Smith, I M; Harris, P M; Todhunter, L D; Giusca, C; Jiang, X; Scott, P; Leach, R K (2017) Algorithms and software for areal surface texture function parameters. Measurement Science and Technology, 28 (10). 105008

Macaulay, G D; Senin, N*; Giusca, C L; Leach, R K (2016) Study of manufacturing and measurement reproducibility on a laser textured structured surface. Measurement, 94. pp. 942-948.

Leach, R K; Giusca, C; Guttmann, M*; Jakobs, P J*; Rubert, P* (2015) Development of low-cost material measures for calibration of the metrological characteristics of areal surface texture instruments. CIRP Ann. - Manuf. Technol., 64 (1). pp. 545-548.

O'Connor, D; Henning, A J; Sherlock, B; Leach, R K; Coupland, J*; Giusca, C L (2015) Model-based defect detection on structured surfaces having optically unresolved features. Appl. Opt., 54 (30). pp. 8872-8877.

Leach, R K; Evans, C*; He, L*; Davies, A*; Duparre, A*; Henning, A J; Jones, C W; O'Connor, D (2015) Open questions in surface topography measurement: a roadmap. Surf. Topogr.: Metrol. Prop., 3 (1). 013001

MacAulay, G D*; Senin, N*; Giusca, C L; Leach, R K; Ivanov, A* (2015) Review of feature boundary identification techniques for the characterization of tessellated surfaces. Surf. Topogr.: Metrol. Prop., 3 (1). 013002

Ferrucci, M; Leach, R K; Giusca, C L; Carmignato, S*; Dewulf, W* (2015) Towards geometrical calibration of X-ray computed tomography systems - a review. Meas. Sci. Technol., 26 (9). 092003

Claverley, J D; Leach, R K (2015) A review of the existing performance verification infrastructure for micro-CMMs. Precision Eng., 39. pp. 1-15.

Wang, J; Leach, R K; Jiang, X* (2014) Advances in sampling techniques for surface topography measurement - a review. NPL Report. ENG 55

Wang, J; Leach, R K; Jiang, X* (2014) Review of data fusion for surface topography measurement. NPL Report. ENG 54

Leach, R K (2014) The measurement of surface texture using stylus instruments. Measurement Good Practice Guide. 37

Mandal, R*; Coupland, J*; Leach, R K; Mansfield, D* (2014) Coherence scanning interferometry: measurement and correction of three-dimensional transfer and point-spread characteristics. Appl. Opt., 53 (8). pp. 1554-1563.

MacAulay, G D*; Senin, N*; Giusca, C L; Leach, R K (2014) Comparison of segmentation techniques to determine the geometric parameters of structured surfaces. Surf. Topogr.: Metrol. Prop., 2 (4). 044004

Leach, R K; Giusca, C; Rickens, K*; Riemer, O*; Rubert, P* (2014) Development of material measures for performance verifying surface topography measuring instruments. Surf. Topogr.: Metrol. Prop., 2 (2). 025002

Leach, R K; Giusca, C L; Henning, A; Sherlock, B; Coupland, J* (2014) ISO definition of resolution for surface topography measuring instruments. In: Fringe 2013 - 7th International Workshop on Advanced Optical Imaging and Metrology. Springer, pp. 405-410. ISBN 9783642363580

Leach, R K; Weckenmann, A*; Coupland, J*; Hartmann, W* (2014) Interpreting the probe-surface interaction of surface measuring instruments, or what is a surface? Surf. Topogr.: Metrol. Prop., 2 (3). 035001

Tan, J B*; Wang, C*; Wang, Y*; Wang, W B*; Liu, J*; Leach, R K; Hao, L (2014) Long working distance microscope with a low obscuration aspherical Schwarzschild objective. Opt. Lett., 39 (23). pp. 6699-6702.

Evans, A A*; Macdonald, D A*; Giusca, C L; Leach, R K (2014) New method development in prehistoric stone tool research: evaluating use duration and data analysis protocols. Micron, 65. pp. 69-75.

Senin, N*; MacAulay, G*; Giusca, C L; Leach, R K (2014) On the characterisation of periodic patterns in tessellated surfaces. Surf. Topogr.: Metrol. Prop., 2 (2). 025005

Giusca, C L; Claverley, J D; Sun, W J; Leach, R K; Helmli, F*; Chavigner, M P J* (2014) Practical estimation of measurement noise and flatness deviation on focus variation microscopes. CIRP Ann. - Manuf. Technol., 63 (1). pp. 545-548.

Sheu, D Y*; Claverley, J D; Leach, R K (2014) Testing the mechanical characteristics and contacting behavior of novel manufactured and assembled sphere-tipped styli for micro-CMM probes. IFIP Advances in Information and Communication Technology, 435. pp. 15-21.

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of contact stylus instruments. Measurement Good Practice Guide. 129

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) Metrology challenges for highly parallel micro-manufacture. In: 4M 2013 - Proceedings of the 10th International Conference on Multi-Material Micro Manufacture., 8-10 October 2013, San Sebastian, Spain.

