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Inorganic material profiling using Ar-n(+) cluster: can we achieve high quality profiles?

Conard, T; Fleischmann, C; Havelund, R; Franquet, A; Poleunis, C; Delcorte, A; Vandervorst, W (2018) Inorganic material profiling using Ar-n(+) cluster: can we achieve high quality profiles? Applied Surface Science, 444. pp. 633-641.

Full text not available from this repository.
Item Type: Article
Subjects: Nanoscience > Surface and Nanoanalysis
Divisions: Chemical, Medical & Environmental Science
Identification number/DOI: 10.1016/j.apsusc.2018.02.159
Last Modified: 14 Jun 2018 13:02
URI: http://eprintspublications.npl.co.uk/id/eprint/7938

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