Report/Guide

Reed, B P; Spencer, S J; Shard, A G (2019) VAMAS TWA 2, 2019, sub-project A27:" intensity calibration for XPS instruments using low-density poly(ethylene)": protocol for analysis. NPL Report. AS 100

Shard, A G; Havelund, R; Spencer, S J; Smith, S A (2014) VAMAS TWA 2, 2014: sub-project A3(g) static SIMS interlaboratory study: organic depth profiling of mixed materials - protocol for analysis. NPL Report. AS 88

Tantra, R; Cackett, A; Wain, A J; Minelli, C; Gohil, D D; Tompkins, J; Lee, J L S; Wang, J; Yang, L; Quincey, P; Shaw, R M; Spencer, S J; Fry, A T (2010) Interim report on the physico-chemical characterisation of PROSPEcT Nanomaterials. NPL Report. AS 53

Seah, M P; Gilmore, I S; Spencer, S J (1997) XPS: Binding energy calibration of electron spectrometers 4 - an assessment of effects for different x-ray sources, analyser resolutions and angles of emission and of the overall uncertainties. NPL Report. CMMT(A)57

Article

Taylor, M; Simoes, F; Smith, J; Genapathy, S; Canning, A; Lledos, M; Chan, W C; Denning, C; Scurr, D J; Steven, R T; Spencer, S J; Shard, A G; Alexander, M R; Zelzer, M (2022) Quantifiable correlation of ToF-SIMS and XPS data from polymer surfaces with controlled amino acid and peptide content. Surface and Interface Analysis, 54 (4). pp. 417-432.

Reed, B P; Cant, D J H; Spencer, S J; Carmona-Carmona, A J; Bushell, A; Herrera-Gómez, A; Kurokawa, A; Thissen, A; Thomas, A G; Britton, A J; Bernasik, A; Fuchs, A; Baddorf, A P; Bock, B; Theilacker, B; Cheng, B; Castner, D G; Morgan, D J; Valley, D; Willneff, E A; Smith, E F; Nolot, E; Xie, F; Zorn, G; Smith, G C; Yasufuku, H; Fenton, J L; Chen, J; Counsell, J D P; Radnik, J; Gaskell, K J; Artyushkova, K; Yang, L; Zhang, L; Eguchi, M; Walker, M; Hajdyła, M; Marzec, M M; Linford, M R; Kubota, N; Cortazar-Martínez, O; Dietrich, P; Satoh, R; Schroeder, S L M; Avval, T G; Nagatomi, T; Fernandez, V; Lake, W; Azuma, Y; Yoshikawa, Y; Compean-Gonzalez, C L; Ceccone, G; Shard, A G (2021) ERRATUM: “Versailles project on advanced materials and standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene” [J. Vac. Sci. Technol. A 38, 063208 (2020)]. Journal of Vacuum Science & Technology A, 39 (2). 027001 ISSN 0734-2101

Reed, B P; Cant, D J H; Spencer, S J; Carmona-Carmona, A J; Bushell, A; Herrera-Gómez, A; Kurokawa, A; Thissen, A; Thomas, A G; Britton, A J; Bernasik, A; Fuchs, A; Baddorf, A P; Bock, B; Theilacker, B; Cheng, B; Castner, D G; Morgan, D J; Valley, D; Willneff, E A; Smith, E F; Nolot, E; Xie, F; Zorn, G; Smith, G C; Yasufuku, H; Fenton, J L; Chen, J; Counsell, J D P; Radnik, J; Gaskell, K J; Artyushkova, K; Yang, L; Zhang, L; Eguchi, M; Walker, M; Hajdyła, M; Marzec, M M; Linford, M R; Kubota, N; Cortazar-Martínez, O; Dietrich, P; Satoh, R; Schroeder, S L M; Avval, T G; Nagatomi, T; Fernandez, V; Lake, W; Azuma, Y; Yoshikawa, Y; Shard, A G (2020) Versailles Project on Advanced Materials and Standards interlaboratory study on intensity calibration for x-ray photoelectron spectroscopy instruments using low-density polyethylene. Journal of Vacuum Science & Technology A, 38 (6). 063208 ISSN 0734-2101

Shard, A G; Spencer, S J (2019) Intensity calibration for monochromated Al Kα XPS instruments using polyethylene. Surface and Interface Analysis, 51 (6). pp. 618-626. ISSN 0142-2421

Seah, M P; Havelund, R; Spencer, S J; Gilmore, I S (2019) Quantifying SIMS of Organic Mixtures and Depth Profiles—Characterizing Matrix Effects of Fragment Ions. Journal of The American Society for Mass Spectrometry, 30 (2). pp. 309-320. ISSN 1044-0305

Shard, A G; Spencer, S J (2017) A simple approach to measuring thick organic films using the XPS inelastic background. Surface and Interface Analysis, 49 (12). pp. 1256-1270.

