Report/Guide

Reed, B P; Spencer, S J; Shard, A G (2019) VAMAS TWA 2, 2019, sub-project A27:" intensity calibration for XPS instruments using low-density poly(ethylene)": protocol for analysis. NPL Report. AS 100

Belsey, N A; Cant, D J H; Shard, A G; Minelli, C (2015) VAMAS TWA 2: Project A19: Inter-laboratory study of the measurement of chemistry and thickness of nanoparticle coatings: Protocol for sample preparation. NPL Report. AS 95

Shard, A G; Havelund, R; Spencer, S J; Smith, S A (2014) VAMAS TWA 2, 2014: sub-project A3(g) static SIMS interlaboratory study: organic depth profiling of mixed materials - protocol for analysis. NPL Report. AS 88

Shard, A G; Yang, L; Ray, S (2009) VAMAS TWA 2, 2009:sub-project A3(d) static SIMS iterlaboratory study Part I: organic depth profiling by cluster ion beams - protocol for analysis. NPL Report. AS 32

Lee, J L S; Gilmore, I S; Seah, M P; Shard, A G (2009) VAMAS project A3(d) static SIMS interlaboratory study - Part I: linearity of the intensity scale - protocol for analysis. NPL Report. AS 31

Lam, J K; Winkless, L; Shard, A G; Tomlins, P E (2008) On the preparation of textured surfaces for cell adhesion/differentiation studies. NPL Report. MAT 14

Article

Shard, A G; Baker, M A (2024) Practical guides for X-ray photoelectron spectroscopy: use of argon ion beams for sputter depth profiling and cleaning. Journal of Vacuum Science & Technology A, 42 (5). 050801

Artyushkova, K; Leadley, S R; Shard, A G (2024) An introduction to reproducible laboratory hard x-ray photoelectron spectroscopy. Journal of Vacuum Science & Technology A, 42 (5). 052801

Patel, K M; Withington, S; Shard, A G; Goldie, D J; Thomas, C N (2024) Electron Spectroscopy using Transition-Edge Sensors. Journal of Applied Physics, 135 (22). 224504

Shard, A G; Baer, D R; Clifford, C A (2024) Importance of Standard Terminology in Surface Chemical Analysis: ISO 18115-1:2023, General Terms and Terms used in Spectroscopy. Surface and Interface Analysis, 56 (5). pp. 305-307.

Cant, D J H; Pei, Y; Shchukarev, A; Ramstedt, M; Marques, S S; Segundo, M A; Parot, J; Molska, A; Borgos, S E; Shard, A G; Minelli, C (2023) Cryo-XPS for surface characterisation of nanomedicines. The Journal of Physical Chemistry A, 127 (39). pp. 8220-8227.

Cant, D J H; Reed, B P; Spencer, B F; Flavell, W R; Shard, A G (2023) Magic Angle HAXPES. Journal of Electron Spectroscopy and Related Phenomena, 264. 147311

Marchesini, S; Reed, B P; Jones, H; Matjacic, L; Rosser, T E; Zhou, Y; Brennan, B; Tiddia, M; Jervis, R; Loveridge, M J; Raccichini, R; Park, J; Wain, A J; Hinds, G; Gilmore, I S; Shard, A G; Pollard, A P (2022) Surface Analysis of Pristine and Cycled NMC/Graphite Lithium-Ion Battery Electrodes: Addressing the Measurement Challenges. ACS Applied Materials & Interfaces, 14 (47). pp. 52779-52793.

de Graaf, S E; Un, S; Shard, A G; Lindstrom, T (2022) Chemical and structural identification of material defects in superconducting quantum circuits. Materials for Quantum Technology, 2 (3). 032001

Hinchliffe, B; Turner, P; Cant, D J H; de Santis, E; Aggarwal, P; Harris, R; Templeton, D; Shard, A G; Hodnett, M; Minelli, C (2022) Deagglomeration of DNA nanomedicine carriers using controlled ultrasonication. Ultrasonics Sonochemistry, 89. 106141

Radnik, J; Knigge, X; Andresen, E; Resch-Genger, U; Cant, D J H; Shard, A G; Clifford, C A (2022) Composition, thickness, and homogeneity of the coating of core-shell nanoparticles-possibilities, limits, and challenges of X-ray photoelectron spectroscopy. Analytical and Bioanalytical Chemistry, 414 (15). pp. 4331-4345.

