Trindade, G; Sul, S; Kim, J; Havelund, R; Eyres, A; Park, S; Shin, Y; Bae, H J; Sung, Y M; Matjacic, L; Jung, Y; Won, J; Jeon, W S; Choi, H; Lee, H S; Lee, J-C; Kim, J-H; Gilmore, I S (2023) Direct identification of interfacial degradation in blue OLEDs using nanoscale chemical depth profiling. Nature Communications, 14. 8066

Matjacic, L; Seah, M P; Trindade, G F; Pirkl, A; Havelund, R; Vorng, J L; Niehuis, E; Gilmore, I S (2022) OrbiSIMS metrology Part I: Optimisation of the target potential and collision cell pressure. Surface and Interface Analysis, 54 (4). pp. 331-340.

Robinson, E; Giffen, P; Hassall, D; Ball, D; Reid, H; Coe, D; Teague, S; Terry, R; Earl, M; Marchand, J; Farrer, B; Havelund, R; Gilmore, I S; Marshall, P S (2021) Multimodal imaging of drug and excipients in rat lungs following an inhaled administration of controlled-release drug laden PLGA microparticles. The Analyst, 146 (10). pp. 3378-3390. ISSN 0003-2654

Shard, A G; Miisho, A; Vorng, J L; Havelund, R; Gilmore, I S; Aoyagi, S (2021) A two-point calibration method for quantifying organic binary mixtures using secondary ion mass spectrometry in the presence of matrix effects. Surface and Interface Analysis, 54 (4). pp. 363-373.

Pei, Y; Cant, D J H; Havelund, R; Stewart, M; Mingard, K; Seah, M P; Minelli, C; Shard, A G (2020) Argon Cluster Sputtering Reveals Internal Chemical Distribution in Submicron Polymeric Particles. The Journal of Physical Chemistry C, 124 (43). pp. 23752-23763. ISSN 1932-7447

Race, A M; Rae, A; Vorng, J-L; Havelund, R; Dexter, A; Kumar, N; Steven, R T; Passarelli, M K; Tyler, B J; Bunch, J; Gilmore, I S (2020) Correlative Hyperspectral Imaging Using a Dimensionality-Reduction-Based Image Fusion Method. Analytical Chemistry, 92 (16). pp. 10979-10988. ISSN 0003-2700

Tiddia, M; Seah, M P; Shard, A G; Mula, G; Havelund, R; Gilmore, I S (2020) Argon cluster cleaning of Ga + FIB‐milled sections of organic and hybrid materials. Surface and Interface Analysis, 52 (6). pp. 327-334. ISSN 0142-2421

Shard, A G; Havelund, R; Seah, M P; Clifford, C A (2019) Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials. Surface and Interface Analysis, 51 (10). pp. 1018-1020. ISSN 0142-2421

Havelund, R; Seah, M P; Gilmore, I S (2019) SIMS of organic layers with unknown matrix parameters: Locating the interface in dual beam argon gas cluster depth profiles. Surface and Interface Analysis, 51 (13). pp. 1332-1341. ISSN 0142-2421

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S (2019) Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions. Journal of The American Society for Mass Spectrometry, 30 (2). pp. 309-320. ISSN 1044-0305

Tiddia, M; Mihara, I; Seah, M P; Trindade, G F; Kollmer, F; Roberts, C J; Hague, R; Mula, G; Gilmore, I S; Havelund, R (2019) Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 11 (4). pp. 4500-4506. ISSN 1944-8244

Bunch, J; Steven, R; Taylor, A J; Thomas, S A; Race, A; Dexter, A; Hamm, G; Strittmatter, N; Havelund, R; Soares, R F; Campbell, A D; Sansom, O J; Goodwin, R J; Takats, Z (2018) Abstract 5661: A multi modal mass spectrometry imaging strategy to profile the metabolic hallmarks of colorectal cancer. Cancer Research, 78 (13). p. 5661.

Conard, T; Fleischmann, C; Havelund, R; Franquet, A; Poleunis, C; Delcorte, A; Vandervorst, W (2018) Inorganic material profiling using Ar-n(+) cluster: can we achieve high quality profiles? Applied Surface Science, 444. pp. 633-641.

Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.

Passarelli, M K; Pirkl, A; Moellers, R; Grinfeld, D; Kollmer, F; Havelund, R; Newman, C F; Marshall, P S; Arlinghaus, H; Alexander, M R; West, A; Horning, S; Niehuis, E; Makarov, A; Dollery, C T; Gilmore, I S (2017) The 3D OrbiSIMS—label-free metabolic imaging with subcellular lateral resolution and high mass-resolving power. Nature Methods, 14 (12). pp. 1175-1183. ISSN 1548-7091

Newman, C F; Havelund, R; Passarelli, M K; Marshall, P S; Francis, I; West, A; Alexander, M R; Gilmore, I S; Dollery, C T (2017) Intracellular Drug Uptake—A Comparison of Single Cell Measurements Using ToF-SIMS Imaging and Quantification from Cell Populations with LC/MS/MS. Analytical Chemistry, 89 (22). pp. 11944-11953. ISSN 0003-2700

Mihara, I; Havelund, R; Gilmore, I S (2017) Embedding-free method for preparation of cross-sections of organic materials for micro chemical analysis using gas cluster ion beam sputtering. Anal. Chem., 89 (9). pp. 4781-4785.