Sainsbury, T; Gnaniah, S; Spencer, S J; Mignuzzi, S; Belsey, N A; Paton, K R; Satti, A* (2017) Extreme mechanical reinforcement in graphene oxide based thin-film nanocomposites via covalently tailored nanofiller matrix compatibilization. Carbon, 114. pp. 367-376.

Sainsbury, T; Passarelli, M; Naftaly, M; Gnaniah, S J P; Spencer, S J; Pollard, A J (2016) Covalent carbene functionalization of graphene: towards chemical band gap manipulation. ACS Appl. Mater. Interfaces, 8 (7). pp. 4870-4877.

Kumar, N; Spencer, S J; Imbraguglio, D*; Rossi, A M*; Wain, A J; Weckhuysen, B M*; Roy, D (2016) Extending the plasmonic lifetime of tip-enhanced Raman spectroscopy probes. Phys. Chem. Chem. Phys., 18 (19). pp. 13710-13716.

Seah, M P; Spencer, S J; Shard, A G (2015) Angle-dependence of argon gas cluster sputtering yields for organic materials. J. Phys. Chem. B, 119 (7). pp. 3297-3303.

Shard, A G; Havelund, R; Spencer, S J; Gilmore, I S; Alexander, M R*; Angerer, T B*; Aoyagi, S*; Barnes, J P*; Benayad, A*; Bernasik, A*; Ceccone, G*; Counsell, J D P*; Deeks, C*; Fletcher, J S*; Graham, D J*; Heuser, C*; Lee, T G*; Marie, C*; Marzec, M M*; Mishra, G*; Rading, D*; Renault, O*; Scurr, D J*; Shon, H K*; Spampinato, V*; Tian, H*; Wang, F Y*; Winograd, N*; Wu, K*; Wucher, A*; Zhou, Y F*; Zhu, Z H* (2015) Measuring compositions in organic depth profiling: results from a VAMAS interlaboratory study. J. Phys. Chem. B, 119 (33). pp. 10784-10797.

Kim, J S*; Wood, S; Shoaee, S*; Spencer, S J; Castro, F A; Tsoi, W C*; Murphy, C E; Sim, M*; Cho, K*; Durrant, J R*; Kim, J S* (2015) Morphology-performance relationships in polymer/fullerene blends probed by complementary characterisation techniques - effects of nanowire formation and subsequent thermal annealing. J. Mater. Chem. C, 3 (35). pp. 9224-9232.

Caneva, S*; Weatherup, R S*; Bayer, B C*; Brennan, B*; Spencer, S J; Mingard, K P; Cabrero-Vilatela, A*; Baehtz, C*; Pollard, A J (2015) Nucleation control for large, single crystalline domains of monolayer hexagonal boron nitride via Si-doped Fe catalysts. Nano Lett., 15 (3). pp. 1867-1875.

Beer, M V*; Hahn, K*; Diederichs, S*; Fabry, M*; Singh, S*; Spencer, S J; Salber, J*; Moller, M*; Shard, A G; Groll, J* (2015) Quantifying ligand-cell interactions and determination of the surface concentrations of ligands on hydrogel films: the measurement challenge. Biointerphases, 10 (2). 021007

Su, W; Kumar, N; Spencer, S J; Dai, N*; Roy, D (2015) Transforming bilayer MoS2 into single-layer with strong photoluminescence using UV-ozone oxidation. Nano Res., 8 (12). pp. 3878-3886.

Shard, A G; Spencer, S J; Smith, S A; Havelund, R*; Gilmore, I S (2015) The matrix effect in organic secondary ion mass spectrometry. Int. J. Mass Spectrom., 377. pp. 599-609.

Sainsbury, T; O'Neill, A*; Passarelli, M K; Seraffon, M; Gohil, D D; Gnaniah, S J P; Spencer, S J; Rae, A; Coleman, J N* (2014) Dibromocarbene functionalization of boron nitride nanosheets: toward band gap manipulations and nanocomposite applications. Chem. Mater., 26 (24). pp. 7039-7050.

Koos, A A*; Murdock, A T*; Nemes-Incze, P*; Nicholls, R J*; Pollard, A J; Spencer, S J; Shard, A G; Roy, D; Biro, L P*; Grobert, N* (2014) Effects of temperature and ammonia flow rate on the chemical vapour deposition growth of nitrogen-doped graphene. Phys. Chem. Chem. Phys., 16 (36). pp. 19446-19452.