Chesna, J W*; Shimizu, Y*; Leach, R K (2013) On the use of mercury sessile drops as reference artefacts for the calibration of optical surface topography measuring instruments. In: 28th Annual Meeting of the American Society for Precision Engineering., 20-25 October 2013, St. Paul, Minnesota, USA.

Leach, R K; Jones, C W; Sherlock, B; Krysinski, A* (2013) The high dynamic range surface metrology challenge. In: 28th Annual Meeting of the American Society for Precision Engineering., 20-25 October 2013, St. Paul, Minnesota, USA.

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of Coherence Scanning Interferometers (CSI) and Phase Shifting Interferometers (PSI). Measurement Good Practice Guide. 127

Giusca, C L; Leach, R K (2013) Calibration of the metrological characteristics of Imaging Confocal Microscopes (ICMs). Measurement Good Practice Guide. 128

Leach, R K; Harris, P M; Smith, I; Giusca, C L; Jiang, X*; Scott, P* (2013) Software measurement standards for areal surface texture parameters. In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference (14th MPES)., 17-21 June 2013, Taipei, Taiwan.

Leach, R K; Giusca, C L; Rubert, P* (2013) A single set of material measures for the calibration of areal surface topography measuring instruments: the NPL Areal Bento Box. In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference (14th MPES), 17-21 June 2013, Taipei, Taiwan.

Hiersemenzel. F*,; Claverley, J D; Singh, J*; Petzing, J N*; Helmli, F*; Leach, R K (2013) ISO compliant reference artefacts for the verification of focus variation-based optical micro-coordinate measuring machines. In: Proceedings of the 13th euspen International Conference, 27-31 May 2013, Berlin, Germany.

Hiersemenzel, F*; Singh, J*; Petzing, J N*; Claverley, J D; Leach, R K; Helmli, F* (2013) Development of a traceable performance verification route for optical micro-CMMs. In: Laser Metrology and Machine Performance X (LAMDAMAP 2013), 20-21 March 2013, Chichley, UK.

Claverley, J D; Leach, R K (2013) Three-dimensional characterisation of a novel vibrating tactile probe for miniature CMMs. In: Laser Metrology and Machine Performance X (LAMDAMAP 2013), 20-21 March 2013, Chicheley, UK.

Giusca, C L; Leach, R K (2013) Calibration of the scales of areal surface topography measuring instruments: Part 3 Resolution. Meas. Sci. Technol., 24 (10). 105010

Coupland, J M*; Mandal, R*; Palodhi, K*; Leach, R K (2013) Coherence scanning interferometry: linear theory of surface measurement. Appl. Opt., 52 (16). pp. 3662-3670.

Henning, A J; Giusca, C; Forbes, A B; Smith, I; Leach, R K; Coupland, J*; Mandal, R* (2013) Correction for lateral distortion in coherence scanning interferometry. CIRP Ann. - Manuf. Technol., 62. pp. 547-550.

Foreman, M R; Giusca, C L; Coupland, J M*; Török, P*; Leach, R K (2013) Determination of the transfer function for optical surface topography measuring instruments - a review. Meas. Sci. Technol., 24 (5). 052001

Claverley, J D; Leach, R K (2013) Development of a three-dimensional vibrating tactile probe for miniature CMMs. Precision Eng., 37 (2). pp. 491-499.

Senin, N*; Blunt, L A*; Leach, R K; Pini, S* (2013) Morphologic segmentation algorithms for extracting individual surface features from areal surface topography maps. Surf. Topogr.: Metrol. Prop., 1 (1). 015005

Foreman, M R; Giusca, C L; Torok, P*; Leach, R K (2013) Phase-retrieved pupil function and coherent transfer function in confocal microscopy. J. Microsc., 251 (1). pp. 99-107.

Leach, R K (2013) Thinking outside the Bento Box: NPL develops a new set of calibration artefacts for areal surface topography measurement. Qual. Manufact. Today (Nov/De). pp. 20-23.

Flay, N; Leach, R K (2012) Application of the optical transfer function in x-ray computed tomography - a review. NPL Report. ENG 41

Leach, R K; Coupland, J*; Mandal, R*; Giusca, C; Foreman, M* (2012) Calibration of areal surface topography measuring instruments: are we there yet? In: 27th Annual Meeting of the American Society for Precision Engineering., 21-26 October 2012, San Diego, CA, USA.

Foreman, M R; Giusca, C L; Leach, R K; Coupland, J M* (2012) Determination of the transfer function for optical surface topography measuring instruments. NPL Report. ENG 36

Giusca, C L; Evans, A A*; McDonald, D*; Leach, R K (2012) The effect of use duration on surface roughness measurements of stone tool. NPL Report. ENG 35

Sun, W; Brown, S B; Leach, R K (2012) An overview of industrial X-ray computed tomography. NPL Report. ENG 32

Nimishakavi, L P; Giusca, C L; Leach, R K; Blanchon, B* (2012) The use of areal surface texture parameters for determining machining parameters in precision grinding. NPL Report. ENG 33

He, B*; Petzing, J*; Webb, P*; Conway, P*; Leach, R K (2012) The use of areal surface texture parameters to characterize the mechanical bond strength of copper on glass plating applications. NPL Report. ENG 34

Leach, R K; Giusca, C L; Coupland, J M* (2012) Advances in calibration methods for micro- and nanoscale surfaces. Proc. SPIE - Int. Soc. Opt. Eng., 8430. 84300H

Leach, R K; Claverley, J D; Giusca, C; Jones, C W; Nimishakavi, L P; Sun, W; Tedaldi, M; Yacoot, A (2012) Advances in engineering nanometrology at the National Physical Laboratory. Meas. Sci. Technol., 23 (7). 074002

Burt, D P*; Dobson, P S*; Docherty, K E*; Jones, C W; Leach, R K; Thoms, S*; Weaver, J M R*; Zhang, Y* (2012) Aperiodic interferometer for six degrees of freedom position measurement. Opt. Lett., 37 (7). pp. 1247-1249.

