Y W; Pollard, A J; Zhang, J T; Gilmore, I S (2021) Antiviral surfaces and coatings and their mechanisms of action. Communications Materials, 2 (1). 53

Robinson, E; Giffen, P; Hassall, D; Ball, D; Reid, H; Coe, D; Teague, S; Terry, R; Earl, M; Marchand, J; Farrer, B; Havelund, R; Gilmore, I S; Marshall, P S (2021) Multimodal imaging of drug and excipients in rat lungs following an inhaled administration of controlled-release drug laden PLGA microparticles. The Analyst, 146 (10). pp. 3378-3390. ISSN 0003-2654

Shard, A G; Miisho, A; Vorng, J L; Havelund, R; Gilmore, I S; Aoyagi, S (2021) A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects. Surface and Interface Analysis, 54 (4). pp. 363-373.

Aoyagi, S; Fujiwara, Y; Takano, A; Vorng, J L; Gilmore, I S; Wang, Y C; Tallarek, E; Hagenhoff, B; Iida, S; Luch, A; Jungnickel, H; Lang, Y; Shon, H K; Lee, T G; Li, Z; Matsuda, K; Mihara, I; Miisho, A; Murayama, Y; Nagatomi, T; Ikeda, R; Okamoto, M; Saiga, K; Tsuchiya, T; Uemura, S (2021) Evaluation of Time-of-Flight Secondary Ion Mass Spectrometry Spectra of Peptides by Random Forest with Amino Acid Labels: Results from a Versailles Project on Advanced Materials and Standards Interlaboratory Study. Analytical Chemistry, 93 (9). pp. 4191-4197. ISSN 0003-2700

Lorenz, M; Zhang, J; Shard, A G; Vorng, J L; Rakowska, P D; Gilmore, I S (2021) Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry. Analytical Chemistry, 93 (7). pp. 3436-3444. ISSN 0003-2700

Pieterse, C L; Rungger, I; Gilmore, I S; Wickramasinghe, R C; Hanley, L (2020) An Experimental and Theoretical Study of Laser Postionization of Femtosecond-Laser-Desorbed Drug Molecules. The Journal of Physical Chemistry Letters, 11 (20). pp. 8616-8622. ISSN 1948-7185

Race, A M; Rae, A; Vorng, J-L; Havelund, R; Dexter, A; Kumar, N; Steven, R T; Passarelli, M K; Tyler, B J; Bunch, J; Gilmore, I S (2020) Correlative Hyperspectral Imaging Using a Dimensionality-Reduction-Based Image Fusion Method. Analytical Chemistry, 92 (16). pp. 10979-10988. ISSN 0003-2700

Newell, C L; Vorng, J-L; MacRae, J I; Gilmore, I S; Gould, A P (2020) Cryogenic OrbiSIMS Localizes Semi‐Volatile Molecules in Biological Tissues. Angewandte Chemie International Edition, 59 (41). pp. 18194-18200. ISSN 1433-7851

Zhang, J; Brown, J; Scurr, D J; Bullen, A; MacLellan-Gibson, K; Williams, P; Alexander, M R; Hardie, K R; Gilmore, I S; Rakowska, P D (2020) Cryo-OrbiSIMS for 3D Molecular Imaging of a Bacterial Biofilm in Its Native State. Analytical Chemistry, 92 (13). pp. 9008-9015. ISSN 0003-2700

Tiddia, M; Seah, M P; Shard, A G; Mula, G; Havelund, R; Gilmore, I S (2020) Argon cluster cleaning of Ga + FIB‐milled sections of organic and hybrid materials. Surface and Interface Analysis, 52 (6). pp. 327-334. ISSN 0142-2421

Aoyagi, S; Kodama, Y; Passarelli, M K; Vorng, J L; Kawashima, T; Yoshikiyo, K; Yamamoto, T; Gilmore, I S (2019) OrbiSIMS Imaging Identifies Molecular Constituents of the Perialgal Vacuole Membrane of Paramecium bursaria with Symbiotic Chlorella variabilis. Analytical Chemistry, 91 (22). pp. 14545-14551. ISSN 0003-2700

Hanisch, R J; Gilmore, I S; Plant, A L (2019) Improving Reproducibility in Research: The Role of Measurement Science. Journal of Research of the National Institute of Standards and Technology, 124. 024 ISSN 2165-7254

Havelund, R; Seah, M P; Gilmore, I S (2019) SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles. Surface and Interface Analysis, 51 (13). pp. 1332-1341. ISSN 0142-2421

