Shard, A G; Havelund, R; Spencer, S J; Smith, S A (2014) VAMAS TWA 2, 2014: sub-project A3(g) static SIMS interlaboratory study: organic depth profiling of mixed materials - protocol for analysis. NPL Report. AS 88

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Abstract

This report describes the protocol for analysis in the VAMAS TWA 2, 2014 organic depth profiling study. Procedures for setting the sputter ion beams and analysis regions are provided to ensure the equivalence of data between different instruments. Reference materials are supplied for this study, comprising layers of Irganox1010, Irganox 1098 and Fmoc-pentafluoro-L-phenylalanine of known compositions and thicknesses on a silicon substrate. No sample preparation is required from the user and specific guidance is given on sample storage and handling.

Item Type:	Report/Guide (NPL Report)
NPL Report No.:	AS 88
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:13
URI:	http://eprintspublications.npl.co.uk/id/eprint/6199

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