Mandal, R*; Palodhi, K*; Coupland, J*; Leach, R K; Mansfield, D* (2012) Application of linear systems theory to characterize coherence scanning interferometry. Proc. SPIE - Int. Soc. Opt. Eng., 3430. 84600T

Hiersemenzel, F*; Petzing, J N*; Leach, R K; Helmli, F S*; Singh, J* (2012) Areal texture and angle measurement of tilted surface using focus variation methods. In: International Conference on Surface Metrology (ICSM'2012), 21-23 March 2012, Annecy, France.

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T*; Nimishakavi, L (2012) Calibration of the scales of areal surface topography measuring instruments: Part 1 Measurement noise and residual flatness. Meas. Sci. Technol., 23 (3). 035008

Giusca, C L; Leach, R K; Helery, F* (2012) Calibration of the scales of areal surface topography measuring instruments: Part 2 Amplification, linearity and squarness. Meas. Sci. Technol., 23 (6). 065005

Leach, R K; Giusca, C L (2012) Determination of the metrological characteristics of optical areal surface topography measuring instruments. Proc. SPIE - Int. Soc. Opt. Eng., 8430. 84300Q

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) Intelligent sampling for the measurement of structured surfaces. Meas. Sci. Technol., 23 (8). 085006

Nimishakavi, L P; Giusca, C L; Leach, R K; Blanchon, B* (2012) Measurement and characterization of the areal surface texture of crankshafts for optimizing the process variables during manufacture. In: International Conference on Surface Metrology (ICSM'2012), 21-23 March 2012, Annecy, France.

Meyer, P*; Claverley, J D; Leach, R K (2012) Quality control for deep x-ray lithography (LIGA): a preliminary metrology study. Microsyst. Technol., 18 (4). pp. 415-421.

Claverley, J D; Burisch, A*; Leach, R K; Raatz, A* (2012) Semi-automated assembly of a MEMS-based micro-scale CMM probe and future optimization of the process chain with a view to desktop factory automation. In: Precision Assembly Technologies and Systems 6th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2012,, 12-14 February 2012, Chamonix, France.

Harris, P M; Smith, I M; Leach, R K; Giusca, C; Jiang, X*; Scott, P* (2012) Software measurement standards for areal surface texture parameters: Part I - algorithms. Meas. Sci. Technol., 23 (10). 105008

Harris, P M; Smith, I M; Wang, C*; Giusca, C; Leach, R K (2012) Software measurement standards for areal surface texture parameters: Part II - comparison of software. Meas. Sci. Technol., 23 (10). 105009

McKee, C*; Culshaw, B*; Leach, R K (2012) Thickness measurement of silicon MEMS pressure sensor membrane using laser generated ultrasound. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

He, B*; Petzing, J N*; Webb, D P*; Conway, P P*; Leach, R K (2012) The assessment of areal surface texture parameters for characterizing the adhesive bond strength of copper plated micro-machined glass. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Hiersmenzel, F*; Singh, J*; Petzing, J N*; Leach, R K; Helmli, F*; Danzl, R* (2012) The assessment of residual flatness errors in focus variation areal measuring instruments. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) A boundary segmentation algorithm for extracting micro-scale dimensional parameters in the measurement of structured surfaces. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

Palodhi, K*; Coupland, J*; Leach, R K (2011) Absolute surface topography measurement of composite structures using coherence scanning interferometry. In: 11th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Claverley, J D; Sheu, D-Y*; Burisch, A*; Leach, R K; Raatz, A* (2011) Assembly of a novel MEMS-based 3D vibrating micro-scale co-ordinate measuring machine probe using desktop factory automation. In: IEEE International Symposium on Assembly and Manufacturing (ISAM) 2011, 25-27 May 2011.

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T* (2011) Calibration of the geometrical characteristics of areal surface texture measuring instruments. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Giusca, C L; Leach, R K; Helery, F*; Gutauskas, T* (2011) Calibration of the geometrical characteristics of areal surface topography measuring instruments. J. Phys., Conf. Ser., 311. 012005

Meyer, P*; Claverley, J D; Kaiser, K*; Mohr, J*; Leach, R K (2011) Comparison of dimensional measurements of microparts made using deep x-ray lithography (LIGA): first results. In: 11th International Conference of the European Society for Prescision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Jones, C W; Chetwynd, D*; Singh, J*; Leach, R K (2011) Concept and modelling of a novel active triskelion low force transfer artefact. In: 11th International Conference of the European Society for Precision Engineering and Nanotechnology (euspen 2011), 23-27 May 2011, Lake Como, Italy.

