Cumpson, P J (1996) Angle-resolved XPS and AES: Developments in modelling for reliable, practical quantification. In: Proc. 6th European conference on Applications of Surface and Interface Analysis, May 1996.

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Item Type:	Conference or Workshop Item (UNSPECIFIED)
Subjects:	Advanced Materials
Last Modified:	02 Feb 2018 13:19
URI:	http://eprintspublications.npl.co.uk/id/eprint/531

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