Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.
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Item Type: | Article |
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Keywords: | nanometrology, surface texture |
Subjects: | Nanoscience Nanoscience > Nano-Dimensional |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3397 |
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