Shard, A G; Clifford, C A (2018) Summary of ISO/TC 201 standard: ISO 19668 surface chemical analysis X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials. Surface and Interface Analysis, 50 (1). pp. 87-89.
Full text not available from this repository.Item Type: | Article |
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Subjects: | Nanoscience > Surface and Nanoanalysis |
Divisions: | Chemical, Medical & Environmental Science |
Identification number/DOI: | 10.1002/sia.6339 |
Last Modified: | 16 Apr 2018 14:06 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/7837 |
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