Gilmore, I S; Heiles, S; Pieterse, C L (2019) Metabolic Imaging at the Single-Cell Scale: Recent Advances in Mass Spectrometry Imaging. Annual Review of Analytical Chemistry, 12 (1). pp. 201-224. ISSN 1936-1327

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S (2019) Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions. Journal of The American Society for Mass Spectrometry, 30 (2). pp. 309-320. ISSN 1044-0305

Tiddia, M; Mihara, I; Seah, M P; Trindade, G F; Kollmer, F; Roberts, C J; Hague, R; Mula, G; Gilmore, I S; Havelund, R (2019) Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 11 (4). pp. 4500-4506. ISSN 1944-8244

Baer, D R; Gilmore, I S (2018) Responding to the growing issue of research reproducibility. Journal of Vacuum Science & Technology A, 36 (6). 068502 ISSN 0734-2101

Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.

Passarelli, M K; Pirkl, A; Moellers, R; Grinfeld, D; Kollmer, F; Havelund, R; Newman, C F; Marshall, P S; Arlinghaus, H; Alexander, M R; West, A; Horning, S; Niehuis, E; Makarov, A; Dollery, C T; Gilmore, I S (2017) The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power. Nature Methods, 14 (12). pp. 1175-1183. ISSN 1548-7091

Newman, C F; Havelund, R; Passarelli, M K; Marshall, P S; Francis, I; West, A; Alexander, M R; Gilmore, I S; Dollery, C T (2017) Intracellular Drug Uptake—A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS. Analytical Chemistry, 89 (22). pp. 11944-11953. ISSN 0003-2700

Mihara, I; Havelund, R; Gilmore, I S (2017) Embedding-free method for preparation of cross-sections of organic materials for micro chemical analysis using gas cluster ion beam sputtering. Anal. Chem., 89 (9). pp. 4781-4785.

Jiang, H B*; Passarelli, M K; Munro, P M G*; Kilburn, M R*; West, A*; Dollery, C T*; Gilmore, I S; Rakowska, P D (2017) High-resolution sub-cellular imaging by correlative NanoSIMS and electron microscopy of amiodarone internalisation by lung macrophages as evidence for drug-induced phospholipidosis. Chem. Comms., 53 (9). pp. 1506-1509.

Brennan, B; Spencer, S; Belsey, N A; Faris, T*; Cronin, H*; Silva, S R P*; Sainsbury, T; Gilmore, I S; Stoeva, Z*; Pollard, A J (2017) Structural, chemical and electrical characterisation of conductive graphene-polymer composite films. Appl. Surf. Sci., 403. pp. 403-412.

Lorenz, M; Shard, A G; Counsell, J D P*; Hutton, S*; Gilmore, I S (2016) Angular distribution of molecules sputtered by gas cluster ion beams and implications for secondary neutral mass spectrometry. J. Phys. Chem. C, 120 (44). p. 25317.

Griffiths, C A*; Sagar, R*; Geng, Y*; Primavesi, L F*; Patel, M K*; Passarelli, M K; Gilmore, I S; Steven, R T; Bunch, J; Paul, M J*; Davis, B G* (2016) Chemical interventio in plant sugar signalling increases yield and resilience. Nature, 540 (7634). p. 574.

Rakowska, P D; Seah, M P; Vorng, J L; Havelund, R; Gilmore, I S (2016) Determination of the sputtering yield of cholesterol using Ar-n(+) and C-60(+(+)) cluster ions. Analyst, 141 (16). pp. 4893-4901.

Tillner, J; McKenzie, J S*; Jones, E A*; Speller, A V M*; Walsh, J L*; Veselkov, K A*; Bunch, J; Takats, Z*; Gilmore, I S (2016) Investigation of the impact of desorption electrospray ionization sprayer geometry on its performance in imaging of biological tissue. Anal. Chem., 88 (9). pp. 4808-4816.

Seah, M P; Havelund, R; Gilmore, I S (2016) SIMS of delta layers in organic materials: amount of substance, secondary ion species, matrix effects and anomalous structures in argon gas cluster depth profiles. J. Phys. Chem. C, 120 (46). pp. 26328-26335.

Havelund, R; Seah, M P; Gilmore, I S (2016) Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles. J. Phys. Chem. B, 120 (9). pp. 2604-2611.

Vorng, J L; Kotowska, A M; Passarelli, M K; West, A*; Marshall, P S*; Havelund, R; Seah, M P; Dollery, C T*; Rakowska, P D; Gilmore, I S (2016) Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample. Anal. Chem., 88 (22). pp. 11028-11036.