Palodhi, K*; Coupland, J M*; Leach, R K (2011) Determination of the point spread function of a coherence scanning interferometer. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2011) Efficiency of adaptive sampling in surface texture measurement for structured surfaces. IOP Conf. Ser., 311. 012017

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2011) Efficiency of adaptive sampling in surface texture measurement for structured surfaces. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Leach, R K; Boyd, R; Burke, T*; Danzebrink, H-U*; Dirscherl, K*; Dziomba, T*; Gee, M G; Koenders, L*; Morazzani, V*; Pidduck, A*; Roy, D; Unger, W E S*; Yacoot, A (2011) The European nanometrology landscape. Nanotechnology, 22. 062001

He, B*; Webb, D P*; Petzing, J*; Leach, R K (2011) Improving plated copper adhesion for metallisation of glass PCBs. In: International Conference on Electronic Packaging Technology and High Density packageing 2011 (ICEPT-HDP2011), 8-11 August 2011, Shanghai, China.

Palodhi, K*; Coupland, J M*; Leach, R K (2011) Measurement of complex refractive index using microellipsometry and its relevance to surface measurement using coherence scanning interferometry. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Mandal, R*; Palodhi, K*; Coupland, J*; Leach, R K; Mansfields, D* (2011) Measurement of the point spread function in coherence scanning interferometry. In: Proceedings of the International Conference on Trends in Optics and Photonics II, 7-9 December 2011, Kolkata, India.

Wang, J*; Jiang, X Q*; Gurdak, E; Scott, P*; Leach, R K; Tomlins, P; Blunt, L* (2011) Numerical characterisation of biomedical titanium surface texture using novel feature parameters. Wear, 271 (7-8). pp. 1059-1065.

Harris, P M; Leach, R K; Giusca, C (2011) Uncertainty evaluation for the calculation of a surface texture parameter in the profile case. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Giusca, C L; Leach, R K; Forbes, A B (2011) A virtual machine-based uncertainty evaluation for a traceable areal surface texture measuring instrument. Measurement, 44 (5). pp. 988-993.

Claverley, J D; Leach, R K (2010) Investigation into the fixturing techniques used by the project partners in the EUMINAfab consortium. NPL Report. ENG 28

Petzing, J*; Coupland, J*; Leach, R K (2010) The measurement of rough surface topography using coherence scanning interferometry. Measurement Good Practice Guide. 116

Claverley, J D; Coupland, J M*; Leach, R K (2010) Measurement of the form and layer thickness of the target spheres for inertial confinement fusion. NPL Report. ENG 26

Sun, W; Leach, R K (2010) Measurement of the internal geometry of MEMS structures. NPL Report. ENG 24

Harris, P M; Leach, R K; Giusca, C (2010) Uncertainty evaluation for the calculation of a surface texture parameter in the profile case. NPL Report. MS 8

Sun, W; Leach, R K (2010) Advanced optical techniques for the measurement of the internal geometry of MEMS structures. Proc. SPIE - Int. Soc. Opt. Eng., 7544. pp. 754461-1.

Leach, R K; Haitjema, H* (2010) Bandwidth characteristics and comparisons of surface texture measuring instruments. Meas. Sci. Technol., 21 (3). 032001

Leach, R K; Li, T*; Jiang, X*; Blunt, L*; Giusca, C (2010) Comparison of commercial software packages for calculating surface texture parameters. In: 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.

Leach, R K (2010) Engineering the surface to affect its function. Measurement and Control, 43 (9). pp. 278-279.

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Claverley, J D; Leach, R K (2010) Micro-scale co-ordinate metrology at the National Physical Laboratory. In: 36th International MATADOR Conference, 14 - 16 July 2010, Manchester, UK.

Claverley, J D; Georgi, A*; Leach, R K (2010) Modelling the interaction forces between an ideal measurement surface and the stylus tip of a novel vibrating micro-scale CMM probe. In: 5th International Precision Assembly Seminar (IPAS 2010), February 2010, Chamonix, France.

Rajaguru, P*; Stoyanov, S*; Tang, Y K*; Bailey, C*; Claverley, J; Leach, R K; Topham, D* (2010) Numerical modelling methodology for design of miniaturised integrated products - an application to 3D CMM micro-probe development. In: 11th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiements in Microelectronics and Microsystems (EuroSimE 2010)., 26-28 April 2010, Bordeaux, France.

Stoyanov, S*; Rajagura, P*; Tang, Y K*; Bailey, C*; Claverley, J; Leach, R K (2010) Reduced order modelling for risk mitigation in design of miniaturised/integrated products. In: 33rd International Spring Seminar on Electronics Technology, 12-16 May 2010, Warsaw, Poland.

Leach, R K; Giusca, C; Naoi, K* (2010) Traceability for areal surface texture measurement. Key Eng. Mater., 437. pp. 121-125.

Smale, D*; Haley, S*; Segal, J*; Ronaldo, R*; Ratchev, S*; Leach, R K; Claverley, J D (2010) Utilisation of FIB/SEM technology in the assembly of an innovative micro-CMM probe. In: 5th International Precision Assembly Seminar (IPAS 2010), February 2010, Chamonix, France.