Rakowska, P D; Seah, M P; Vorng, J L; Havelund, R; Gilmore, I S (2016) Determination of the sputtering yield of cholesterol using Ar-n(+) and C-60(+(+)) cluster ions. Analyst, 141 (16). pp. 4893-4901.

Yokoyama, Y*; Aoyagi, S*; Fujii, M*; Matsuo, J*; Fletcher, J S*; Lockyer, N P*; Vickerman, J C*; Passarelli, M K; Havelund, R; Seah, M P (2016) Peptide fragmentation and surface structural analysis by means of ToF-SIMS using large cluster ion sources. Anal. Chem., 88 (7). pp. 3592-3597.

Seah, M P; Havelund, R; Gilmore, I S (2016) SIMS of delta layers in organic materials: amount of substance, secondary ion species, matrix effects and anomalous structures in argon gas cluster depth profiles. J. Phys. Chem. C, 120 (46). pp. 26328-26335.

Havelund, R; Seah, M P; Gilmore, I S (2016) Sampling depths, depth shifts and depth resolutions for Bi-n(+) ion analysis in argon gas cluster depth profiles. J. Phys. Chem. B, 120 (9). pp. 2604-2611.

Vorng, J L; Kotowska, A M; Passarelli, M K; West, A*; Marshall, P S*; Havelund, R; Seah, M P; Dollery, C T*; Rakowska, P D; Gilmore, I S (2016) Semiempirical rules to determine drug sensitivity and ionization efficiency in secondary ion mass spectrometry using a model tissue sample. Anal. Chem., 88 (22). pp. 11028-11036.

Seah, M P; Havelund, R; Gilmore, I S (2016) Systematic temperature effects in the argon cluster ion sputter depth profiling of organic materials using secondary ion mass spectrometry. J. Am. Soc. Mass Spectrom., 27 (8). pp. 1411-1418.

Surana, S*; Conard, T*; Fleischmann, C*; Tait, J G*; Bastos, J P*; Voroshazi, E*; Havelund, R; Turbiez, M*; Louette, P*; Felten, A*; Poleunis, C*; Delcorte, A*; Vandervorst, W* (2016) Understanding physico-chemical aspects in the depth profiling of polymer: fullerene layers. J. Phys. Chem. C, 120 (49). pp. 28074-28082.

Bailey, J*; Havelund, R; Shard, A G; Gilmore, I S; Alexander, M R*; Sharp, J S*; Scurr, D J* (2015) 3D ToF-SIMS imaging pf polymer multi layer films using argon cluster sputter depth profiling. ACS Appl. Mater. Interfaces, 7 (4). pp. 2654-2659.

Seah, M P; Spencer, S; Havelund, R; Gilmore, I S; Shard, A G (2015) Depth resolution at organic interfaces sputtered by argon gas cluster ions: the effect of energy, angle and cluster size. Analyst, 140 (19). pp. 6508-6516.

Shard, A G; Havelund, R; Spencer, S J; Gilmore, I S; Alexander, M R*; Angerer, T B*; Aoyagi, S*; Barnes, J P*; Benayad, A*; Bernasik, A*; Ceccone, G*; Counsell, J D P*; Deeks, C*; Fletcher, J S*; Graham, D J*; Heuser, C*; Lee, T G*; Marie, C*; Marzec, M M*; Mishra, G*; Rading, D*; Renault, O*; Scurr, D J*; Shon, H K*; Spampinato, V*; Tian, H*; Wang, F Y*; Winograd, N*; Wu, K*; Wucher, A*; Zhou, Y F*; Zhu, Z H* (2015) Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 119 (33). pp. 10784-10797.

Seah, M P; Havelund, R; Shard, A G; Gilmore, I S (2015) Sputtering yields for mixtures of organic materials using argon gas cluster ions. J. Phys. Chem. B, 119 (42). pp. 13433-13439.

Shard, A G; Havelund, R; Spencer, S J; Smith, S A (2014) VAMAS TWA 2, 2014: sub-project A3(g) static SIMS interlaboratory study: organic depth profiling of mixed materials - protocol for analysis. NPL Report. AS 88

Havelund, R; Seah, M P; Shard, A G; Gilmore, I S (2014) Electron flood gun damage effects in 3D secondary ion mass spectrometry imaging of organics. J. Am. Soc. Mass Spectrom., 25 (9). pp. 1565-1571.

Fleischmann, C*; Conard, T*; Havelund, R; Franquet, A*; Poleunis, C*; Voroshazi, E*; Delcorte, A*; Vandervorst, W* (2014) Fundamental aspects of Ar-n(+) SIMS profiling of common organic semiconductors. Surf. Interface Anal., 46. pp. 54-57.

Franquet, A*; Fleischmann, C*; Conrad, T*; Voroshazi, E*; Poleunis, C*; Havelund, R; Delcorte, A*; Vandervorst, W* (2014) G-SIMS analysis of organic solar cell materials. Surf. Interface Anal., 46. pp. 96-99.

Seah, M P; Havelund, R; Gilmore, I S (2014) Universal equation for argon cluster size-dependence of secondary ion spectra in SIMS of organic materials. J. Phys. Chem. C, 118 (24). pp. 12862-12872.

Havelund, R; Licciardello, A*; Bailey, J*; Tuccitto, N*; Sapuppo, D*; Gilmore, I S; Sharp, J S*; Lee, J L S; Mouhib, T*; Delcorte, A* (2013) Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing. Anal. Chem., 85 (10). pp. 5064-5070.