Spencer, B F; Church, S A; Thompson, P; Cant, D J H; Maniyarasu, S; Theodosiou, A; Jones, A N; Kappers, M J; Binks, D J; Oliver, R A; Higgins, J; Thomson, T; Shard, A G; Flavell, W R (2022) Characterization of buried interfaces using Ga Kα Hard X-ray Photoelectron Spectroscopy (HAXPES). Faraday Discussions, 236. pp. 311-337.

Taylor, M; Simoes, F; Smith, J; Genapathy, S; Canning, A; Lledos, M; Chan, W C; Denning, C; Scurr, D J; Steven, R T; Spencer, S J; Shard, A G; Alexander, M R; Zelzer, M (2022) Quantifiable correlation of ToF-SIMS and XPS data from polymer surfaces with controlled amino acid and peptide content. Surface and Interface Analysis, 54 (4). pp. 417-432.

Cant, D J H; Spencer, B; Flavell, W R; Shard, A G (2022) Quantification of hard X-ray photoelectron spectroscopy: Calculating relative sensitivity factors for 1.5-to 10-keV photons in any instrument geometry. Surface and Interface Analysis, 54 (4). pp. 442-454.

Edney, M K; Kotowska, A M; Spanu, M; Trindade, G F; Wilmot, E; Reid, J; Barker, J; Aylott, J W; Shard, A G; Alexander, M R; Snape, C E; Scurr, D J (2022) Molecular Formula Prediction for Chemical Filtering of 3D OrbiSIMS Datasets. Analytical Chemistry, 94 (11). pp. 4703-4711.

Minelli, C; Wywijas, M; Bartczak, D; Cuello-Nunez, S; Infante, H G; Deumer, J; Gollwitzer, C; Krumrey, M; Murphy, K E; Johnson, M E; Monoro Bustos, A R; Strenge, I H; Faure, B; Hoghoj, P; Tong, V; Burr, L; Norling, K; Hook, F; Roesslein, M; Kocic, J; Hendriks, L; Kestens, V; Ramaye, Y; Contreras Lopez, M C; Auclair, G; Mehn, D; Gilliland, D; Potthoff, A; Oelschlagel, K; Tentschert, J; Jungnickel, H; Krause, B; Hachenberger, Y U; Reichardt, P; Luch, A; Whittaker, T E; Stevens, M M; Gupta, S; Singh, A; Lin, F; Liu, Y H; Costa, A L; Baldisserri, C; Jawad, R; Andaloussi, S E L; Holme, M N; Lee, T G; Kwak, M; Kim, J; Ziebel, J; Guignard, C; Cambier, S; Contal, S; Gutleb, A C; Tatarkiewicz, J; Jankiewicz, B J; Bartosewicz, B; Wu, X; Fagan, J A; Elje, E; Runden-Pran, E; Dusinska, M; Kaur, I P; Price, D; Nesbitt, I; O'Reilly, S; Peters, R J B; Bucher, G; Coleman, D; Harrison, A J; Ghanem, A; Gering, A; McCarron, E; Fitzgerald, N; Cornelis, G; Tuoriniemi, J; Sakai, M; Tsuchida, H; Maguire, C; Prina-Mello, A; Lawler, A-J; Adams, J; Schultz, C L; Constantin, D; Thanh, N T K; Tung, L D; Panariello, L; Damilos, S; Gavriilidis, A; Lynch, I; Fryer, B; Carrazco-Quevedo, A; Guggenheim, E; Briffa, S; Valsami-Jones, E; Huang, Y; Keller, A A; Kinnunen, V T; Peramaki, S; Krpetic, Z; Greenwood, M; Shard, A G (2022) Versailles Project on Advanced Materials and Standards (VAMAS) Interlaboratory Study on Measuring the Number Concentration of colloidal gold nanoparticles. Nanoscale, 14 (12). pp. 4690-4704.

Reed, B P; Radnik, J; Shard, A G (2022) Ionic liquid [PMIM]+[NTf2]– (Solarpur®) characterized by XPS. Surface Science Spectra, 29 (1). 014001

Counsell, J D; Shard, A G; Cant, D J; Blomfield, C J; Navabpour, P; Zhang, X (2021) Gold, Silver and Copper reference spectra for XPS instruments with monochromatic Ag Lα sources. Surface Science Spectra, 28. 024005

Patel, K M; Withington, S; Thomas, C N; Goldie, D J; Shard, A G (2021) Simulation Method for Investigating the Use of Transition-Edge Sensors as Spectroscopic Electron Detectors. Superconductor Science and Technology, 34 (12). 125007

Cant, D J H; Muller, A; Clifford, C A; Unger, W E S; Shard, A G (2021) Summary of ISO/TC 201 Technical Report 23173 — Surface chemical analysis — Electron spectroscopies — Measurement of the thickness and composition of nanoparticle coatings. Surface and Interface Analysis, 53 (10). pp. 893-898.