Seah, M P; Havelund, R; Gilmore, I S (2016) Systematic temperature effects in the argon cluster ion sputter depth profiling of organic materials using secondary ion mass spectrometry. J. Am. Soc. Mass Spectrom., 27 (8). pp. 1411-1418.

Bailey, J*; Havelund, R; Shard, A G; Gilmore, I S; Alexander, M R*; Sharp, J S*; Scurr, D J* (2015) 3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling. ACS Appl. Mater. Interfaces, 7 (4). pp. 2654-2659.

Yang, J*; Gilmore, I S (2015) Application of secondary ion mass spectrometry to biomaterials, proteins and cells: a concise review. Mater. Sci. Technol., 31 (2). pp. 131-136.

Seah, M P; Spencer, S; Havelund, R; Gilmore, I S; Shard, A G (2015) Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Analyst, 140 (19). pp. 6508-6516.

Mignuzzi, S; Pollard, A J; Bonini, N*; Brennan, B; Gilmore, I S; Pimenta, M A*; Richards, D*; Roy, D (2015) Effect of disorder on Raman scattering of single-layer MoS2. Phys. Rev. B, 91 (19). 195411

Shard, A G; Havelund, R; Spencer, S J; Gilmore, I S; Alexander, M R*; Angerer, T B*; Aoyagi, S*; Barnes, J P*; Benayad, A*; Bernasik, A*; Ceccone, G*; Counsell, J D P*; Deeks, C*; Fletcher, J S*; Graham, D J*; Heuser, C*; Lee, T G*; Marie, C*; Marzec, M M*; Mishra, G*; Rading, D*; Renault, O*; Scurr, D J*; Shon, H K*; Spampinato, V*; Tian, H*; Wang, F Y*; Winograd, N*; Wu, K*; Wucher, A*; Zhou, Y F*; Zhu, Z H* (2015) Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 119 (33). pp. 10784-10797.

Mignuzzi, S; Kumar, N; Brennan, B; Gilmore, I S; Richards, D*; Pollard, A J; Roy, D (2015) Probing individual point defects in graphene via near-field Raman scattering. Nanoscale, 7 (46). pp. 19413-19418.

Tyler, B J; Brennan, B; Stec, H; Patel, T; Hao, L; Gilmore, I S; Pollard, A J (2015) Removal of organic contamination from graphene with a controllable mass-selected argon gas cluster ion beam. J. Phys. Chem. C, 119 (31). pp. 17836-17841.

Passarelli, M K*; Newman, C F*; Marshall, P S*; West, A*; Gilmore, I S; Bunch, J; Alexander, M R*; Dollery, C T* (2015) Single-cell analysis: visualizing pharmaceutical and metabolite uptake in cells with label-free 3D mass. Anal. Chem., 87 (13). pp. 6696-6702.

Seah, M P; Havelund, R; Shard, A G; Gilmore, I S (2015) Sputtering yields for mixtures of organic materials using argon gas cluster ions. J. Phys. Chem. B, 119 (42). pp. 13433-13439.

Shard, A G; Spencer, S J; Smith, S A; Havelund, R*; Gilmore, I S (2015) The matrix effect in organic secondary ion mass spectrometry. Int. J. Mass Spectrom., 377. pp. 599-609.

Bowfield, A; Bunch, J; Salter, T L; Stevens, R T; Gilmore, I S; Barrett, D A*; Alexander, M R*; Mckay, K*; Bradley, J W* (2014) Characterisation of micro-plasmas for ambient mass spectrometry imaging. Analyst, 139 (21). pp. 5430-5438.

McKay, K; Salter, T L; Bowfield, A*; Walsh, J L*; Gilmore, I S; Bradley, J W* (2014) Comparison of three plasma sources for ambient desorption/ionization mass spectrometry. J. Am. Soc. Mass Spectrom., 25 (9). pp. 1528-1537.

Passarelli, M K*; Wang, J*; Mohammadi, A S*; Trouillon, R*; Gilmore, I S; Ewing, A G* (2014) Development of an organic lateral resolution test device for imaging mass spectrometry. Anal. Chem., 86 (19). pp. 9473-9480.

Havelund, R; Seah, M P; Shard, A G; Gilmore, I S (2014) Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics. J. Am. Soc. Mass Spectrom., 25 (9). pp. 1565-1571.

Salter, T L; Bunch, J; Gilmore, I S (2014) Importance of sample form and surface temperature for analysis by ambient plasma mass spectrometry (PADI). Anal. Chem., 86 (18). pp. 9264-9270.

