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Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene

Burton, O J; Massabuau, F C P; Veigang-Radulescu, V P; Brennan, B; Pollard, A J; Hofmann, S (2020) Integrated Wafer Scale Growth of Single Crystal Metal Films and High Quality Graphene. ACS Nano, 14 (10). pp. 13593-13601. ISSN 1936-0851

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Item Type: Article
Subjects: Nanoscience > Surface and Nanoanalysis
Divisions: Chemical & Biological Sciences
Identification number/DOI: 10.1021/acsnano.0c05685
Last Modified: 29 Apr 2021 10:43
URI: http://eprintspublications.npl.co.uk/id/eprint/9100

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