Shard, A G; Miisho, A; Vorng, J L; Havelund, R; Gilmore, I S; Aoyagi, S (2021) A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects. Surface and Interface Analysis, 54 (4). pp. 363-373.

Reed, B P; Cant, D J H; Spencer, S J; Carmona-Carmona, A J; Bushell, A; Herrera-Gómez, A; Kurokawa, A; Thissen, A; Thomas, A G; Britton, A J; Bernasik, A; Fuchs, A; Baddorf, A P; Bock, B; Theilacker, B; Cheng, B; Castner, D G; Morgan, D J; Valley, D; Willneff, E A; Smith, E F; Nolot, E; Xie, F; Zorn, G; Smith, G C; Yasufuku, H; Fenton, J L; Chen, J; Counsell, J D P; Radnik, J; Gaskell, K J; Artyushkova, K; Yang, L; Zhang, L; Eguchi, M; Walker, M; Hajdyła, M; Marzec, M M; Linford, M R; Kubota, N; Cortazar-Martínez, O; Dietrich, P; Satoh, R; Schroeder, S L M; Avval, T G; Nagatomi, T; Fernandez, V; Lake, W; Azuma, Y; Yoshikawa, Y; Compean-Gonzalez, C L; Ceccone, G; Shard, A G (2021) ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]. Journal of Vacuum Science & Technology A, 39 (2). 027001 ISSN 0734-2101

Baer, D R; McGuire, G E; Artyushkova, K; Easton, C D; Engelhard, M H; Shard, A G (2021) Introduction to topical collection: Reproducibility challenges and solutions with a focus on guides to XPS analysis. Journal of Vacuum Science & Technology A, 39 (2). 021601 ISSN 0734-2101

Lorenz, M; Zhang, J; Shard, A G; Vorng, J L; Rakowska, P D; Gilmore, I S (2021) Method for Molecular Layer Deposition Using Gas Cluster Ion Beam Sputtering with Example Application In Situ Matrix-Enhanced Secondary Ion Mass Spectrometry. Analytical Chemistry, 93 (7). pp. 3436-3444. ISSN 0003-2700

Baer, D R; Artyushkova, K; Richard Brundle, C; Castle, J E; Engelhard, M H; Gaskell, K J; Grant, J T; Haasch, R T; Linford, M R; Powell, C J; Shard, A G; Sherwood, P M A; Smentkowski, V S (2021) Erratum: “Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements” [J. Vac. Sci. Technol. A 37, 031401 (2019)]. Journal of Vacuum Science & Technology A, 39 (1). 017003 ISSN 0734-2101

Shard, A G; Reed, B P (2020) Al Kα XPS reference spectra of polyethylene for all instrument geometries. Journal of Vacuum Science & Technology A, 38 (6). 063209 ISSN 0734-2101

Reed, B P; Cant, D J H; Spencer, S J; Carmona-Carmona, A J; Bushell, A; Herrera-Gómez, A; Kurokawa, A; Thissen, A; Thomas, A G; Britton, A J; Bernasik, A; Fuchs, A; Baddorf, A P; Bock, B; Theilacker, B; Cheng, B; Castner, D G; Morgan, D J; Valley, D; Willneff, E A; Smith, E F; Nolot, E; Xie, F; Zorn, G; Smith, G C; Yasufuku, H; Fenton, J L; Chen, J; Counsell, J D P; Radnik, J; Gaskell, K J; Artyushkova, K; Yang, L; Zhang, L; Eguchi, M; Walker, M; Hajdyła, M; Marzec, M M; Linford, M R; Kubota, N; Cortazar-Martínez, O; Dietrich, P; Satoh, R; Schroeder, S L M; Avval, T G; Nagatomi, T; Fernandez, V; Lake, W; Azuma, Y; Yoshikawa, Y; Shard, A G (2020) Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. Journal of Vacuum Science & Technology A, 38 (6). 063208 ISSN 0734-2101

Kotowska, A M; Trindade, G F; Mendes, P M; Williams, P M; Aylott, J W; Shard, A G; Alexander, M R; Scurr, D J (2020) Protein identification by 3D OrbiSIMS to facilitate in situ imaging and depth profiling. Nature Communications, 11 (1). 5832 ISSN 2041-1723

