Report/Guide

Burke, T*; Leach, R K; Boyd, R; Gee, M G; Roy, D; Yacoot, A; Ulrich-Danzebrink, H*; Dziomba, T*; Koenders, L*; Depero, L E*; Carneiro, K*; Dirschel, K*; Morazzani, V*; Lausmaa, J*; Pendrill, L*; Pidduck, A*; Roebben, G*; Sánchez, A*; Unger, W E S*; Proykova, A* (2011) European Nanometrology 2020. Technical Report. Co-Nanomet.

Hansen, P-E*; Roebben, G*; Babick, F*; Boyd, R; Braun, A*; Busch, I*; Danzebrink, H-U*; Depero, L*; Dirscherl, K*; Dziomba, T*; Eriksson, E*; Franks, K*; Gee, M G; Jennett, N M; Kestens, V*; Koenders, L*; Krumrey, M*; Lausmaa, J*; Leach, R K; Pendrill, L*; Pidduck, A*; Put, S*; Roy, D; Stintz, M*; Turan, R*; Yacoot, A (2010) Introductory guide to nanometrology. Technical Report. European Commission.

Yacoot, A; Leach, R K (2007) Review of x-ray and optical thin film measurement methods and transfer artefacts. NPL Report. DEPC-EM 013

Article

Malcher, F; Ford, B; Barham, R; Robinson, S; Ward, J; Wang, L; Bridges, A; Yacoot, A; Cheong, S H; Rodrigues, D; Barrera-Figueroa, S (2024) A calculable pistonphone for the absolute calibration of hydrophones in the frequency range from 0.5 Hz to 250 Hz. Metrologia, 61 (2). 025011

Yacoot, A (2024) Measurement Science and Technology’s second century underway. Measurement Science and Technology, 31 (1). 010201

Necas, D; Yacoot, A; Valtr, M; Klapetek, P (2023) Demystifying data evaluation in the measurement of periodic structures. Measurement Science and Technology, 34 (5). 055015

Lewis, A J; Yacoot, A (2023) Editorial for the Metrologia Focus Issue on Length Metrology. Metrologia, 60 (1). 010301

Yacoot, A (2022) 1923–2022: Measurement Science and Technology completes a century of publishing. Measurement Science and Technology, 33 (12). 120201

Lewis, A J; Yacoot, A; Milton, M J T; Lancaster, A J (2022) A digital framework for realising the SI – a proposal for the metre. Metrologia, 59 (4). 044004

Bridges, A; Yacoot, A; Kissinger, T; Tatam, R P (2022) Multiple intensity reference interferometry for the correction of sub-fringe displacement non-linearities. Measurement Science and Technology, 33 (2). 025201

Bridges, A; Yacoot, A; Kissinger, T; Humphreys, D A; Tatam, R P (2021) Correction of periodic displacement non-linearities by two-wavelength interferometry. Measurement Science and Technology, 32 (12). 125202

Discetti, S; Peters, K; Yacoot, A (2021) Announcing the 2020 Measurement Science and Technology outstanding paper awards. Measurement Science and Technology, 32 (11). 110101

Sun, X Z; Heaps, E; Yacoot, A; Yang, Q P; Grolich, P; Klapetek, P (2021) Three-dimensional drift correction of scan data from atomic force microscopy using Lissajous scanning paths. Measurement Science and Technology, 32 (11). 115010

Schodel, R; Yacoot, A; Lewis, A (2021) The new mise en pratique for the metre-a review of approaches for the practical realization of traceable length metrology from 10(-11) m to 10(13) m. Metrologia, 58 (5). 052002

Babij, M; Majstrzyk, W; Sierakowski, A; Janus, P; Grabiec, P; Ramotowski, Z; Yacoot, A; Gotszalk, T (2021) MEMS displacement generator for atomic force microscopy metrology. Measurement Science and Technology, 32 (6). 065903 ISSN 0957-0233

Garnæs, J; Nečas, D; Nielsen, L; H Madsen, M; Torras-Rosell, A; Zeng, G; Klapetek, P; Yacoot, A (2020) Algorithms for using silicon steps for scanning probe microscope evaluation. Metrologia, 57 (6). 064002 ISSN 0026-1394

Yacoot, A; Bosse, H; Dixson, R (2020) The lattice parameter of silicon: a secondary realisation of the metre. Measurement Science and Technology, 31 (12). 121001 ISSN 0957-0233

Klapetek, P; Yacoot, A; Hortvík, V; Duchoň, V; Dongmo, H; Řeřucha, Š; Valtr, M; Nečas, D (2020) Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. Measurement Science and Technology, 31 (9). 094001 ISSN 0957-0233

Bridges, A; Yacoot, A; Kissinger, T; Tatam, R P (2020) Polarization-sensitive transfer matrix modeling for displacement measuring interferometry. Applied Optics, 59 (25). 7694 ISSN 1559-128X

