Paton, K; Pollard, A J (2024) The importance of interlaboratory studies for robust measurements of graphene and other 2D materials. 2D Materials, 11 (4). 043003

Marchesini, S; Paton, K R; Pollard, A J (2024) Navigating the Frontiers of Graphene Quality Control to Enable Product Optimisation and Market Confidence. Nano Futures, 8 (2). 022501

Tong, J; de Bruyn, N; Alieva, A; Legge, E J; Boyes, M; Song, X; Walisinghe, A J; Pollard, A J; Anderson, M W; Vetter, T; Melle-Franco, M; Casiraghi, C (2024) Crystallization of Molecular Layers produced Under Confinement onto a Surface. Nature Communications, 15. 2015

Rahman, F K; Paton, K R; Hinchliffe, B; Minelli, Caterina; Pollard, A J; Marchesini, S (2023) NMR Proton Relaxation for Measuring the Relative Concentration of Nanoparticles in Liquids. Nanoscale, 15 (45). pp. 18218-18223.

Chemello, G; Knigge, X; Ciornii, D; Reed, B P; Pollard, A J; Clifford, C A; Howe, T; Vyas, N; Hodoroaba, V-D; Radnik, J (2023) Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X-Rays. Advanced Materials Interfaces, 10 (20). 2300116

Reed, B P; Marchesini, S; Chemello, G; Morgan, D J; Vyas, N; Howe, T; Radnik, J; Clifford, C A; Pollard, A J (2023) The influence of sample preparation on XPS quantification of oxygen-functionalised graphene nanoplatelets. Carbon, 211. 118054

Bu, T; Gao, H; Yao, Y; Wang, J; Pollard, A J; Legge, E J; Clifford, C A; Delvallee, A; Ducourtieux, S; Lawn, M A; Babic, B; Coleman, V A; Jamting, A; Zou, S; Chen, M; Jakubek, Z J; Iacob, E; Chanthawong, N; Mongkolsuttirat, K; Zeng, G; Almeida, C M; He, B-C; Hyde, L; Ren, L (2023) Thickness measurements of graphene oxide flakes using atomic force microscopy: Results of an international interlaboratory comparison. Nanotechnology, 34 (22). 225702

Paton, K R; Despotelis, K; Kumar, N; Turner, P; Pollard, A J (2023) On the use of Raman Spectroscopy to Characterize Mass Produced Graphene Nanoplatelets. Beilstein Journal of Nanotechnology, 14. pp. 509-521.

Samajdar, R N; Marchesini, S; Brown, S A; Robertson, S D; Paton, K R; Pollard, A J; Wain, A J (2023) Differentiating Between Ion Transport and Plating-Stripping Phenomena in Magnesium Battery Electrolytes Using Operando Raman Spectroscopy. ACS Energy Letters, 8 (4). pp. 1864-1869.

Wang, J; Alieva, A; Boyes, M; Pollard, A J; Casiraghi, C (2023) In Situ Raman Study of the Crystallization of Glycine. CrystEngComm, 25 (17). pp. 2591-2599.

Turner, P; Paton, K R; Legge, E J; de Luna Bugallo, A; Rocha-Robledo, A K S; Zahab, A A; Centeno, A; Sacco, A; Pasquera, A; Zurutuza, A; Rossi, A M; Tran, D N H; Silva, D L; Losic, D; Farivar, F; Kerdoncuff, H; Kwan, H; Pirart, J; Campos, J L E; Subhedar, K M; Tay, L L; Ren, L; Cancado, L G; Paillet, M; Finnie, P; Yap, P L; Arenal, R; Dhakate, S R; Wood, S; Jimenez-Sandoval, S; Batten, T; Nagyte, V; Yao, Y; Walker, A R H; Ferreira, E H M; Casiraghi, C; Pollard, A J (2022) International interlaboratory comparison of Raman spectroscopic analysis of CVD-grown graphene. 2D Materials, 9 (3). 035010

Marchesini, S; Turner, P; Paton, K R; Reed, B P; Pollard, A J (2021) Rapid monitoring of graphene exfoliation using NMR proton relaxation. Nanoscale, 13 (34). pp. 14518-14524.