Pei, Y; Cant, D J H; Havelund, R; Stewart, M; Mingard, K; Seah, M P; Minelli, C; Shard, A G (2020) Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles. The Journal of Physical Chemistry C, 124 (43). pp. 23752-23763. ISSN 1932-7447

Shard, A G (2020) Practical guides for x-ray photoelectron spectroscopy: Quantitative XPS. Journal of Vacuum Science & Technology A, 38 (4). 041201 ISSN 0734-2101

Tiddia, M; Seah, M P; Shard, A G; Mula, G; Havelund, R; Gilmore, I S (2020) Argon cluster cleaning of Ga + FIB‐milled sections of organic and hybrid materials. Surface and Interface Analysis, 52 (6). pp. 327-334. ISSN 0142-2421

Baer, D R; Shard, A G (2020) Role of consistent terminology in XPS reproducibility. Journal of Vacuum Science & Technology A, 38 (3). 031203 ISSN 0734-2101

Cant, D J H; Minelli, C; Sparnacci, K; Müller, A; Kalbe, H; Stöger-Pollach, M; Unger, W E S; Werner, W S M; Shard, A G (2020) Surface-Energy Control and Characterization of Nanoparticle Coatings. The Journal of Physical Chemistry C, 124 (20). pp. 11200-11211. ISSN 1932-7447

Shard, A G; Havelund, R; Seah, M P; Clifford, C A (2019) Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials. Surface and Interface Analysis, 51 (10). pp. 1018-1020. ISSN 0142-2421

Schavkan, A; Gollwitzer, C; Garcia-Diez, R; Krumrey, M; Minelli, C; Bartczak, D; Cuello-Nuñez, S; Goenaga-Infante, H; Rissler, J; Sjöström, E; Baur, G B; Vasilatou, K; Shard, A G (2019) Correction: Schavkan, A., et al. Number Concentration of Gold Nanoparticles in Suspension: SAXS and spICPMS as Traceable Methods Compared to Laboratory Methods. Nanomaterials 2019, 9, 502. Nanomaterials, 9 (8). 1060 ISSN 2079-4991

Shard, A G; Counsell, J D P; Cant, D J H; Smith, E F; Navabpour, P; Zhang, X L; Blomfield, C J (2019) Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources. Surface and Interface Analysis, 51 (7). pp. 763-773. ISSN 0142-2421

Shard, A G; Spencer, S J (2019) Intensity calibration for monochromated Al Kα XPS instruments using polyethylene. Surface and Interface Analysis, 51 (6). pp. 618-626. ISSN 0142-2421

Baer, D R; Artyushkova, K; Richard Brundle, C; Castle, J E; Engelhard, M H; Gaskell, K J; Grant, J T; Haasch, R T; Linford, M R; Powell, C J; Shard, A G; Sherwood, P M A; Smentkowski, V S (2019) Practical guides for x-ray photoelectron spectroscopy: First steps in planning, conducting, and reporting XPS measurements. Journal of Vacuum Science & Technology A, 37 (3). 031401 ISSN 0734-2101

Minelli, C; Bartczak, D; Peters, R; Rissler, J; Undas, A; Sikora, A; Sjöström, E; Goenaga-Infante, H; Shard, A G (2019) Sticky Measurement Problem: Number Concentration of Agglomerated Nanoparticles. Langmuir, 35 (14). pp. 4927-4935. ISSN 0743-7463

Gholhaki, S; Hung, S H; Cant, D J H; Blackmore, C E; Shard, A G; Guo, Q; McKenna, K P; Palmer, R E (2018) Exposure of mass-selected bimetallic Pt–Ti nanoalloys to oxygen explored using scanning transmission electron microscopy and density functional theory. RSC Advances, 8 (48). pp. 27276-27282. ISSN 2046-2069

Shard, A G; Wright, L; Minelli, C (2018) Robust and accurate measurements of gold nanoparticle concentrations using UV-visible spectrophotometry. Biointerphases, 13 (6). 061002 ISSN 1934-8630

Shard, A G; Sparnacci, K; Sikora, A; Wright, L; Bartczak, D; Goenaga-Infante, H; Minelli, C (2018) Measuring the relative concentration of particle populations using differential centrifugal sedimentation. Analytical Methods, 10 (22). pp. 2647-2657. ISSN 1759-9660

Seah, M P; Shard, A G (2018) The Matrix Effect in Secondary Ion Mass Spectrometry. Applied Surface Science, 429. pp. 605-611.