Giusca, C E; Spencer, S J; Shard, A G; Yakimova, R*; Kazakova, O (2014) Exploring graphene formation on the C-terminated face of SiC by structural, chemical and electrical methods. Carbon, 69. pp. 221-229.

Seah, M P; Spencer, S J; Shard, A G (2013) Depth resolution, angle-dependence and the sputtering yield of irganox 1010 by coronene primary ions. J. Phys. Chem. B, 117 (39). pp. 1185-11892.

Shard, A G; Havelund, R*; Seah, M P; Spencer, S J; Gilmore, I S; Winograd, N*; Mao, D*; Miyayama, T*; Niehuis, E*; Rading, D*; Moellers, R* (2012) Argon cluster ion beams for organic depth profiling: results from a VAMAS inter-laboratory study. Anal. Chem., 84 (18). pp. 7865-7873.

Green, F M; Seah, M P; Gilmore, I S; Salter, T L; Spencer, S J (2011) Analysis of thin films and molecular orientation using cluster SIMS. Surf. Interface Anal., 43 (9). pp. 1224-1230.

Seah, M P; Spencer, S J (2011) Attenuation lengths in organic materials. Surf. Interface Anal., 43 (3). pp. 744-751.

Moore, J D; Perez-Pardo, M A*; Popplewell, J F*; Spencer, S J; Ray, S; Swann, M J*; Shard, A G; Jones, W*; Hills, A*; Bracewell, D G* (2011) Chemical and biological characterisation of a sensor surface for bioprocess monitoring. Biosens. Bioelectron., 26 (6). pp. 2940-2947.

Tsoi, W C; Spencer, S J; Yang, L; Ballantyne, A M*; Nicholson, P G; Turnbull, A; Shard, A G; Murphy, C E; Bradley, D D C*; Nelson, J*; Kim, J S* (2011) Effect of crystallisation on the electronic energy levels and thin film morphology of P3HT:PCBM blends. Macromolecules, 44 (8). pp. 2944-2952.

Seah, M P; Spencer, S J (2011) Energy dependence of the electron attenuation length in silicon dioxide. Meas. Sci. Technol., 22 (11). 115602

Green, F M; Gilmore, I S; Lee, J L S; Spencer, S J; Seah, M P (2010) Static SIMS - VAMAS interlaboratory study for intensity repeatability, mass scale accuracy and relative quantification. Surf. Interface Anal., 42 (3). pp. 129-138.

Seah, M P; Spencer, S J (2009) Angular accuracy and the comparison of two methods for determining the surface normal in a Kratos Axis Ultra X-ray photoelectron spectrometer. Surf. Interface Anal., 41 (12-13). pp. 960-965.

Shard, A G; Wang, J; Spencer, S J (2009) XPS topofactors: determining overlayer thickness on particles and fibres. Surf. Interface Anal., 41 (7). pp. 541-548.

Gilham, R J J; Spencer, S J; Butterfield, D M; Seah, M P; Quincey, P G (2008) On the applicability of XPS for quantitative total organic and elemental carbon analysis of airborne particulate matter. Atmos. Environ., 42 (16). pp. 3888-3891.

Roy, D; Angeles-Tactay, E*; Brown, R J C; Spencer, S J; Fry, T; Dunton, T A; Young, T*; Milton, M J T (2008) Synthesis and Raman spectroscopic characterisation of carbon nanoscrolls. Chem. Phys. Lett., 465 (4-6). pp. 254-257.

Seah, M P; Spencer, S J (2006) Repeatability intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151. pp. 178-181.

Seah, M P; Spencer, S J (2006) Repeatability intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151. pp. 178-181.

Seah, M P; Spencer, S J (2006) Repeatable intensity calibration of an x-ray photoelectron spectrometer. J. Electron Spectrosc. Relat. Phenom., 151 (3). pp. 178-181.

Seah, M P; Spencer, S J (2005) Ultrathin SiO2 on Si, VII: angular accuracy in XPS and an accurate attenuation length. Surf. Interface Anal., 37. pp. 731-736.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinlander, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyun Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Baily, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36 (9). pp. 1269-1303.

Seah, M P; Spencer, S J; Bensebaa, F*; Vickridge, I*; Danzebrink, H*; Krumrey, M*; Gross, T*; Oesterle, W*; Wendler, E*; Rheinländer, B*; Azuma, Y*; Kojima, I*; Suzuki, N*; Suzuki, M*; Tanuma, S*; Moon, D W*; Lee, H J*; Hyan Mo Cho*,; Chen, H Y*; Wee, A T S*; Osipowicz, T*; Pan, J S*; Jordaan, W A*; Hauert, R*; Klotz, U*; van der Marel, C*; Verheijen, M*; Tamminga, Y*; Jeynes, C*; Bailey, P*; Biswas, S*; Falke, U*; Nguyen, N V*; Chandler-Horowitz, D*; Ehrstein, J R*; Muller, D*; Dura, J A* (2004) Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: results of a CCQM pilot study. Surf. Interface Anal., 36. pp. 1269-1303.