Pollard, A J; Brennan, B; Stec, H*; Tyler, B J; Seah, M P; Gilmore, I S; Roy, D (2014) Quantitative characterization of defect size in graphene using Raman spectroscopy. Appl. Phys. Lett., 105 (25). 253107

Seah, M P; Havelund, R; Gilmore, I S (2014) Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials. J. Phys. Chem. C, 118 (24). pp. 12862-12872.

Gurdak, E; Green, F M; Rakowska, P D; Seah, M P; Salter, T L; Gilmore, I S (2014) VAMAS interlaboratory study for Desorption Electrospray Ionisation Mass Spectroscopy (DESI MS) intensity repeatability and constancy. Anal. Chem., 86 (19). pp. 9603-9611.

Salter, T L; Gilmore, I S; Bowfield, A*; Olabanji, O T*; Bradley, J W* (2013) Ambient surface mass spectrometry using plasma-assisted desorption ionisation: effects and optimisation of analytical parameters for signal intensities of molecules and polymers. Anal. Chem., 85 (3). pp. 1675-1682.

Bich, C*; Havelund, R*; Moellers, R*; Touboul, D*; Kollmer, F*; Niehuis, E*; Gilmore, I S; Brunelle, A* (2013) Argon cluster ion source evaluation on lipid standards and rat brain tissue samples. Anal. Chem., 85 (16). pp. 7745-7753.

Yang, L; Seah, M P; Gilmore, I S; Morris, R J H*; Dowsett, M G*; Boarino, L*; Sparnacci, K*; Laus, M* (2013) Depth profiling and melting of nanoparticles in Secondary Ion Mass Spectrometry (SIMS). J. Phys. Chem. C, 117 (31). pp. 16042-16052.

Havelund, R; Licciardello, A*; Bailey, J*; Tuccitto, N*; Sapuppo, D*; Gilmore, I S; Sharp, J S*; Lee, J L S; Mouhib, T*; Delcorte, A* (2013) Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing. Anal. Chem., 85 (10). pp. 5064-5070.

Gilmore, I S (2013) SIMS of organics - advances in 2D and 3D imaging and future outlook. J. Vac. Sci. Technol. A, 31 (5). 050819

Shard, A G; Havelund, R*; Seah, M P; Spencer, S J; Gilmore, I S; Winograd, N*; Mao, D*; Miyayama, T*; Niehuis, E*; Rading, D*; Moellers, R* (2012) Argon cluster ion beams for organic depth profiling: results from a VAMAS inter-laboratory study. Anal. Chem., 84 (18). pp. 7865-7873.

Aoyagi, S*; Gilmore, I S; Mihara, I*; Seah, M P; Fletcher, I W* (2012) Identification and separation of protein, contaminant and substrate peaks using gentle-secondary ion mass spectrometry and the g-ogram. Rapid Commun. Mass Spectrom., 26 (23). pp. 2815-2821.

Lee, J L S; Gilmore, I S; Seah, M P (2012) Linearity of the instrumental intensity scale in TOF-SIMS - a VAMAS interlaboratory study. Surf. Interface Anal., 44 (1). pp. 1-14.

Yang, L; Seah, M P; Gilmore, I S (2012) Sputtering yields for gold using argon gas cluster ion beams. J. Phys. Chem. C, 116 (44). pp. 23735-23741.

Yang, L; Seah, M P; Anstis, E H; Gilmore, I S; Lee, J L S (2012) Sputtering yields of gold nanoparticles by C60 ions. J. Phys. Chem. C, 116 (16). pp. 9311-9318.

Bowfield, A*; Barrett, D A; Alexander, M R*; Ortori, C A*; Rutten, F M*; Salter, T L; Gilmore, I S; Bradley, J W (2012) Surface analysis using a new plasma assisted desorption ionisation source for mass spectrometry in ambient air. Rev. Sci. Instrum., 83 (6). 063503

Lee, J L S; Gilmore, I S; Seah, M P; Levick, A P; Shard, A G (2012) Topography and field effects in secondary ion mass spectrometry - Part II: insulating samples. Surf. Interface Anal., 44 (2). pp. 238-245.

Salter, T L R; Green, F M; Faruqui, N; Gilmore, I S (2011) Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometry. Analyst, 136 (16). pp. 3274-3280.

Green, F M; Seah, M P; Gilmore, I S; Salter, T L; Spencer, S J (2011) Analysis of thin films and molecular orientation using cluster SIMS. Surf. Interface Anal., 43 (9). pp. 1224-1230.