Heaps, E; Yacoot, A; Dongmo, H; Picco, L; Payton, O D; Russell-Pavier, F; Klapetek, P (2020) Bringing real-time traceability to high-speed atomic force microscopy. Measurement Science and Technology, 31 (7). 074005 ISSN 0957-0233

Yacoot, A; Klapetek, P; Valtr, M; Grolich, P; Dongmo, H; Lazzerini, M G; Bridges, A (2019) Design and performance of a test rig for evaluation of nanopositioning stages. Measurement Science and Technology, 30 (3). 035002 ISSN 0957-0233

Russell-Pavier, F S; Picco, L; Day, J C C; Shatil, N R; Yacoot, A; Payton, O D (2018) ‘Hi-Fi AFM’: high-speed contact mode atomic force microscopy with optical pickups. Measurement Science and Technology, 29 (10). 105902 ISSN 0957-0233

Corbett, A D; Shaw, M; Yacoot, A; Jefferson, A; Schermelleh, L; Wilson, T; Booth, M; Salter, P S (2018) Microscope calibration using laser written fluorescence. Optics Express, 26 (17). pp. 21887-21899. ISSN 1094-4087

Mikheikin, A; Olsen, A; Leslie, K; Russell-Pavier, F; Yacoot, A; Picco, L; Payton, O; Toor, A; Chesney, A; Gimzewski, J K; Mishra, B; Reed, J (2017) DNA nanomapping using CRISPR-Cas9 as a programmable nanoparticle. Nature Communications, 8. 1665

Fiala, P; Gohler, D; Wessely, B; Stintz, M; Lazzerini, G M; Yacoot, A (2017) Evaluation of preparation methods for suspended nano objects on substrates for dimensional measurements by atomic force microscopy. Beilstein Journal of Nanotechnology, 8. pp. 1774-1785.

Li, Z; Brand, U; Wolff, H; Koenders, L; Yacoot, A; Puranto, P (2017) Broadband interferometric characterisation of nano-positioning stages with sub-10 pm resolution. Proceedings of SPIE, 10329. 1032944

Klapetek, P*; Yacoot, A; Grolich, P*; Valtr, M*; Necas, D* (2017) Gwyscan: a library to support non-equidistant scanning probe microscope measurements. Meas. Sci. Technol., 28 (3). 034015

Rerucha, S*; Yacoot, A; Pham, T M*; Cizek, M*; Hucl, V*; Lazar, J*; Cip, O* (2017) Laser source for dimensional metrology: investigation of an iodine stabilized system based on narrow linewidth 633 nm DBR diode. Meas. Sci. Technol., 28 (4). 045204

Lazzerini, G M; Paterno, G M*; Tregnago, G*; Treat, N*; Stingelin, N*; Yacoot, A; Cacialli, F* (2016) Traceable atomic force microscopy of high-quality solvent-free crystals of [6,6]-phenyl-C 61-butyric acid methyl ester. Appl. Phys. Lett., 108 (5). 053303

Godden, T M*; Muniz-Piniella, A; Claverley, J D; Yacoot, A; Humphry, M J* (2016) A phase calibration target for quantitative phase imaging with ptychography. Opt. Express, 24 (7). pp. 7679-7692.

Foss, J*; Peters, K*; Yacoot, A; Jakoby, B*; McGrath, J* (2015) Announcing the 2014 Mesurement Science and Technology outstanding paper awards. Meas. Sci. Technol., 26 (7). 070202

Klapetek, P*; Valtr, M*; Picco, L*; Payton, O D*; Martinek, J*; Yacoot, A; Miles, M* (2015) Large area high-speed metrology SPM system. Nanotechnology, 26 (6). 065501

Foss, J*; Dewhurst, R*; Yacoot, A; Regtien, P*; Peters, K* (2013) Announcing the 2012 Measurement Science and Technology outstanding paper award. Meas. Sci. Technol., 24 (7). 070101

Klapetek, P*; Picco, L*; Payton, O*; Yacoot, A; Miles, M* (2013) Error mapping of high-speed AFM systems. Meas. Sci. Technol., 24 (2). 025006

Leach, R K; Claverley, J D; Giusca, C; Jones, C W; Nimishakavi, L P; Sun, W; Tedaldi, M; Yacoot, A (2012) Advances in engineering nanometrology at the National Physical Laboratory. Meas. Sci. Technol., 23 (7). 074002

Pisani, M*; Yacoot, A; Balling, P*; Bancone, N*; Birlikseven, C*; Celik, M*; Flügge, J*; Hamid, R*; Köchert, P*; Kren, P*; Kuetgens, U*; Lassila, A*; Picotto, G B*; Sahin, E*; Seppa, J*; Tedaldi, M; Weichert, C* (2012) Comparison of the performance of the next generation of optical interferometers. Metrologia, 49 (4). pp. 455-467.