Minelli, C; Sikora, A; Garcia-Diez, R; Sparnacci, K; Gollwitzer, C; Krumrey, M; Shard, A G (2018) Measuring the size and density of nanoparticles by centrifugal sedimentation and flotation. Analytical Methods, 10 (15). pp. 1725-1732. ISSN 1759-9660

Shard, A G; Clifford, C A (2018) Summary of ISO/TC 201 standard: ISO 19668 surface chemical analysis X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials. Surface and Interface Analysis, 50 (1). pp. 87-89.

Shard, A G; Spencer, S J (2017) A simple approach to measuring thick organic films using the XPS inelastic background. Surface and Interface Analysis, 49 (12). pp. 1256-1270.

Lorenz, M; Shard, A G; Counsell, J D P*; Hutton, S*; Gilmore, I S (2016) Angular distribution of molecules sputtered by gas cluster ion beams and implications for secondary neutral mass spectrometry. J. Phys. Chem. C, 120 (44). p. 25317.

Minelli, C; Shard, A G (2016) Chemical measurements of polyethylene glycol shells on gold nanoparticles in the presence of aggregation. Biointerphases, 11 (4). 04B306

Powell, C J*; Werner, W S M*; Shard, A G; Castner, D G* (2016) Evaluation of two methods for determining shell thickness of core-shell nanoparticles by X-ray photoelectron spectroscopy. J. Phys. Chem. C, 120 (39). pp. 22730-22738.

Walton, J*; Alexander, M R*; Fairley, N*; Roach, P*; Shard, A G (2016) Film thickness measurement and contamination layer correction for quantitative XPS. Surf. Interface Anal., 48 (3). pp. 164-172.

Rafati, A*; Shard, A G; Castner, D G* (2016) Multitechnique characterization of oligo(ethylene glycol) functionalized gold nanoparticles. Biointerphases, 11 (4). 04B304

Munz, M; Bella, A; Ray, S; Bell, N C; Shard, A G; Minelli, C (2016) Peptide engineered microcantilevers for selective chemical force microscopy and monitoring of nanoparticle capture. Biointerphases, 11 (4). 04B312

Ceccone, G*; Shard, A G (2016) Preface: in focus issue on nanoparticle interface. Biointerphases, 11 (4). 04B101

Sikora, A; Shard, A G; Minelli, C (2016) Size and zeta-potential measurement of silica nanoparticles in serum using tunable resistive pulse sensing. Langmuir, 32 (9). pp. 2216-2224.

Melios, C; Spencer, S; Shard, A G; Strupinski, W*; Silva, S R P*; Kazakova, O (2016) Surface and interface structure of quasi-free standing graphene on SiC. 2D Materials, 3 (2). 025023

Belsey, N A; Cant, D J H; Minelli, C; Araujo, J R*; Bock, B*; Bruner, P*; Castner, D G*; Ceccone, G*; Counsell, J D P*; Dietrich, P M*; Engelhard, M H*; Spampinato, V*; Fearn, S*; Galhardo, C E*; Kalbe, H*; Kim, J W*; Lartundo-Rojas, L*; Luftman, H S*; Nunney, T S*; Pseiner, J*; Smith, E F*; Spampinato, V*; Sturm, J M*; Thomas, A G*; Treaty, J P W*; Veith, L*; Wagstaffe, M*; Wang, H*; Wang, M L*; Wang, Y C*; Werner, W*; Yang, L*; Shard, A G (2016) Versailles Project on Advanced Materials and Standards interlaboratory study on measuring the thickness and chemistry of nanoparticle coatings using XPS and LEIS. J. Phys. Chem. C, 120 (42). pp. 24070-24079.

Cant, D J H*; Wang, Y C*; Castner, D G*; Shard, A G (2016) A technique for calculation of shell thickness for core-shell-shell nanoparticles from XPS data. Surf. Interface Anal., 48 (5). pp. 274-282.

Bailey, J*; Havelund, R; Shard, A G; Gilmore, I S; Alexander, M R*; Sharp, J S*; Scurr, D J* (2015) 3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling. ACS Appl. Mater. Interfaces, 7 (4). pp. 2654-2659.

Belsey, N A; Shard, A G; Minelli, C (2015) Analysis of protein coatings on gold nanoparticles by XPS and liquid-based particle sizing techniques. Biointerphases, 10 (1). 019012

Seah, M P; Spencer, S J; Shard, A G (2015) Angle-dependence of argon gas cluster sputtering yields for organic materials. J. Phys. Chem. B, 119 (7). pp. 3297-3303.

Seah, M P; Spencer, S; Havelund, R; Gilmore, I S; Shard, A G (2015) Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Analyst, 140 (19). pp. 6508-6516.

