Shard, A G (2012) A straightforward method for interpreting XPS data from core-shell nanoparticles. J. Phys. Chem. C, 116 (31). pp. 16806-16813.

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Abstract

This paper describes a simple and direct method to calculate the shell thickness of spherical core-shell nanoparticles from X-ray photoelectron spectroscopy data. In contrast to existing methods, it is not iterative and involves a simple forward calculation which is accurate to a typical error of 4%. The method is applicable to any core-shell material pair, but the accuracy becomes worse when the kinetic energy of photoelectrons arising from the core and the shell are widely separated. Application of the method to two example systems from the literature is demonstrated: silicon oxide on silicon and carbon on gold. In both cases accuracy in shell thickness which is significantly better than an atomic diameter is demonstrated. An accurate direct equation to calculate the thickness of overlayers on planar samples is also provided.

Item Type:	Article
Subjects:	Nanoscience Nanoscience > Surface and Nanoanalysis
Identification number/DOI:	10.1021/jp305267d
Last Modified:	02 Feb 2018 13:14
URI:	http://eprintspublications.npl.co.uk/id/eprint/5618

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