Farivar, F; Yap, P L; Hassan, K; Tung, T T; Tran, D N H; Pollard, A J; Losic, D (2021) Unlocking thermogravimetric analysis (TGA) in the fight against "Fake graphene" materials. Carbon, 179. pp. 505-513.

Rakowska, P D; Tiddia, M; Faruqui, N; Bankier, C; Pei, Y W; Pollard, A J; Zhang, J T; Gilmore, I S (2021) Antiviral surfaces and coatings and their mechanisms of action. Communications Materials, 2 (1). 53

Brennan, B; Centeno, A; Zurutuza, A; Mack, P; Paton, K R; Pollard, A J (2021) Gas Cluster Ion Beam Cleaning of CVD-Grown Graphene for Use in Electronic Device Fabrication. ACS Applied Nano Materials, 4 (5). pp. 5187-5197.

Marchesini, S; Paton, K R; Brennan, B; Turner, P; Pollard, A J (2021) Using nuclear magnetic resonance proton relaxation to probe the surface chemistry of carbon 2D materials. Nanoscale, 13 (13). pp. 6389-6393. ISSN 2040-3364

Clifford, C A; Martins Ferreira, E H; Fujimoto, T; Herrmann, J; Hight Walker, A R; Koltsov, D; Punckt, C; Ren, L; Smallwood, G J; Pollard, A J (2021) The importance of international standards for the graphene community. Nature Reviews Physics, 3 (4). pp. 233-235. ISSN 2522-5820

Nakanishi, K; Labonte, D; Cebo, T; Veigang-Radulescu, V P; Fan, Y; Brennan, B; Pollard, A J; Hofmann, S; Fleck, N A (2020) Mechanical properties of the hollow-wall graphene gyroid lattice. Acta Materialia, 201. pp. 254-265. ISSN 13596454

Kumar, N; Marchesini, S; Howe, T; Edwards, L; Brennan, B; Pollard, A J (2020) Nanoscale characterization of plasma functionalized graphitic flakes using tip-enhanced Raman spectroscopy. The Journal of Chemical Physics, 153 (18). 184708 ISSN 0021-9606

Fan, Y; Nakanishi, K; Veigang-Radulescu, V P; Mizuta, R; Stewart, J C; Swallow, J E N; Dearle, A E; Burton, O J; Alexander-Webber, J A; Ferrer, P; Held, G; Brennan, B; Pollard, A J; Weatherup, R S; Hofmann, S (2020) Understanding metal organic chemical vapour deposition of monolayer WS2: the enhancing role of Au substrate for simple organosulfur precursors. Nanoscale, 12 (43). pp. 22234-22244. ISSN 2040-3364

Marchesini, S; Turner, P; Paton, K R; Reed, B P; Brennan, B; Koziol, K; Pollard, A J (2020) Gas physisorption measurements as a quality control tool for the properties of graphene/graphite powders. Carbon, 167. pp. 585-595. ISSN 00086223

Burton, O J; Massabuau, F C P; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Hofmann, S (2020) Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene. ACS Nano, 14 (10). pp. 13593-13601. ISSN 1936-0851

Nagyte, V; Kelly, D J; Felten, A; Picardi, G; Shin, Y Y; Alieva, A; Worsley, R E; Parvez, K; Dehm, S; Krupke, R; Haigh, S J; Oikonomou, A; Pollard, A J; Casiraghi, C (2020) Raman Fingerprints of Graphene Produced by Anodic Electrochemical Exfoliation. Nano Letters, 20 (5). pp. 3411-3419. ISSN 1530-6984

