Report/Guide

Cumpson, P J (1998) Guide to smoothing in AES and XPS. NPL Report. CMMT(A)159

Cumpson, P J; Seah, M P (1994) Stability of reference masses IV: growth of carbonaceous contamination on platinum-iridium alloy surfaces, and its cleaning by UV/ozone treatment. NPL Report. DMM(A)126

Cumpson, P J; Seah, M P (1994) Stability of reference masses III: mechanism and long term effects of mercury contamination on platinum-iridium mass standards. NPL Report. DMM(A)125

Cumpson, P J; Seah, M P (1993) Guidelines for the expression of uncertainties in surface chemical analysis by Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS). NPL Report. DMM(A)99

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1993) Stability of reference masses II: the effect of environment and cleaning methods on the surfaces of stainless steel and allied materials. NPL Report. DMM(A)95

Article

Braeuninger-Weimer, P; Burton, O; Weatherup, R S; Wang, R; Dudin, P; Brennan, B; Pollard, A J; Bayer, B C; Veigang-Radulescu, V P; Meyer, J C; Murdoch, B J; Cumpson, P J; Hofmann, S (2019) Reactive intercalation and oxidation at the buried graphene-germanium interface. APL Materials, 7 (7). 071107 ISSN 2166-532X

Tantra, R; Gohil, D D; Cumpson, P J (2009) Effective platform for the generation of aerosol droplets and application in evaluating the effectiveness of a MEMS-based nanoparticle trapping device. Particuology, 7 (6). pp. 471-476.

Herrera-Gomez, A*; Grant, J T*; Cumpson, P J; Jenko, M*; Aguirre-Tostado, F S*; Brundle, C R*; Conard, T*; Conti, G*; Fadley, C S*; Fulghum, J*; Kobayashi, K*; Kover, L*; Nohira, H*; Opila, R L*; Oswald, S*; Paynter, R W*; Wallace, R M*; Werner, W S M*; Wolstenholme, J* (2009) Report on the 47th IUVSTA workshop 'Angle-resolved XPS: the current status and future prospects for angle-resolved XPS of nano and subnano films'. Surf. Interface Anal., 41 (11). pp. 840-857.

Munz, M; Cox, D C; Cumpson, P J (2008) Nano-scale shear mode testing of the adhesion of nanoparticles to a surface-support. Phys. Status Solidi A, 205 (6). pp. 1424-1428.

Aitkin, R J*; Hankin, S M*; Tran, C L*; Donaldson, K*; Stone, V*; Cumpson, P J; Johnstone, J; Chaudhry, Q*; Cash, S*; Garrod, J* (2008) A multidisciplinary approach to the identification of reference materials for engineered nanoparticle toxicology. Nanotoxicology, 2 (2). pp. 71-78.

Roy, D; Munz, M; Colombi, P*; Bhattacharyya, S*; Salvetat, J-P*; Cumpson, P J; Saboungi, M-L* (2007) Directly writing with nanoparticles at the nanoscale using dip-pen nanolithography. Appl. Surf. Sci., 254 (5). pp. 1394-1398.

Sheridan, B; Cumpson, P J; Bailey, M (2007) Nanoscale measurement - important questions at the bottom. ISO Focus, 4 (4). pp. 43-45.

Tantra, R; Cumpson, P J (2007) The detection of airborne carbon nanotubes in relation to toxicology and workplace safety. Nanotoxicology, 1 (4). pp. 251-265.

Portoles, J F*; Cumpson, P J; Hedley, J*; Allen, S*; Williams, P M*; Tendler, S J B* (2006) Accurate velocity measurements of AFM-cantilever vibrations by doppler interferometry. J. Experimental Nanoscience, 1 (1). pp. 51-62.

Sheridan, B; Cumpson, P J; Bailey, M J A (2005) Metrology at the nano scale. Phys. World, 18 (8). pp. 37-40.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Cumpson, P J; Zhdan, P*; Hedley, J* (2004) Calibration of AFM cantilever stiffness: a microfabricated array of reflective springs. Ultramicroscopy, 100. pp. 241-251.

