Yang, L; Shard, A G; Lee, J L S; Ray, S (2010) Predicting the wettability of patterned ITO surface using ToF-SIMS images. Surf. Interface Anal., 42 (6-7). pp. 911-915.

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Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Last Modified:	02 Feb 2018 13:15
URI:	http://eprintspublications.npl.co.uk/id/eprint/4762

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