Babenko, V; Fan, Y; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Burton, O; Alexander-Webber, J A; Weatherup, R S; Canto, B; Otto, M; Neumaier, D; Hofmann, S (2020) Oxidising and carburising catalyst conditioning for the controlled growth and transfer of large crystal monolayer hexagonal boron nitride. 2D Materials, 7 (2). 024005 ISSN 2053-1583

Legge, E J; Paton, K R; Wywijas, M; McMahon, G; Pemberton, R; Kumar, N; Aranga Raju, A P; Dawson, C P; Strudwick, A J; Bradley, J W; Stolojan, V; Silva, S R P; Hodge, S A; Brennan, B; Pollard, A J (2020) Determining the Level and Location of Functional Groups on Few-Layer Graphene and Their Effect on the Mechanical Properties of Nanocomposites. ACS Applied Materials & Interfaces, 12 (11). pp. 13481-13493. ISSN 1944-8244

Braeuninger-Weimer, P; Burton, O; Weatherup, R S; Wang, R; Dudin, P; Brennan, B; Pollard, A J; Bayer, B C; Veigang-Radulescu, V P; Meyer, J C; Murdoch, B J; Cumpson, P J; Hofmann, S (2019) Reactive intercalation and oxidation at the buried graphene-germanium interface. APL Materials, 7 (7). 071107 ISSN 2166-532X

Burton, O J; Babenko, V; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Hofmann, S (2019) The Role and Control of Residual Bulk Oxygen in the Catalytic Growth of 2D Materials. The Journal of Physical Chemistry C, 123 (26). pp. 16257-16267. ISSN 1932-7447

Kumar, N; Weckhuysen, B M; Wain, A J; Pollard, A J (2019) Nanoscale chemical imaging using tip-enhanced Raman spectroscopy. Nature Protocols, 14 (4). pp. 1169-1193. ISSN 1754-2189

Legge, E J; Ahmad, M; Smith, C T G; Brennan, B; Mills, C A; Stolojan, V; Pollard, A J; Silva, S R P (2018) Physicochemical characterisation of reduced graphene oxide for conductive thin films. RSC Advances, 8 (65). pp. 37540-37549. ISSN 2046-2069

Kumar, N; Su, W T; Vesely, M; Weckhuysen, B M; Pollard, A J; Wain, A J (2018) Nanoscale chemical imaging of solid-liquid interfaces using tip-enhanced Raman spectroscopy. Nanoscale, 10 (4). pp. 1815-1824.

Pollard, A J; Clifford, C A (2017) Terminology: the first step towards international standardisation of graphene and related 2D materials. Journal of Materials Science, 52 (24). pp. 13685-13688.

Pollard, A J; Paton, K R; Clifford, C A; Legge, E; Oikonomou, A; Haigh, S; Casiraghi, C; Nguyen, L; Kelly, D (2017) Characterisation of the structure of graphene. Measurement Good Practice Guide. 145

Paton, K R; ANderson, J*; Pollard, A J; Sainsbury, T (2017) Production of few-layer graphene by microfluidisation. Mater. Res. Express, 4 (2). 025604

Brennan, B; Spencer, S; Belsey, N A; Faris, T*; Cronin, H*; Silva, S R P*; Sainsbury, T; Gilmore, I S; Stoeva, Z*; Pollard, A J (2017) Structural, chemical and electrical characterisation of conductive graphene-polymer composite films. Appl. Surf. Sci., 403. pp. 403-412.

Sainsbury, T; Passarelli, M; Naftaly, M; Gnaniah, S J P; Spencer, S J; Pollard, A J (2016) Covalent carbene functionalization of graphene: towards chemical band gap manipulation. ACS Appl. Mater. Interfaces, 8 (7). pp. 4870-4877.

Weatherup, R S*; Shahan, A J*; Wang, Z J*; Mingard, K; Pollard, A J; Willinger, M G*; Schloegl, R*; Voorhees, P W*; Hofmann, S* (2016) In situ graphene growth dynamics on polycrystalline catalyst foils. Nano Lett., 16 (10). pp. 6196-6206.