Celik, M*; Hamid, R*; Kuetgens, U*; Yacoot, A (2012) Picometre displacements measurements using a differential Fabry-Perot optical Interferometer and an x-ray interferometer. Meas. Sci. Technol., 23 (8). 085901

Yacoot, A; Kuetgens, U* (2012) Sub-atomic dimensional metrology: developments in the control of x-ray interferometers. Meas. Sci. Technol., 23 (7). 074003

Weichert, C*; Köchert, P*; Köning, R*; Flügge, J*; Andreas, B*; Kuetgens, U*; Yacoot, A (2012) A heterodyne interferometer with nonlinearities smaller than ±10 pm. Meas. Sci. Technol., 23 (9). 094005

Leach, R K; Boyd, R; Burke, T*; Danzebrink, H-U*; Dirscherl, K*; Dziomba, T*; Gee, M G; Koenders, L*; Morazzani, V*; Pidduck, A*; Roy, D; Unger, W E S*; Yacoot, A (2011) The European nanometrology landscape. Nanotechnology, 22. 062001

Klapetek, P*; Nacas, D*; Campbellova, A*; Yacoot, A; Koenders, L* (2011) Methods for determining and processing 3D errors and uncertainties for AFM data analysis. Meas. Sci. Technol., 22 (2). 025501

Yacoot, A; Koenders, L* (2011) Recent developments in dimensional metrology using AFMs. Meas. Sci. Technol., 22 (12). 122001

Yacoot, A; Leach, R K; Hughes, B; Giusca, C; Jones, C W; Wilson, A (2009) Dimensional nanometrology at The National Physical Laboratory. Proc. SPIE - Int. Soc. Opt. Eng., 7133. pp. 713345-1.

Yacoot, A; Koenders, L* (2008) Aspects of scanning force microscope (SFM) cantilevers and tips and their effects on dimensional measurement. J. Phys. D, Appl. Phys., 41 (10). 103001

Bakucz, P*; Yacoot, A; Dziomba, T*; Krüger-Sehm, R* (2008) Neural network approximation of tip-abrasion effects in AFM-imaging. Meas. Sci. Technol., 19 (6). 065101

Smith, R J*; See, C W*; Somekh, M G*; Yacoot, A (2007) Use of artificial neural networks on optical track width measurements. Appl. Opt., 46 (22). pp. 4857-4866.

Yacoot, A; Downes, M*; Flügge, J* (2005) Interferometric length measurement. MAPAN, J. Metrol. Soc. India, 20 (2). pp. 99-114.

Yacoot, A; Koenders, L* (2003) From nanometre to millimetre: a feasibility study of the combination of scanning probe microscopy and combined optical and X-ray interferometry. Meas. Sci. Technol., 14 (9). N59-N63

Yacoot, A; Cross, N R (2003) Measurement of picometre non-linearity in an optical grating encoder using x-ray interferometry. Meas. Sci. Technol., 14. pp. 148-152.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2002) Nanoscience advances in the UK in support of nanotechnology. International Journal of Nanoscience, 1 (2). pp. 123-138.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. pp. R1-R6.

Yacoot, A; Kuetgens, U*; Koenders, L*; Weimann, T* (2001) A combined scanning tunnelling microscope and x-ray interferometer. Meas. Sci. Technol., 12. pp. 1660-1665.

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (2000) Combined optical and x-ray interferometry for high precision dimensional metrology. Proc. R. Soc. Lond. A, 456. pp. 701-729.

Franks, A; Jackson, K; Yacoot, A (2000) A parabolic mirror x-ray collimator. Meas. Sci. Technol., 11. pp. 484-488.

Yacoot, A; Downs, M J (2000) The use of x-ray interferometry to investigate the linearity of the NPL differential plane mirror optical interferometer. Meas. Sci. Technol., 11. pp. 1126-1130.

Conference or Workshop Item

Bartlett, G; Heaps, E; Clarke, J; Frost, S; Patel, J; Levy, S; Raby, A; Yacoot, A (2021) Demonstration of closed loop velocity control for fast imaging techniques using high-speed AFM. In: euspen's 21st International Conference & Exhibition, 7-18 June 2021, Copenhagen, Denmark.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2002) From nanoscience to nanotechnology. In: International Seminar "Challenges for Precision Engineering and Nanotechnologies", 7-8 February 2002, Huddersfield, UK.

Leach, R K; Blunt, L*; Chetwynd, D G*; Yacoot, A (2001) The need for a metrology infrastructure to support nanotechnology. In: Proceedings of the 5th International Symposium on Measurement Technology and Intelligent Instruments (ISMTII), 25-29 September 2001, Cairo, Egypt.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (1993) COXI - Combined optical and x-ray interferometry for high precision dimensional metrology. In: 7th International Precision Engineering Seminar, May 1993, Kobe, Japan.

Book Chapter/Section

Yacoot, A (2005) Metrological applications of X-ray interferometry. In: Nanscale calibration standards and methods: dimensional and related measurements in the micro- and nanometer range. Wiley-VCH. ISBN 352740502X