Chudzicki, M*; Werner, W S M*; Shard, A G; Wang, Y C*; Castner, D G*; Powell, C J* (2015) Evaluating the internal structure of core-shell nanoparticles using X-ray photoelectron intensities and simulated spectra. J. Phys. Chem. C, 119 (31). pp. 17687-17696.

Shard, A G; Havelund, R; Spencer, S J; Gilmore, I S; Alexander, M R*; Angerer, T B*; Aoyagi, S*; Barnes, J P*; Benayad, A*; Bernasik, A*; Ceccone, G*; Counsell, J D P*; Deeks, C*; Fletcher, J S*; Graham, D J*; Heuser, C*; Lee, T G*; Marie, C*; Marzec, M M*; Mishra, G*; Rading, D*; Renault, O*; Scurr, D J*; Shon, H K*; Spampinato, V*; Tian, H*; Wang, F Y*; Winograd, N*; Wu, K*; Wucher, A*; Zhou, Y F*; Zhu, Z H* (2015) Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 119 (33). pp. 10784-10797.

Ray, S; Steven, R T*; Green, F M; Hook, F*; Taskinen, B*; Hytonen, V P*; Shard, A G (2015) Neutralised chimeric avidin binding at a reference biosensor surface. Langmuir, 31 (6). pp. 1921-1930.

Fischer, T*; Dietrich, P M*; Streeck, C*; Ray, S; Nutsch, A*; Shard, A G; Beckoff, B*; Unger, W E S*; Rurack, K* (2015) Quantification of variable functional-group densitites of mixed-silane monolayers on surfaces via a duel-mode fluorescence and XPS label. Anal. Chem., 87 (5). pp. 2685-2692.

Beer, M V*; Hahn, K*; Diederichs, S*; Fabry, M*; Singh, S*; Spencer, S J; Salber, J*; Moller, M*; Shard, A G; Groll, J* (2015) Quantifying ligand-cell interactions and determination of the surface concentrations of ligands on hydrogel films: the measurement challenge. Biointerphases, 10 (2). 021007

Seah, M P; Havelund, R; Shard, A G; Gilmore, I S (2015) Sputtering yields for mixtures of organic materials using argon gas cluster ions. J. Phys. Chem. B, 119 (42). pp. 13433-13439.

Shard, A G; Spencer, S J; Smith, S A; Havelund, R*; Gilmore, I S (2015) The matrix effect in organic secondary ion mass spectrometry. Int. J. Mass Spectrom., 377. pp. 599-609.

Minelli, C; Garcia-Diez, R*; Sikora, A E; Gollwitzer, C*; Krumrey, M*; Shard, A G (2014) Characterization of IgG-protein-coated polymeric nanoparticles using complementary particle sizing techniques. Surf. Interface Anal., 46 (10-11). pp. 663-667.

Chakraborty, B R*; Shard, A G; Dalai, M K*; Sehgal, G* (2014) Depth profiling of Irganox-3114 nanoscale delta layers in a matrix of Irganox-1010 using conventional Cs+ and O-2(+) ion beams. Surf. Interface Anal., 46 (1). pp. 36-41.

Shard, A G (2014) Detection Limits for XPS for more than 6000 binary systems using Al and Mg K X-rays. Surf. Interface Anal., 46 (3). pp. 175-185.

Holzweber, M*; Shard, A G; Jungnickel, H*; Luch, A*; Unger, W E S* (2014) Duel beam organic profiling using large argon cluster ion beams. Surf. Interface Anal., 46 (10-11). pp. 936-939.

Koos, A A*; Murdock, A T*; Nemes-Incze, P*; Nicholls, R J*; Pollard, A J; Spencer, S J; Shard, A G; Roy, D; Biro, L P*; Grobert, N* (2014) Effects of temperature and ammonia flow rate on the chemical vapour deposition growth of nitrogen-doped graphene. Phys. Chem. Chem. Phys., 16 (36). pp. 19446-19452.

Havelund, R; Seah, M P; Shard, A G; Gilmore, I S (2014) Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics. J. Am. Soc. Mass Spectrom., 25 (9). pp. 1565-1571.

Giusca, C E; Spencer, S J; Shard, A G; Yakimova, R*; Kazakova, O (2014) Exploring graphene formation on the C-terminated face of SiC by structural, chemical and electrical methods. Carbon, 69. pp. 221-229.

Wernecke, J*; Shard, A G; Krumrey, M* (2014) Traceable thickness determination of organic nanolayers by X-ray reflectometry. Surf. Interface Anal., 46 (10-11). pp. 911-914.