Pollard, A J (2016) Metrology for graphene and 2D materials. Meas. Sci. Technol., 27 (9). 092001

Braeuninger-Weimer, P*; Brennan, B; Pollard, A J; Hofmann, S* (2016) Understanding and controlling Cu-catalyzed graphene nucleation: the role of impurities, roughness and oxygen scavenging. Chem. Mater., 28 (24). pp. 8905-8915.

Mignuzzi, S; Pollard, A J; Bonini, N*; Brennan, B; Gilmore, I S; Pimenta, M A*; Richards, D*; Roy, D (2015) Effect of disorder on Raman scattering of single-layer MoS2. Phys. Rev. B, 91 (19). 195411

Pearce, R; Tan, X; Wang, R; Patel, T; Gallop, J C; Pollard, A J; Yakimova, R*; Hao, L (2015) Investigations of the effect of SiC growth face on graphene thickness uniformity and electronic properties. Surf. Topogr.: Metrol. Prop., 3 (1). p. 15001.

Caneva, S*; Weatherup, R S*; Bayer, B C*; Brennan, B*; Spencer, S J; Mingard, K P; Cabrero-Vilatela, A*; Baehtz, C*; Pollard, A J (2015) Nucleation control for large, single crystalline domains of monolayer hexagonal boron nitride via Si-doped Fe catalysts. Nano Lett., 15 (3). pp. 1867-1875.

Mignuzzi, S; Kumar, N; Brennan, B; Gilmore, I S; Richards, D*; Pollard, A J; Roy, D (2015) Probing individual point defects in graphene via near-field Raman scattering. Nanoscale, 7 (46). pp. 19413-19418.

Tyler, B J; Brennan, B; Stec, H; Patel, T; Hao, L; Gilmore, I S; Pollard, A J (2015) Removal of organic contamination from graphene with a controllable mass-selected argon gas cluster ion beam. J. Phys. Chem. C, 119 (31). pp. 17836-17841.

Koos, A A*; Murdock, A T*; Nemes-Incze, P*; Nicholls, R J*; Pollard, A J; Spencer, S J; Shard, A G; Roy, D; Biro, L P*; Grobert, N* (2014) Effects of temperature and ammonia flow rate on the chemical vapour deposition growth of nitrogen-doped graphene. Phys. Chem. Chem. Phys., 16 (36). pp. 19446-19452.

Wain, A J; Pollard, A J; Richter, C* (2014) High-resolution electrochemical and topographical imaging using batch-fabricated cantilever probes. Anal. Chem., 86 (10). pp. 5143-5149.

Pollard, A J; Brennan, B; Stec, H*; Tyler, B J; Seah, M P; Gilmore, I S; Roy, D (2014) Quantitative characterization of defect size in graphene using Raman spectroscopy. Appl. Phys. Lett., 105 (25). 253107

Pollard, A J; Faruqui, N; Shaw, M; Clifford, C A; Takahashi, Y*; Korchev, Y E*; Ebejer, N*; Macpherson, J V*; Unwin, P R*; Roy, D (2011) Development of a novel combined scanning electrochemical microscope (SECM) and scanning ion-conductance microscope (SICM) probe for soft sample imaging.. MRS Conference Proceedings, 1422. mrsf11-1422-qq07-04

Takahashi, Y*; Shevchuk, A I*; Novak, P*; Zhang, Y*; Ebejer, N*; Macpherson, J V*; Unwin, P R*; Pollard, A J; Roy, D; Clifford, C A; Shiku, H*; Matsue, T*; Klenerman, D*; Korchev, Y E* (2011) Multifunctional nanoprobes for nanoscale chemical imaging and localized chemical delivery at surfaces and interfaces. Angew. Chem., Int. Ed., 50. pp. 9638-9642.