Claverley, J D; Leach, R K (2010) A novel three-axis vibrating micro-CMM probe with isotropic probing forces. In: Proceedings of the 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.

Claverley, J D; Leach, R K (2010) A vibrating micro-scale CMM probe for measuring high aspect ratio structures. Microsyst. Technol., 16 (8-9). pp. 1507-1512.

Leach, R K; Giusca, C (2009) Results from a comparison of optical thin film thickness measurement. NPL Report. ENG 18

Li, T*; Leach, R K; Jiang, X*; Blunt, L A* (2009) Comparison of type F2 software measurement standards for surface texture. NPL Report. ENG 16

Wilson, A; Leach, R K (2009) Manufacturing and testing of a micro-stylus suitable for tactile probing in dimensional metrology. NPL Report. ENG 15

Tietje,C*,; Leach, R K; Turitto, M*; Ronaldo, R*; Ratchev, S* (2009) Application of a DFµA methodology to facilitate the assembly of a micro/nano measurement device. IFIP International Federation for Information Processing, 260. pp. 5-12.

Smale, D*; Ratchev, S*; Segal, J*; Leach, R K; Claverley, J D (2009) Assembly of the stem and tip of an innovative micro-CMM probe. In: 9th International Conference and Exhibition on Laser Meterology, Machine Tool, CMM and Robotic Performance (LAMDAMAP 2009), 2009.

Giusca, C L; Forbes, A B; Leach, R K (2009) Comparison between GUM, Monte Carlo and bayesian uncertainty evaluation approaches for an areal surface texture measuring instrument. In: 14th International Congress of Metrology, 22-25 June 2009, Paris.

Leach, R K; Giusca, C L; Naoi, K* (2009) Development and characterisation of a new instrument for the traceable measurement of areal surface texture. Meas. Sci. Technol., 20 (12). 125102

Leach, R K; Flack, D R; Hughes, E B; Jones, C W (2009) Development of a new traceable areal surface texture measuring instrument. Wear, 266. pp. 552-554.

Yacoot, A; Leach, R K; Hughes, B; Giusca, C; Jones, C W; Wilson, A (2009) Dimensional nanometrology at The National Physical Laboratory. Proc. SPIE - Int. Soc. Opt. Eng., 7133. pp. 713345-1.

Kautt, M*; Anson, S M*; Saile, V*; Scholz, S*; Fugier, P*; Lambertini, V*; Abad, E*; Dirne, F*; Loeschner, H*; Leach, R K (2009) Facilitating open innovation in micro and nano technology by providing open access to a pan-European toolbox called EUMINAfab. In: 4M/ICOMM 2009 Conference, 23-25 September 2009, Forschungszentrum Karlruhe, Germany.

Leach, R K (2009) Metrology for nanotechnology. Qual. Manufact. Today (Septem). pp. 28-29.

Forbes, A B; Leach, R K (2009) Reducing the effects of measurement noise when determining surface texture parameters. In: 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), 29 June - 2 July 2009, Saint-Petersburg, Russia.

Leach, R K; Jones, C W (2009) Towards a traceable infrastructure for low force measurements. IFIP International Federation for Information Processing, 260. pp. 307-314.

Leach, R K; Giusca, C; Naoi, K* (2009) Traceability for areal surface texture measurement. In: 9th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII-2009), 29 June - 2 July 2009, Saint-Petersburg, Russia.

Giusca, C L; Forbes, A B; Leach, R K (2009) Uncertainty evaluation for a new traceable areal surface texture measuring instrument. In: 12th International Conference on Metrology and Properties of Engineering Surfaces, 8-10 July 2009, Rzeszów, Poland.

Leach, R K (2009) The measurement and characterisation of three dimensional surface texture - a bright future for advanced manufacturing. Qual. Manufact. Today (Jan - ). pp. 37-38.

Leach, R K (2009) The measurement and characterisation of three dimensional surface texture - a bright future for advanced manufacturing. MST News (1). pp. 8-9.

Leach, R K; Giusca, C*; Naoi, K* (2009) A traceability infrastructure for three-dimensional surface measurements at the National Physical Laboratory. In: Proceedings of the 9th euspen International Conference, 2-5 June 2009, San Sebastian, Spain.

Brice, L K W; Morris, S*; Motely, J*; Leach, R K (2008) Measurement of single and multi layer thin film coatings for medical implants. NPL Report. ENG 10

Robinson, A D; Leach, R K (2008) Overview of tomography techniques to measure wafer thickness in MEMS structures. NPL Report. ENG 8

Leach, R K; Brown, L*; Jiang, X*; Blunt, R*; Conroy, M*; Mauger, D* (2008) Guide to the measurement of smooth surface topography using coherence scanning interferometry. Measurement Good Practice Guide. 108

Jones, C W; Leach, R K (2008) Review of low force transfer artefact technologies. NPL Report. ENG 5

Jones, C W; Leach, R K (2008) Adding a dynamic aspect to amplitude-wavelength space. Meas. Sci. Technol., 19 (5). 055105

Jones, C W; Leach, R K (2008) Amplitude-wavelength space in three dimensions. In: 12th International Colloquium on Surfaces, 28-29 January 2008, Chemnitz, Germany.