Seah, M P; Spencer, S J (2003) Degradation of poly(vinyl chloride) and nitrocellulose in XPS. Surf. Interface Anal., 35. pp. 906-913.

Seah, M P; Spencer, S J (2003) Ultra-thin SiO2 on Si: IV, thickness linearity and intensity measurements in XPS. Surf. Interface Anal., 35. pp. 515-524.

Seah, M P; Spencer, S J (2003) Ultrathin Sio2 on Si. I quantifying and removing carbonaceous contamination. J. Vac. Sci. Technol. A, 21 (2). pp. 345-352.

Seah, M P; Spencer, S J (2002) Ultra-thin SiO2 on Si: II, issues in quantification of the oxide thickness. Surf. Interface Anal., 33. pp. 640-652.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities and sensitivity factors from spectral digital databases re-analysed using a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative AES IX and quantitative XPS II: Auger and X-ray photoelectron intensities from elemental spectra in digital databases reanalysed with a REELS database. Surf. Interface Anal., 31. pp. 778-795.

Seah, M P; Gilmore, I S; Spencer, S J (2001) Quantitative XPS I: analysis of X-ray photoelectron intensities from elemental data in a digital photoelectron database. J. Electron Spectrosc. Relat. Phenom., 120 (1-3). pp. 93-111.

Seah, M P; Spencer, S J (2000) AES of bulk insulators - control and characterisation of surface charge. J. Electron Spectrosc. Relat. Phenom., 109. pp. 291-380.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Background subtraction II: general behaviour of REELS and the Tougaard universal cross section in the removal of backgrounds in AES and XPS. Surf. Sci., 461. pp. 1-15.

Seah, M P; Gilmore, I S; Spencer, S J (2000) Consistent, combined quantitative AES and XPS digital data bases - convergence of theory and experiment. J. Vac. Sci. Technol. A, 18. pp. 1083-1088.

Seah, M P; Spencer, S J; Gilmore, I S; Johnstone, J E (2000) Depth resolution in sputter depth profiling - characterisation of a tantalum pentoxide on tantalum certified reference material. Surf. Interface Anal., 29. pp. 73-81.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter - induced cone and filament formation ob InP and AFM tip shape determination. Surf. Interface Anal., 29. pp. 782-790.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter-induced cone and filiment formation on InP and AFM tip shapes determination. Surf. Interface Anal., 29. pp. 782-790.

Seah, M P; Spencer, S J; Cumpson, P J; Johnson, J E (1999) Cones formed during sputtering of InP and their use in defining AFM tip shapes. Appl. Surf. Sci., 144-14. pp. 151-155.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Measurement of data for and the development of an ISO standard for the energy calibration of X-ray photoelectron spectrometers. Appl. Surf. Sci., 144-14. pp. 178-182.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Method for determining the signal linearity in single and multidetector counting systems in X-ray photoelectron spectroscopy. Appl. Surf. Sci., 144-14. pp. 132-136.

Seah, M P; Gilmore, I S; Spencer, S J (1999) Signal linearity in XPS counting systems. J. Electron Spectrosc. Relat. Phenom., 104. pp. 73-89.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: Binding energy calibration of electron spectrometers 4 - Assessment of effects for different X-ray sources, analyser resolutions, angles of emmision and overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Seah, M P; Gilmore, I S; Spencer, S J (1998) XPS: energy calibration of electron spectrometers, 4 - an assessment of effects for different conditions and of the overall uncertainties. Surf. Interface Anal., 26. pp. 617-641.

Cumpson, P J; Seah, M P; Spencer, S J (1998) The calibration of Auger and X-ray photoelectron spectrometers for valid analytical measurements. Spectrosc. Eur., 10 (3). pp. 8-15.

Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitative measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc., 87. pp. 159-167.

Seah, M P; Spencer, S J; Bodino, F*; Pireaux, J J* (1997) The alignment of spectrometers and quantitive measurements in X-ray photoelectron spectroscopy. J. Electron Spectrosc. Relat. Phenom., 87. pp. 159-167.

Cumpson, P J; Seah, M P; Spencer, S J (1996) Simple procedure for precise peak maximum estimation for energy calibration in AES and XPS. Surf. Interface Anal., 24 (10). pp. 687-694.