Alexander, M R*; Gilmore, I S (2011) Analytical techniques: surface and interfacial characterisation. Curr. Opin. Chem. Biol., 15 (5). pp. 664-666.

Seah, M P; Gilmore, I S (2011) Cluster primary ion sputtering: correlations in secondary ion intensities in TOF SIMS. Surf. Interface Anal., 43 (1-2). pp. 228-235.

Green, F M; Gilmore, I S; Seah, M P (2011) Mass Spectrometry and informatics: Distribution of molecules in the PubChem database and general requirements for mass accuracy. Anal. Chem., 83 (9). pp. 3239-3243.

Ogaki, R*; Gilmore, I S; Alexander, M R*; Green, F M; Davies, M C*; Lee, J L S (2011) Surface mass spectrometry of two component drug-polymer systems: novel chromatographic separation method using gentle-secondary ion mass spectrometry (G-SIMS). Anal. Chem., 83 (10). pp. 3627-3631.

Lee, J L S; Gilmore, I S; Seah, M P; Fletcher, I W* (2011) Topography and field effects in secondary ion mass spectrometry - Part I: conducting samples. J. Am. Soc. Mass Spectrom., 22 (10). pp. 1718-1728.

Shard, A G; Foster, R*; Gilmore, I S; Lee, J L S; Ray, S; Yang, L (2011) VAMAS interlaboratory study on organic depth profiling 1: preliminary report. Surf. Interface Anal., 43 (1-2). pp. 510-513.

Salter, T L; Green, F M; Gilmore, I S; Seah, M P; Stokes, P* (2011) A comparison of SIMS and DESI and their complementarities. Surf. Interface Anal., 43 (1-2). pp. 294-297.

Green, F M; Salter, T L; Stokes, P*; Gilmore, I S; O'Connor, G* (2010) Ambient mass spectrometry: advances and applications in forensics. Surf. Interface Anal., 42 (5). pp. 347-357.

Seah, M P; Green, F M; Gilmore, I S (2010) Cluster primary ion sputtering: secondary ion intensities in static SIMS of organic materials. J. Phys. Chem. C, 114 (12). pp. 5351-5359.

Lee, J L S; Nimomiya, S*; Matsuo, J*; Gilmore, I S; Seah, M P; Shard, A G (2010) Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem., 82 (1). pp. 98-105.

Seah, M P; Green, F M; Gilmore, I S (2010) Relationships between cluster secondary ion mass intensities generated by different cluster primary ions. J. Am. Soc. Mass Spectrom., 21 (3). pp. 370-377.

Green, F M; Gilmore, I S; Lee, J L S; Spencer, S J; Seah, M P (2010) Static SIMS - VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surf. Interface Anal., 42 (3). pp. 129-138.

Green, F M; Salter, T S; Gilmore, I S; Stokes, P*; O'Connor, G* (2010) The effect of electrospray solvent composition on desorption electrospray ionisation (DESI) efficiency and spatial resolution. Analyst, 135 (4). pp. 731-737.

Green, F M; Shard, A G; Gilmore, I S; Seah, M P (2009) Analysis of the interface position in C60n+ Secondary Ions Mass Spectrommetry depth profiling. Anal. Chem., 81 (1). pp. 75-79.

Green, F M; Stokes, P*; Hopley, C*; Seah, M P; Gilmore, I S; O'Connor, G* (2009) Developing repeatable measurements for reliable ambient surface characterisation using DESI. Anal. Chem., 81 (6). pp. 2286-2293.

Seah, M P; Gilmore, I S; Green, F M (2009) G-SIMS: relative effectiveness of different monatomic primary ion source combinations. Rapid Commun. Mass Spectrom., 23 (5). pp. 599-602.

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2009) Multivariate image analysis strategies for ToF-SIMS images with topography. Surf. Interface Anal., 41 (8). pp. 653-665.

Lee, J L S; Tyler, B J*; Wagner, M S*; Gilmore, I S; Seah, M P (2009) The development of standards and guides for multivariate analysis in surface chemical analysis. Surf. Interface Anal., 41 (2). pp. 76-78.

Shard, A G; Gilmore, I S (2008) Analysis of metastable ions in the ToF-SIMS spectra of polymers. Int. J Mass Spectrom., 269. pp. 85-94.

Lee, J L S; Seah, M P; Gilmore, I S (2008) Artifacts in the Sputtering of Inorganics by C60 n+. Appl. Surf. Sci., 255 (4). pp. 934-937.