Jones, C W; Davidson, S; Kramer, J A*; Leach, R K; Pratt, J R* (2008) Comparison of NIST SI force scale to NPL SI mass scale. In: ASPE 2008 Annual Meeting, 19-24 October 2008, Portland, Oregon.

Lobera, J*; Gao, F*; Coupland, J*; Leach, R K (2008) Limitations and innovations in scanning white light interferometry. In: euspen 2008, 18-22 May 2008, Zurich.

Brice, L K W; Morris, S*; Motely, J*; Leach, R K (2008) Measurement of single and multi layer thin film coatings for medical implants. In: euspen 2008, 18-22 May 2008, Zurich.

Leach, R K (2008) Metrology for micro- and nanotechnology: some perspectives on requirements. Micro Manufacturing, 08 (08). pp. 18-21.

Stoyanov, S*; Bailey, C*; Leach, R K; Hughes, B; Wilson, A; O'Neill, W*; Dorey, R A*; Shaw, C*; Underhill, D*; Almond, H J* (2008) Modelling and prototyping the conceptual design of 3D CMM micro-probe. In: 2nd Electronics Systemintegration Technology Conference, 2008, Greenwich, UK.

Geo, F*; Leach, R K; Petzing, J*; Coupland, J M* (2008) Surface measurement errors using commercial scanning white light interferometers. Meas. Sci. Technol., 19 (1). 015303

Leach, R K; Giusca, C (2008) Traceable measurement of areal surface texture. In: Proceedings of the 4th International Conference on Multi-Material Micro Manufacture (4M 2008), 9-11 September 2008, Cardiff, UK.

Blunt, L*; Xiang Jiang*,; Leach, R K; Harris, P M; Scott, P* (2008) The development of user-friendly software measurement standards for surface topography software assessment. Wear, 264 (5-6). pp. 389-393.

Yacoot, A; Leach, R K (2007) Review of x-ray and optical thin film measurement methods and transfer artefacts. NPL Report. DEPC-EM 013

Leach, R K; Flack, D R; Hughes, E B; Jones, C W (2007) Development of a new traceable areal surface texture measuring instrument. In: 11th International Conference on Metrology & Properties of Engineering Surfaces., 17-20 July 2007, Huddersfield, UK.

Gao, F*; Petzing, J N*; Coupland, J M*; Leach, R K (2007) Measurement of structured surfaces using stylus AFM and optical methods. In: 7th International Conference and 9th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 17-20 July 2007, Huddersfield, UK.

Leach, R K (2007) A new tactile probe based on differential interferometry for use in areal surface texture measurement. In: 7th International Conference and 9th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 20-24 May 2007, Bremen, Germany.

Reilly, S P; Leach, R K; Cuenat, A; Awan, S A; Lowe, M (2006) Overview of MEMS sensors and the metrology requirements for their manufacture. NMS Programme for Engineering Measurement 2005-2008. NPL Report. DEPC-EM 008

Reilly, S P; Leach, R K (2006) Critical review of seismic vibration isolation techniques. NPL Report. DEPC-EM 007

Bayliss, D J; Leach, R K; Hall, M J (2006) Development of an electromagnetic spring for use with a high accuracy surface texture measuring probe. NPL Report. DEPC-EM 006

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2006) Propagation of uncertainty in discretely sampled surface roughness profiles. In: Proceedings of the International Workshop on Advanced Mathematical and Computational Tools in Metrology VII, 2006.

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

Leach, R K; Harris, P M (2006) Softgauges for surface texture. Qual. Today (March). pp. 12-14.

Leach, R K; Oldfield, S; Georgakopoulos, D (2006) Traceable nanonewton force measurement at the National Physical Laboratory, UK. In: euspan 6th International Conference and 8th Annual Meeting of the European Society for Precision Engineering and Nanotechnology, 28 May -1 June 2006, Vienna, Austria.

Blunt, L*; Jiang, X*; Xiao, S*; Li, T*; Feng, X*; Brennan, J*; Scott, P*; Leach, R K; Harris, P M; Parkin, G I (2005) Development and dissemination of SOFTGAUGES for surface topography. Technical Report. Centre for Precision Technologies, University of Huddersfield.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Approximation of surface texture profiles. J. Phys., Conf. Ser., 13. pp. 264-267.

Blunt, L*; Leach, R K; Jiang, X*; Scott, P*; Harris, P M; Xiao, S*; Li, T*; Parkin, G I (2005) Development of softgauges for surface metrology. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Tomlins, P E; Leach, R K; Vadgama, P*; Mikhalovsky, S*; James, S* (2005) On the topographical characterisation of biomaterial surfaces. In: Surfaces and interfaces for biomaterials. Woodhead Publishing Ltd, pp. 693-716. ISBN 1855739305

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2005) Recent advances in traceable nanoscale dimension and force metrology in the UK. In: ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Reconstruction of continuous surface profiles from discretely sampled data. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Forbes, A B; Leach, R K (2005) Self-calibration of a novel surface texture measuring instrument. In: Laser Mapping and Machine Performance VII (LAMDAMAP 2005), 25-27 June 2005, Cranfield University, UK.