Seah, M P; Spencer, S J; Shard, A G (2013) Depth resolution, angle-dependence and the sputtering yield of irganox 1010 by coronene primary ions. J. Phys. Chem. B, 117 (39). pp. 1185-11892.

Bell, N C; Minelli, C; Shard, A G (2013) Quantitation of IgG protein adsorption to gold nanoparticles using particle size measurement. Anal. Methods, 5 (18). pp. 4591-4601.

Tantra, R; Shard, A G (2013) We need answers. Nature Nanotechnol., 8 (2). p. 71.

Shard, A G; Havelund, R*; Seah, M P; Spencer, S J; Gilmore, I S; Winograd, N*; Mao, D*; Miyayama, T*; Niehuis, E*; Rading, D*; Moellers, R* (2012) Argon cluster ion beams for organic depth profiling: results from a VAMAS inter-laboratory study. Anal. Chem., 84 (18). pp. 7865-7873.

Rafati, A*; Boussahel, A*; Shakesheff, K M*; Shard, A G; Roberts, C J*; Chen, X*; Scurr, D J*; Rigby-Singleton, S*; Whiteside, P*; Alexander, M R*; Davvies, M C* (2012) Chemical and spatial analysis of protein loaded PLGA microspheres for drug delivery applications. J. Control. Rel., 162 (2). pp. 321-329.

Bell, N C; Minelli, C; Tompkins, J; Stevens, M M*; Shard, A G (2012) Emerging techniques for submicrometer particle sizing applied to Stöber silica. Langmuir, 28 (29). pp. 10860-10872.

Lee, J L S; Gilmore, I S; Seah, M P; Levick, A P; Shard, A G (2012) Topography and field effects in secondary ion mass spectrometry - Part II: insulating samples. Surf. Interface Anal., 44 (2). pp. 238-245.

Shard, A G (2012) A straightforward method for interpreting XPS data from core-shell nanoparticles. J. Phys. Chem. C, 116 (31). pp. 16806-16813.

Moore, J D; Perez-Pardo, M A*; Popplewell, J F*; Spencer, S J; Ray, S; Swann, M J*; Shard, A G; Jones, W*; Hills, A*; Bracewell, D G* (2011) Chemical and biological characterisation of a sensor surface for bioprocess monitoring. Biosens. Bioelectron., 26 (6). pp. 2940-2947.

Shard, A G; Seah, M P (2011) Depth resolution and inhomogeneity of the sputtering dose with sample rotation and ion beam rastering. Surf. Interface Anal., 43 (11). pp. 1430-1435.

Tsoi, W C; Spencer, S J; Yang, L; Ballantyne, A M*; Nicholson, P G; Turnbull, A; Shard, A G; Murphy, C E; Bradley, D D C*; Nelson, J*; Kim, J S* (2011) Effect of crystallisation on the electronic energy levels and thin film morphology of P3HT:PCBM blends. Macromolecules, 44 (8). pp. 2944-2952.

Poulter, N*; Donaldson, M*; Mulley, G*; Waterfield, N*; Shard, A G; Spencer, S; Jenkins, A T A*; Johnson, A L* (2011) Plasma deposited metal Schiff-base compounds as antimicrobials. New J. Chem., 35 (7). pp. 1477-1484.

Ray, S; Shard, A G (2011) Quantitative analysis of adsorbed proteins by X-ray photoelectron spectroscopy. Anal. Chem., 83 (22). pp. 8659-8666.

Shard, A G; Foster, R*; Gilmore, I S; Lee, J L S; Ray, S; Yang, L (2011) VAMAS interlaboratory study on organic depth profiling 1: preliminary report. Surf. Interface Anal., 43 (1-2). pp. 510-513.

Shard, A G; Ray, S; Seah, M P; Yang, L (2011) VAMAS interlaboratory study on organic depth profiling. Surf. Interface Anal., 43 (9). pp. 1240-1250.

Svarnas, P*; Yang, L; Munz, M; Edwards, A J*; Shard, A G; Bradley, J W* (2010) Highly-selective wettability on organic light-emitting-diodes patterns by in-situ combining low-power plasma. J. Appl. Phys., 107 (10). 103313

Lee, J L S; Nimomiya, S*; Matsuo, J*; Gilmore, I S; Seah, M P; Shard, A G (2010) Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. Anal. Chem., 82 (1). pp. 98-105.

Yang, L; Shard, A G; Lee, J L S; Ray, S (2010) Predicting the wettability of patterned ITO surface using ToF-SIMS images. Surf. Interface Anal., 42 (6-7). pp. 911-915.