Shard, A G; Green, F M; Gilmore, I S (2008) C-60 ion sputtering of layered organic materials. Appl. Surf. Sci., 255 (4). pp. 962-965.

Green, F M; Gilmore, I S; Seah, M P (2008) Cluster ion beam profiling of organics by secondary ion mass spectrometry - does sodium affect the molecular ion intensity at interfaces. Rapid Commun. Mass Spectrom., 22 (12). pp. 4178-4182.

Ogaki, R*; Shard, A G; Li, S M*; Vert, M*; Luk, S*; Alexander, M R*; Gilmore, I S; Davies, M C* (2008) Extracting information on the surface monomer unit distribution of PLGA by ToF-SIMS. Surf. Interface Anal., 40 (8). pp. 1168-1175.

Green, F M; Gilmore, I S; Seah, M P (2008) G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides. Appl. Surf. Sci., 255 (4). pp. 852-855.

Green, F M; Gilmore, I S; Seah, M P (2008) G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides. Appl. Surf. Sci., 255 (4). pp. 852-855.

Green, F M; Gilmore, I S; Seah, M P; Dell, E J* (2008) Identification of complex molecules at surfaces: G-SIMS and SMILES fragmentation pathways. Int. J Mass Spectrom., 272. pp. 38-47.

Green, F M; Kollmer, F*; Niehuis, E*; Gilmore, I S; Seah, M P (2008) Imaging G-SIMS: A novel bismuth-manganese source emitter. Rapid Commun. Mass Spectrom., 22 (16). pp. 2602-2608.

Lee, J L S; Gilmore, I S; Seah, M P (2008) Quantification and methodology issues in the multivariate analysis of ToF-SIMS data for mixed organic systems. Surf. Interface Anal., 40 (1). pp. 1-14.

Shard, A G; Green, F M; Brewer, P J; Seah, M P; Gilmore, I S (2008) Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS. J. Phys. Chem. B, 112 (9). pp. 2596-2605.

Lee, J L S; Gilmore, I S; Fletcher, I W*; Seah, M P (2008) Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS. Appl. Surf. Sci., 255 (4). pp. 1560-1563.

Ogaki, R*; Green, F M; Li, S*; Vert, M*; Alexander, M R*; Gilmore, I S; Davies, M C* (2008) A comparison of the static SIMS and G-SIMS spectra of biodegradable homo-polyesters. Surf. Interface Anal., 40 (8). pp. 1202-1208.

Seah, M P; Gilmore, I S (2007) Erratum - Quantitative x-ray photoelectron spectroscopy: Quadrupole effects, shake-up, Shirley background and relative sensitivity factors from a database of true x-ray photoelectron spectra [Phys. Rev. B 73, 174113 (2006)]. Phys. Rev. B Condens. Matter, 75 (14). 149901(E)

Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yield and damage in C60 sims depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.

Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.

Ogaki, R*; Green, F M; Li, S*; Vert, M*; Alexander, M R*; Gilmore, I S; Davies, M C* (2006) G-SIMS of biodegradable homo-polyesters. Appl. Surf. Sci., 252 (19). pp. 6797-6800.

Gilmore, I S; Green, F M; Seah, M P (2006) G-SIMS-FPM: Molecular structure at surfaces - a combined positive and negative secondary ion study. Appl. Surf. Sci., 252 (19). pp. 6601-6604.

Green, F M; Gilmore, I S; Seah, M P (2006) Mass accuracy - TOF-SIMS. Appl. Surf. Sci., 252 (19). pp. 6591-6593.

Seah, M P; Gilmore, I S (2006) Quantitative x-ray photoelectron spectroscopy: quadrupole effects, shake-up, Shirley background and relative sensitivity factors. Phys. Rev. B Condens. Matter, 73. 174113

Green, F; Gilmore, I S; Seah, M P (2006) TOF-SIMS: accurate mass scale calibration. J. Am. Soc. Mass Spectrom., 17 (4). pp. 514-523.

Gilmore, I S; Seah, M P; Green, F M (2005) Static TOF-SIMS - a VAMAS interlaboratory study. Part 1. Repeatability and reproducibility of spectra. Surf. Interface Anal., 37. pp. 651-672.

Gilmore, I S; Seah, M P; Green, F M (2005) Static TOF-SIMS - a VAMAS interlaboratory study. Part 1. Repeatability and reproducibility of spectra. Surf. Interface Anal., 37 (8). pp. 651-672.

