Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

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Item Type:	Article
Keywords:	nanometrology, surface texture
Subjects:	Nanoscience Nanoscience > Nano-Dimensional
Last Modified:	02 Feb 2018 13:16
URI:	http://eprintspublications.npl.co.uk/id/eprint/3397

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