Haycocks, J; Jackson, K; Leach, R K; Garratt, J*; McDonnell, I*; Rubert, P*; Lamb, J*; Wheeler, S* (2005) Tackling the challenge of traceable surface texture measurement in three dimensions. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Blunt, L*; Jiang, X*; Leach, R K; Harris, P M; Scott, P* (2005) The development of user-friendly software measurement standards for surface topography software assessment. In: Proceedings 10th International Conference on Metrology and Properties of Engineering Surfaces, 4-7 July 2005, St Ettiane, France.

Leach, R K; Oldfield, S; Awan, S A; Blackburn, J; Williams, J M (2004) Design of a bi-directional electrostatic actuator for realising nanonewton to micronewton forces. NPL Report. DEPC-EM 001

Leach, R K; Murphy, J; Wilson, A (2004) Design of a co-ordinate measuring probing system for characterising three-dimensional micro-structures. NPL Report. CBTLM 30

Forbes, A B; Leach, R K; Brill, N* (2004) The Abbe principle, self-calibration and the design of co-ordinate measuring systems. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Brennan, J K*; Mason, J C*; Jiang, X*; Leach, R K; Harris, P M (2004) Approximation of surface texture profiles and parameters. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Leach, R K; Bennett, I* (2004) Characterisation of a new vertical scanning white light interferometer - a test case? In: 11th International Colloquium on Surfaces, 2-3 February 2004, Chemnitz, Germany.

Peggs, G N; Lewis, A J; Leach, R K (2004) Measuring the metrology gap: three dimensional metrology at the mesoscopic level. J. Manuf. Process., 6 (1). pp. 117-124.

Lee-Bennett, I*; Leach, R K (2004) Metrology for microsystems - characterisation of a new broadband interferometer. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Leach, R K (2004) Some issues of traceability in the field of surface topography measurement. In: Proceedings of the 9th International Conference on Metrology and Properties of Engineering Surfaces, April 2004, Sweden.

Leach, R K (2004) Some issues of traceability in the field of surface topography measurement. Wear, 257. pp. 1246-1249.

Leach, R K; Cui, Z*; Lewis, A; Singleton, L* (2004) Standardisation of microsystems technology: completion of the MEMSTAND project. MST News, 1 (Februa). pp. 39-41.

Leach, R K (2004) Surface texture metrology: more than just skin deep. Eng. Technol. (March). pp. 42-43.

Leach, R K; Harris, P M (2004) Uncertain about surfaces? [surface texture measurement]. Qual. Today (Februa). pp. 24-25.

Leach, R K; Murphy, J (2004) The design of co-ordinate measuring probe for characterising truly three-dimensional micro-structures. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.

Forbes, A B; Harris, P M; Leach, R K (2003) The comparison of algorithm for the assessment of Type A1 surface texture reference artefacts. NPL Report. CMSC 33/03

Singleton, L*; Leach, R K; Cui, Z* (2003) Analysis of the MEMSTAND survey on standardisation for microsystems technology. In: Proceedings of the International Seminar MEMSTAND - "Standardisation for Microsystems: the Way Forward"., 24-26 February 2003, Barcelona, Spain.

Peggs, G N; Lewis, A; Leach, R K (2003) Measuring in three dimensions at the mesoscopic level. In: Proceedings of the ASPE Winter Topical Meeting - Machines and Processes for Micro-scale and Meso-scale Fabrication, Metrology and Assembly., January 2003, Florida, USA.

Leach, R K (2003) Metrology and testing for micro- to nano-technology: a wish list with associated problems. In: Proceedings of euspen Topical Conference on Precision Engineering, Micro Technology, Measurement Techniques and Equipment, 19-20 May 2003, Aachen, Germany.

Leach, R K (2003) Metrology and testing of micro- and nano-systems: current situation and future needs. In: Proceedings of euspen Conference "Transferring Micro-systems Technology Through the Commercial Markets", 14-15 April 2003, NPL, UK.

Leach, R K; Cui, Z*; Flack, D R (2003) Microsystems technology standardisation roadmap. Technical Report. NPL, UK.

Cui, Z*; Leach, R K; Lewis, A; Singleton, L* (2003) Standardisation for microsystems technology: the way forward. In: Proceedings of the 8th International Conference on the Commercialization of Micro and Nano Systems: COMS 2003, 8-11 September 2003, Amsterdam.

Leach, R K; Lewis, A; Singleton, L*; Cui, Z* (2003) Towards a standardisation roadmap for micro-systems technology: review of the MEMSTAND survey. In: Proceedings of euspen "Transferring Micro-systems Technology though the Commercial Markets"., 14-15 April 2003, NPL,UK.

Chetwynd, D*; Howell, G*; Leach, R K (2002) Evaluation of the dynamic performance of a glass cantilever style constant force probe for the measurement of surface texture. NPL Report. CBTLM 23

Hart, A; Haycocks, J; Jackson, K; Law, A; Leach, R K (2002) Measurement of surface texture in CBTLM: a three-year review of instrument capabilities. NPL Report. CBTLM 21

Leach, R K; Hart, A (2002) A comparison of stylus and optical methods for measuring 2D surface textures. NPL Report. CBTLM 15

Leach, R K; Harris, P M (2002) Ambiguities in the definition of spacing parameters for surface texture characterisation. Meas. Sci. Technol., 13. pp. 1924-1930.

