Walton, J*; Alexander, M R*; Fairley, N*; Roach, P*; Shard, A G (2016) Film thickness measurement and contamination layer correction for quantitative XPS. Surf. Interface Anal., 48 (3). pp. 164-172.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1002/sia.5934
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/6990

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