Cumpson, P J; Hedley, J*; Clifford, C A; Chen, X*; Allen, S* (2004) Microelectromechanical systems device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m. J. Vac. Sci. Technol. A, 22 (4). pp. 1444-1449.

Clifford, C A; Cumpson, P J; Seah, M P (2004) Nano-analysis using Atomic Force Microscopy. VAM Bulletin, 31. pp. 21-25.

Halliwell, C M; Green, F; Gilmore, I S; Cumpson, P J; Davies, J A (2004) Nanoanalytical measurements for the determination of protein orientation at surfaces. The Analyst, 129. pp. 1166-1170.

Cumpson, P J; Clifford, C A; Hedley, J* (2004) Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration. Meas. Sci. Technol., 15. pp. 1337-1346.

Hedley, J*; Burdess, J S*; Harris, A J*; Gallacher, B J*; McNeil, C J*; Cumpson, P J; Enderling, S* (2004) An optical workstation for characterisation and modification of MEMS. Proc. SPIE - Int. Soc. Opt. Eng., 5458. pp. 244-252.

Cumpson, P J; Hedley, J* (2003) Accurate analytical measurements in the atomic force microscope: a microfabricated spring constant standard potentially traceable to the SI. Nanotechnology, 14. pp. 1279-1288.

Cumpson, P J; Hedley, J*; Zhdan, P* (2003) Accurate force measurement in the atomic force microscope: a microfabricated array of reference springs for easy cantilever calibrations. Nanotechnology, 14. pp. 918-924.

Cumpson, P J (2001) Estimation of inelastic mean free paths for polymers and other organic materials: use of quantitative structure-property relationships. Surf. Interface Anal., 31. pp. 23-34.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter - induced cone and filament formation ob InP and AFM tip shape determination. Surf. Interface Anal., 29. pp. 782-790.

Seah, M P; Spencer, S J; Cumpson, P J; Johnstone, J E (2000) Sputter-induced cone and filiment formation on InP and AFM tip shapes determination. Surf. Interface Anal., 29. pp. 782-790.

Cumpson, P J (2000) The thickogram: a method for easy film-thickness measurement in XPS. Surf. Interface Anal., 29. pp. 403-406.

Cumpson, P J (1999) Angle-resolved XPS depth-profiling strategies. Appl. Surf. Sci., 144-14. pp. 16-20.

Seah, M P; Spencer, S J; Cumpson, P J; Johnson, J E (1999) Cones formed during sputtering of InP and their use in defining AFM tip shapes. Appl. Surf. Sci., 144-14. pp. 151-155.

Cumpson, P J; Seah, M P; Spencer, S J (1998) The calibration of Auger and X-ray photoelectron spectrometers for valid analytical measurements. Spectrosc. Eur., 10 (3). pp. 8-15.

Cumpson, P J; Seah, M P (1997) Elastic scattering corrections in AES and XPS II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments. Surf. Interface Anal., 25. pp. 430-446.

Cumpson, P J (1997) Elastic scattering corrections in AES and XPS III. Surf. Interface Anal. (25). pp. 447-453.

Cumpson, P J; Seah, M P (1997) Elastic scattering corrections in AES and XPS: II. Estimating attenuation lengths and conditions required for their valid use in overlayer/substrate experiments. Surf. Interface Anal., 25. pp. 430-446.

Cumpson, P J (1997) Elastic scattering corrections in AES and XPS: III. Behaviour of electron transport mean free path in solids for kinetic energies in the range 100eV<E<400eV. Surf. Interface Anal., 25. pp. 447-456.

Jackson, A R*; ElGomati, N M*; Matthew, J A D*; Cumpson, P J (1997) Monte-Carlo calculation of the depth distribution function in multilayer structures. Surf. Interface Anal., 25. pp. 341-349.

Cumpson, P J (1997) Quartz-crystal microbalance: a new design eliminates sensitivity outside the electrodes. J. Vac. Sci. Technol. A, 15. pp. 2407-2410.

