Chakraborty, B R*; Shard, A G; Dalai, M K*; Sehgal, G* (2014) Depth profiling of Irganox-3114 nanoscale delta layers in a matrix of Irganox-1010 using conventional Cs+ and O-2(+) ion beams. Surf. Interface Anal., 46 (1). pp. 36-41.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1002/sia.5343
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/6048

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