Sjövall, P*; Rading, D*; Ray, S; Yang, L; Shard, A G (2010) Sample cooling or rotation improves C60 organic depth profiles on multi-layered reference samples: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 114 (2). pp. 769-774.

Rafati, A*; Boussahel, A*; Shard, A G; Shakesheff, K M*; Whiteside, P T*; Rigby-Singleton, S*; Roberts, C J*; Chen, X*; Scurr, D J*; Alexander, M R*; Davies, M C* (2010) Scrutiny of controlled release protein loaded PLGA microspheres using surface analytical techniques. J. Pharmacy Pharm., 62 (10). pp. 1348-1349.

Dietrich, P M*; Horlacher, T*; Gross, T*; Wirth, T*; Castelli, R*; Shard, A G; Alexander, M*; Seeberger, P H*; Unger, W E S* (2010) Surface analytical characterization of carbohydrate microarrays. Surf. Interface Anal., 42 (6-7). pp. 1188-1192.

Scurr, D J*; Horlacher, T*; Oberli, M A*; Werz, D B*; Kroeck, L*; Bufali, S*; Seeberger, P H*; Shard, A G; Alexander, M R* (2010) Surface characterization of carbohydrate microarrays. Langmuir, 26 (22). pp. 17143-17155.

Green, F M; Shard, A G; Gilmore, I S; Seah, M P (2009) Analysis of the interface position in C60n+ Secondary Ions Mass Spectrommetry depth profiling. Anal. Chem., 81 (1). pp. 75-79.

Shard, A G; Rafati, A*; Ogaki, R*; Lee, J L S*; Hutton, S*; Mishra, G*; Davies, M C*; Alexander, M R* (2009) Organic depth profiling of a binary system: the compositional effect on secondary ion yield and a model for charge transfer during secondary ion emission. J. Phys. Chem. B, 113 (34). pp. 11574-11582.

van Poll, M L*; Khodabakhsh, S*; Brewer, P J; Shard, A G; Ramstedt, M*; Huck, W T S* (2009) Surface modification of PDMS via self-organization of vinyl-terminated small molecules. Soft Matter, 5 (11). pp. 2286-2293.

Shard, A G; Wang, J; Spencer, S J (2009) XPS topofactors: determining overlayer thickness on particles and fibres. Surf. Interface Anal., 41 (7). pp. 541-548.

Shard, A G; Gilmore, I S (2008) Analysis of metastable ions in the ToF-SIMS spectra of polymers. Int. J Mass Spectrom., 269. pp. 85-94.

Shard, A G; Green, F M; Gilmore, I S (2008) C-60 ion sputtering of layered organic materials. Appl. Surf. Sci., 255 (4). pp. 962-965.

Vickers, N J*; McArthur, S L*; Shard, A G; MacNeil, S* (2008) Cleric ammonium nitrate initiated grafting of PEG to plasma polymers for cell-resistant surfaces. Plasma Processes Polym., 5 (2). pp. 192-201.

Ogaki, R*; Shard, A G; Li, S M*; Vert, M*; Luk, S*; Alexander, M R*; Gilmore, I S; Davies, M C* (2008) Extracting information on the surface monomer unit distribution of PLGA by ToF-SIMS. Surf. Interface Anal., 40 (8). pp. 1168-1175.

Shard, A G; Green, F M; Brewer, P J; Seah, M P; Gilmore, I S (2008) Quantitative molecular depth profiling of organic delta-layers by C-60 ion sputtering and SIMS. J. Phys. Chem. B, 112 (9). pp. 2596-2605.

Cokeliler, D*; Erkut, S*; Shard, A G; Akdogan, E*; Ozden, N*; Imirzalioglu, P*; Mutlu, M* (2008) A novel approach for improvement of the binding of ceramics for dental materials: chemical treatment and oxygen plasma etching. J. Appl. Polym. Sci., 110 (5). pp. 2656-2664.

Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yield and damage in C60 sims depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.

Shard, A G; Brewer, P J; Green, F M; Gilmore, I S (2007) Measurement of sputtering yields and damage in C60 SIMS depth profiling of model organic materials. Surf. Interface Anal., 39. pp. 294-298.

Shard, A G (2007) Three dimensional reconstruction of organic thin films using cluster ions. Mater. World, 15 (11). pp. 32-33.

Ton-That, C*; Shard, A G; Dhanak, V R*; Shinohara, H*; Bendall, J S*; Welland, M E* (2006) Electronic structure of pristine and potassium-doped Y@C82 metallofullerene. Phys. Rev. B, 73. 205406