Seah, M P; Clifford, C A; Green, F M; Gilmore, I S (2005) An accurate semi-empirical equation for sputtering yields, I: for argon ions. Surf. Interface Anal., 37. pp. 444-458.

Gilmore, I S (2004) G-SIMS - direct analysis of organic surfaces. VAM Bulletin, 31. pp. 17-21.

Halliwell, C M; Green, F; Gilmore, I S; Cumpson, P J; Davies, J A (2004) Nanoanalytical measurements for the determination of protein orientation at surfaces. The Analyst, 129. pp. 1166-1170.

Gilmore, I S; Seah, M P (2004) Organic molecule characterization - G-SIMS. Appl. Surf. Sci., 231-23. pp. 224-229.

Gilmore, I S; Seah, M P; Henderson, A* (2004) Summary of ISO/TC 201 standard: XXII. ISO 22048:2004 - surface chemical analysis - information format for static secondary ion mass spectrometry. Surf. Interface Anal., 36. pp. 1642-1644.

Gilmore, I S; Seah, M P (2003) G-SIMS of crystallisable organics. Appl. Surf. Sci., 203-20. pp. 551-555.

Gilmore, I S; Seah, M P (2003) Investigating the difficulty of eliminating flood gun damage in TOF-SIMS. Appl. Surf. Sci., 203-20. pp. 600-604.

Gilmore, I S; Seah, M P; Johnstone, J E (2003) Quantification issues in ToF-SSIMS and AFM co-analysis in two-phase systems, exampled by a polymer blend. Surf. Interface Anal., 35. pp. 888-896.

Gilmore, I S; Seah, M P (2002) Electron flood gun damage in the analysis of polymers and organics in time of flight SIMS. Appl. Surf. Sci., 187. pp. 89-100.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities and sensitivity factors from spectral digital databases re-analysed using a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database. J. Electron Spectrosc. Relat. Phenom., 120 (1-3). pp. 93-111.

Seah, M P; Gilmore, I S (2001) Simplified equations for correction parameters for elastic scattering effects for Q, ß and attenuation lengths in AES and XPS. Surf. Interface Anal., 31. pp. 835-846.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Background subtraction II: general behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPS. Surf. Sci., 461. pp. 1-15.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Consistent, combined quantitative AES and XPS digital data bases - convergence of theory and experiment. J. Vac. Sci. Technol. A, 18. pp. 1083-1088.

Seah, M P; Spencer, S J; Gilmore, I S; Johnstone, J E (2000) Depth resolution in sputter depth profiling - characterisation of a tantalum pentoxide on tantalum certified reference material. Surf. Interface Anal., 29. pp. 73-81.

Gilmore, I S; Seah, M P (2000) Ion detection efficiency in SIMS: dependencies on energy, mass and composition for microchannel plates used in mass spectrometry. Int. J Mass Spectrom., 202. pp. 217-229.

Gilmore, I S; Seah, M P (2000) Static SIMS: an inter-laboratory study. Surf. Interface Anal., 29. pp. 624-637.

Gilmore, I S; Seah, M P (2000) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. Appl. Surf. Sci., 161. pp. 465-480.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Appl. Surf. Sci., 144-14. pp. 178-182.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Appl. Surf. Sci., 144-14. pp. 132-136.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Signal linearity in XPS counting systems. J. Electron Spectrosc. Relat. Phenom., 104. pp. 73-89.

Gilmore, I S; Seah, M P (1999) Static SIMS - metastable decay and peak intensities. Appl. Surf. Sci., 144-14. pp. 26-30.

Gilmore, I S; Seah, M P (1999) Static SIMS: ion detection efficiencies in a channel electron multiplier. Appl. Surf. Sci., 144-14. pp. 113-117.

Seah, M P; Gilmore, I S (1998) Quantitative AES VII: The ionisation cross section. Surf. Interface Anal., 26 (11). pp. 815-824.

Seah, M P; Gilmore, I S (1998) Quantitative AES VIII: analysis of Auger electron intensities from elemental data in a digital Auger database. Surf. Interface Anal., 26 (12). pp. 908-929.

Seah, M P; Gilmore, I S; Bishop, H E* (1998) Quantitive AES, V: Practical analysis of intensities with detailed examples of metals and their oxides. Surf. Interface Anal., 26 (10). pp. 701-722.

Seah, M P; Gilmore, I S (1998) Quantitive AES, VI: Backscattering and backgrounds - an analysis of elemental systematics and corrections of absolute intensity. Surf. Interface Anal., 26 (10). pp. 723-735.

