Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.
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Item Type: | Article |
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Subjects: | Nanoscience Nanoscience > Surface and Nanoanalysis |
Last Modified: | 02 Feb 2018 13:16 |
URI: | http://eprintspublications.npl.co.uk/id/eprint/3376 |
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