Cumpson, P J; Seah, M P; Spencer, S J (1996) Simple procedure for precise peak maximum estimation for energy calibration in AES and XPS. Surf. Interface Anal., 24 (10). pp. 687-694.

Cumpson, P J; Seah, M P (1996) Stability of reference masses IV: growth of carbonaceous contamination on platinum-iridium alloy surfaces, and cleaning by UV/ozone treatment. Metrologia, 33 (6). pp. 507-532.

Cumpson, P J (1995) Angle-resolved XPS and AES: depth resolution limits and a general comparison of properties of depth profile reconstruction methods. J. Electron Spectrosc. Relat. Phenom., 73 (1). 25 - 52

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) Simple method of depth profiling (stratifying) contamination layers,illustrated by studies on stainless steel. Surf. Interface Anal., 21. 336 -341

Cumpson, P J; Seah, M P (1994) Stability of reference masses I: evidence for possible variations in the mass of reference kilograms arising from mercury contamination. Metrologia, 31. 21 - 26

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) Stability of reference masses II: the effect of environment and cleaning methods on the surfaces of stainless steel and allied materials. Metrologia, 31. 93 - 108

Cumpson, P J; Seah, M P (1994) Stability of reference masses III: mechanism and long-term effects of mercury contamination on platinum-iridium mass standards. Metrologia, 31. pp. 375-388.

Seah, M P; Qiu, J H*; Cumpson, P J; Castle, J E* (1994) A simple method of depth profiling (stratifying) contamination layers illustrated by studies on stainless steel. Surf. Interface Anal., 21. pp. 336-341.

Cumpson, P J (1993) Elastic scattering corrections in AES and XPS: I Two rapid Monte-Carlo methods for calculating the depth distribution function. Surf. Interface Anal., 20. pp. 727-741.

Cumpson, P J (1993) Elastic scattering corrections in AES and XPS: I. Rapid Monte-Carlo methods for calculating the depth-distribution function. Surf. Interface Anal., 20. pp. 727-736.

Seah, M P; Cumpson, P J (1993) Signal-to-noise assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies. J. Electron Spectrosc., 61. pp. 291-308.

Seah, M P; Cumpson, P J (1993) Signal-to-noise ratio assessment and measurement in spectroscopies with particular reference to Auger and X-ray photoelectron spectroscopies. J. Electron Spectrosc. Relat. Phenom., 61 (3-4). pp. 291-308.

Conference or Workshop Item

Milton, M J T; Cumpson, P J (2002) Nanoscale and integrity of the SI. In: IEEE Conference on Precision Electromagnetic Measurements Conference Digest, June 2002.

Cumpson, P J (1997) Comparison of Angle-Resolved XPS quantification methods. In: ECASIA 97 -European Conference on Applications of Surface and Interface Analysis, June 1997, Gothenburg, Sweden.

Cumpson, P J; Seah, M P (1997) Estimation of attenuation length for film in thickness measurement in XPS and AES. In: ECASIA 97 - European Conference on Applications of Surface and Interface Analysis, 16-20 June 1997, Goteborg, Sweden.

Cumpson, P J (1996) Angle-resolved XPS and AES: Developments in modelling for reliable, practical quantification. In: Proc. 6th European conference on Applications of Surface and Interface Analysis, May 1996.

Cumpson, P J; Seah, M P (1996) Contamination and cleaning of a platinum alloy: models and measurements of the build up of carbonaceous and mercury contamination. In: Proc. 6th European conference on Applications of Surface and Interface Analysis (ISBN 0471958999), May 1996.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1996) An absolute high resolution digital Auger electron reference databases. In: ECASIA 95, European Conference on Applications of Surface and Interface Analysis, 1996.

Seah, M P; Gilmore, I S; Cumpson, P J; Langeron, J P*; Lorang, G* (1995) An absolute, high resolution digital auger electron reference database. In: ECASIA 95 European Conference on Applications of Surface and Interface Analysis, 9 - 13 October 1995, Montreaux, Switzerland.