Seah, M P; Gilmore, I S; Beamson, G (1998) XPS: Binding energy calibration of electron spectometers 5 - a re-assessment of the reference energies. Surf. Interface Anal., 26. pp. 642-649.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: Binding energy calibration of electron spectrometers 4 - Assessment of effects for different X-ray sources, analyser resolutions, angles of emmision and overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Seah, M P; Gilmore, I S; Beamson, G* (1998) XPS: binding energy calibration of electron spectrometers 5 - a re-assessment of the reference energies. Surf. Interface Anal., 26. pp. 642-649.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Seah, M P; Gilmore, I S (1997) AES: energy calibration of electron spectrometers. III - general calibration rules. J. Electron Spectrosc. Relat. Phenom., 83 (2-3). pp. 197-208.

Seah, M P; Gilmore, I S (1996) High resolution digital Auger database of true spectra for Auger electron spectroscopy intensities. J. Vac. Sci. Technol. A, 14 (3). pp. 1401-1407.

Gilmore, I S; Seah, M P (1996) Savitzky and Golay differentiation in AES. Appl. Surf. Sci., 93 (3). pp. 273-280.

Gilmore, I S; Seah, M P (1996) Static SIMS: a study of damage in polymers. Surf. Interface Anal., 24 (11). pp. 746-762.

Seah, M P; Gilmore, I S (1996) A high resolution digital Auger database of true spectra for AES intensities. J. Vac. Sci. Technol., 14. pp. 1401-1407.

Gilmore, I S; Seah, M P (1995) Fluence, Flux, Current and Current Density Measurement in Faraday Cups for Surface Analysis. Surf. Interface Anal., 23 (4). pp. 248-258.

Gilmore, I S; Seah, M P (1995) Static SIMS: surface charge stabilisation of insulators for highly repeatable spectra when using a quadrupole mass spectrometer. Surf. Interface Anal., 23. 191 - 203

Gilmore, I S; Seah, M P (1995) Surface analysis of insulators - a new charge neutralisation system. NPL News, 375. p. 9.

Conference or Workshop Item

Thomas, S A; Jin, Y; Bunch, J; Gilmore, I S (2017) Enhancing classification of mass spectrometry imaging data with deep neural networks. In: 2017 IEEE Symposium Series on Computational Intelligence (SSCI), 27 November - 01 December 2017, Honolulu, HI, USA.

Thomas, S A; Race, A M; Steven, R T; Gilmore, I S; Bunch, J (2016) Dimensionality reduction of mass spectrometry imaging data using autoencoders. In: 2016 IEEE Symposium Series on Computational Intelligence (SSCI), 6-9 December 2016, Athens, Greece.

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G-SIMS procedure. In: 12th International Conference on Secondary Ion Mass Spectrometry (SIMS), September 1999, Brussels, Belgium.

Gilmore, I S; Seah, M P; Johnstone, J E (1999) Static SIMS: towards unfragmented mass spectra - the G_SIMS procedure. In: SIMS XII Secondary Ion Mass Spectrometry, 5-10 September 1999, Brussels, Belgium.

Seah, M P; Gilmore, I S; Bishop, H E; Lorang, G (1997) Practical analyses of Intensities in AES. In: ECASIA 97, European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteburg, Sweden.

Gilmore, I S; Seah, M P (1997) Static SIMS - a reliable technique: results from an interlaboratory study. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16 - 20 June 1997, Goteborg, Sweden.

Gilmore, I S; Seah, M P (1997) Static SIMS: an inter-laboratory study. In: 11th International Conference on Secondary Ion Mass Spectrometry, September 1997, Orlando, USA.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1996) An absolute high resolution digital Auger electron reference databases. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Gilmore, I S; Seah, M P (1995) Static SIMS of insulators: damage and the development of measurement reliability. In: ECASIA 95 - European Conference on Applications of Surface and Interface Analysis, 9-13 October 1995, Montreaux, Switzerland.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1995) An absolute, high resolution digital auger electron reference database. In: ECASIA 95 European Conference on Applications of Surface and Interface Analysis, 9 - 13 October 1995, Montreaux, Switzerland.

Book Chapter/Section

Lee, J L S; Gilmore, I S (2009) The application of multivariate data analysis techniques in surface analysis. In: Surface Analysis - The Principal Techniques (Second Edition). WileyBlackwell, pp. 563-612. ISBN 9780470017647

Gilmore, I S (2001) Optimisation of operating conditions. In: ToF-SIMS: surface analysis by mass spectrometry. SurfaceSpectra/IMPublications. ISBN 1901019039