Chetwynd, D G*; Leach, R K (2002) Dynamic performance of a cantilever-based topography. In: 3rd Internation Conference of the European Society for Precision Engineering and Nanotechnology (euspen), 26-30 May 2002, Eindhoven, The Netherlands.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2002) From nanoscience to nanotechnology. In: International Seminar "Challenges for Precision Engineering and Nanotechnologies", 7-8 February 2002, Huddersfield, UK.

Leach, R K; Cross, N R (2002) Low-cost traceable dynamic calibration of surface texture measuring instruments. Meas. Sci. Technol., 13. pp. N1-N4.

Leach, R K (2002) Miniature machine plugs metrology gap. Phys. World, 15 (6). pp. 27-28.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2002) Nanoscience advances in the UK in support of nanotechnology. International Journal of Nanoscience, 1 (2). pp. 123-138.

Leach, R K (2002) Surface texture - stylus v optical? Qual. Today (Januar). S18-S20

Leach, R K (2002) Traceable measurements of surface texture in the optics industry. Proc. SPIE - Int. Soc. Opt. Eng., 4411. pp. 177-183.

Leach, R K (2002) The importance of metrology and standardisation for micro-systems technology. In: 7th International Conference on Commercialisation of Micro and Nano Systems, 8-12 September 2002, Michigan, USA.

Law, A; Leach, R K (2001) Use of a polymer film bridge to measure the contact force applied by instruments used in the measurement of surface textures. NPL Report. CBTLM 14

Hart, A; Leach, R K (2001) Review of methods for cleaning surfaces prior to surface texture measurement as part of project LE9953, milestone 5.3.1.4. NPL Report. CBTLM 12

Leach, R K; Hart, A (2001) Investigation into the shape of diamond styli used for surface texture measurement. NPL Report. CBTLM 10

Leach, R K; Garbutt, I; Harris, P; Cox, M G (2001) Production, measurement and analysis of sinusoidal artefacts for calibration of surface texture measuring instruments. NPL Report. CBTLM 7

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. pp. R1-R6.

Leach, R K (2001) Current problems in the field of surface texture measurement. In: National Measurement Conference (NMC) 2001, 6-8 November 2001, Harrogate, UK.

Leach, R K (2001) NanoSurf IV: Traceable measurement of surface texture at the National Physical Laboratory, UK. Int. J. Mach. Tools Manuf. (UK), 41 (13-14). pp. 2113-2121.

Leach, R K; Garbutt, I; Cox, M G (2001) Sinusoidally modulated reference artefacts for calibration of surface texture measuring instruments. In: Proceedings of 2nd European Society for Precision Engineering and Nanotechnology (Euspen) International Conference, 27-31 May 2001, Turin, Italy.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2001) The need for a metrology infrastructure to support nanotechnology. In: Proceedings of the 5th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 25-29 September 2001, Cairo, Egypt.

Leach, R K (2001) A recent comparison of stylus and optical methods for measuring surface texture. In: 9th IMEKO Symposium Metrology for Quality Control in Production; Surface Metrology for Quality Assurance., 24-27 September 2001, Cairo, Egypt.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Leach, R K; Hart, A (2000) EUROMET Project 413: inter-laboratory comparison of measurements of the phase correction in the field of guage block interforometry. Metrologia, 37. pp. 261-267.

Davies, R*; London, J*; Leach, R K; Turner, N (2000) 'Measurement matters' consistent and accurate measurement for the clothing industry. In: IFFTI 3rd Annual Conference Fashion Directions: Visioning the Future, 8-9 November 2000, London College of Fashion.

Leach, R K (2000) NanoSurf IV: Traceable measurement of surface texture. In: Xth International Conference on Surfaces., Jan 2000, Chemnitz, Germany.

Leach, R K (2000) Telling the rough from the smooth. Mater. World (Februa). pp. 18-19.

Leach, R K (2000) Traceable measurement of surface texture at the National Physical Laboratory using NanoSurf IV. Meas. Sci. Technol., 11. pp. 1162-1173.

Leach, R K (1999) Calibration, traceability and uncertainty issues in surface texture metrology. NPL Report. CLM 7

Leach, R K; Hart, A; Jackson, K (1999) Measurement of gauge blocks by interferometry: an investigation into the variability in wringing film thickness. NPL Report. CLM 3

Leach, R K (1998) Measurement of a correction for the phase change on reflection due to surface roughness. Proc. SPIE - Int. Soc. Opt. Eng., 3477. pp. 138-151.

Leach, R K; Jackson, K; Hart, A (1997) Measurement of gauge blocks by interferometry: measurement of the phase change at reflection. NPL Report. MOT 11

Leach, R K; Jackson, K; Hart, A (1997) Design of two systems to measure the phase change at reflection and one system to measure the variability in contact error due to wringing. NPL Report. MOT 10

Leach, R K (1995) A novel 3-axis CMM probe calibration facility. NPL Report. MOM 126