Shard, A G; Baer, D R; Clifford, C A (2024) Importance of Standard Terminology in Surface Chemical Analysis: ISO 18115-1:2023, General Terms and Terms used in Spectroscopy. Surface and Interface Analysis, 56 (5). pp. 305-307.

Chemello, G; Knigge, X; Ciornii, D; Reed, B P; Pollard, A J; Clifford, C A; Howe, T; Vyas, N; Hodoroaba, V-D; Radnik, J (2023) Influence of the Morphology on the Functionalization of Graphene Nanoplatelets Analyzed by Comparative Photoelectron Spectroscopy with Soft and Hard X-Rays. Advanced Materials Interfaces, 10 (20). 2300116

Reed, B P; Marchesini, S; Chemello, G; Morgan, D J; Vyas, N; Howe, T; Radnik, J; Clifford, C A; Pollard, A J (2023) The influence of sample preparation on XPS quantification of oxygen-functionalised graphene nanoplatelets. Carbon, 211. 118054

Bu, T; Gao, H; Yao, Y; Wang, J; Pollard, A J; Legge, E J; Clifford, C A; Delvallee, A; Ducourtieux, S; Lawn, M A; Babic, B; Coleman, V A; Jamting, A; Zou, S; Chen, M; Jakubek, Z J; Iacob, E; Chanthawong, N; Mongkolsuttirat, K; Zeng, G; Almeida, C M; He, B-C; Hyde, L; Ren, L (2023) Thickness measurements of graphene oxide flakes using atomic force microscopy: Results of an international interlaboratory comparison. Nanotechnology, 34 (22). 225702

Radnik, J; Knigge, X; Andresen, E; Resch-Genger, U; Cant, D J H; Shard, A G; Clifford, C A (2022) Composition, thickness, and homogeneity of the coating of core-shell nanoparticles-possibilities, limits, and challenges of X-ray photoelectron spectroscopy. Analytical and Bioanalytical Chemistry, 414 (15). pp. 4331-4345.

Al-Siddiqui, Z; Davies, S L; Clifford, C A (2021) Nanomechanical properties of potato flakes using atomic force microscopy. Journal of Food Engineering, 307. 110646

Cant, D J H; Muller, A; Clifford, C A; Unger, W E S; Shard, A G (2021) Summary of ISO/TC 201 Technical Report 23173 — Surface chemical analysis — Electron spectroscopies — Measurement of the thickness and composition of nanoparticle coatings. Surface and Interface Analysis, 53 (10). pp. 893-898.

Al-Rekabi, Z; Rawlings, A V; Lucas, R A; Raj, N; Clifford, C A (2021) Characterizing the nanomechanical properties of microcomedones after treatment with sodium salicylate ex vivo using atomic force microscopy. International Journal of Cosmetic Science, 43 (5). pp. 610-618.

Clifford, C A; Martins Ferreira, E H; Fujimoto, T; Herrmann, J; Hight Walker, A R; Koltsov, D; Punckt, C; Ren, L; Smallwood, G J; Pollard, A J (2021) The importance of international standards for the graphene community. Nature Reviews Physics, 3 (4). pp. 233-235. ISSN 2522-5820

Bushell, M; Meija, J; Chen, M; Batchelor, W; Browne, C; Cho, J Y; Clifford, C A; Al-Rekabi, Z; Vanderfleet, O M; Cranston, E D; Lawn, M; Coleman, V A; Nyström, G; Arcari, M; Mezzenga, R; Park, B C; Shin, C H; Ren, L; Bu, T; Saito, T; Kaku, Y; Wagner, R; Johnston, L J (2021) Particle size distributions for cellulose nanocrystals measured by atomic force microscopy: an interlaboratory comparison. Cellulose, 28 (3). pp. 1387-1403. ISSN 0969-0239

Shard, A G; Havelund, R; Seah, M P; Clifford, C A (2019) Summary of ISO/TC 201 Standard: ISO 22415—Surface chemical analysis—Secondary ion mass spectrometry—Method for determining yield volume in argon cluster sputter depth profiling of organic materials. Surface and Interface Analysis, 51 (10). pp. 1018-1020. ISSN 0142-2421

Baer, D R; Karakoti, A S; Clifford, C A; Minelli, C; Unger, W E S (2018) Importance of sample preparation on reliable surface characterisation of nano-objects: ISO standard 20579-4. Surface and Interface Analysis, 50 (9). pp. 902-906. ISSN 01422421

Shard, A G; Clifford, C A (2018) Summary of ISO/TC 201 standard: ISO 19668 surface chemical analysis X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials. Surface and Interface Analysis, 50 (1). pp. 87-89.

Pollard, A J; Clifford, C A (2017) Terminology: the first step towards international standardisation of graphene and related 2D materials. Journal of Materials Science, 52 (24). pp. 13685-13688.

Pollard, A J; Paton, K R; Clifford, C A; Legge, E; Oikonomou, A; Haigh, S; Casiraghi, C; Nguyen, L; Kelly, D (2017) Characterisation of the structure of graphene. Measurement Good Practice Guide. 145

Clifford, C A (2017) Summary of ISO/TC 201 Standard: ISO 11775:2015 - Surface chemical analysis - Scanning probe microscopy - Determination of cantilever normal spring constants. Surf. Interface Anal., 49 (3). pp. 171-172.

Flater, E E*; Zacharakis-Jutz, G E*; Dunba, B A*; White, I A*; Clifford, C A (2014) Towards easy and reliable AFM tip shape determination using blind tip reconstruction. Ultramicroscopy, 146. pp. 130-143.

Clifford, C A; Seah, M P (2012) Modelling of surface nanoparticle inclusions for nanomechanical measurements by an AFM or nanoindenter: spatial issues. Nanotechnology, 23 (16). 165704

Clifford, C A; Sano, N*; Doyle, P*; Seah, M P (2012) Nanomechanical measurements of hair as an example of micro-fibres analysis using atomic force microscopy nanoindentation. Ultramicroscopy, 114. pp. 38-45.

Pollard, A J; Faruqui, N; Shaw, M; Clifford, C A; Takahashi, Y*; Korchev, Y E*; Ebejer, N*; Macpherson, J V*; Unwin, P R*; Roy, D (2011) Development of a novel combined scanning electrochemical microscope (SECM) and scanning ion-conductance microscope (SICM) probe for soft sample imaging.. MRS Conference Proceedings, 1422. mrsf11-1422-qq07-04

Takahashi, Y*; Shevchuk, A I*; Novak, P*; Zhang, Y*; Ebejer, N*; Macpherson, J V*; Unwin, P R*; Pollard, A J; Roy, D; Clifford, C A; Shiku, H*; Matsue, T*; Klenerman, D*; Korchev, Y E* (2011) Multifunctional nanoprobes for nanoscale chemical imaging and localized chemical delivery at surfaces and interfaces. Angew. Chem., Int. Ed., 50. pp. 9638-9642.

Clifford, C A; Seah, M P (2009) International interlaboratory comparison of AFM spring constant calibration and force-distance curves - protocol for analysis. NPL Report. AS 41

Clifford, C A; Seah, M P (2009) Improved methods and uncertainty analysis in the calibration of the spring constant of an atomic force microscope cantilever using static experimental methods. Meas. Sci. Technol., 12 (12). 125501

Clifford, C A; Seah, M P (2009) Nanoindentation measurement of Young's modulus for compliant layers on stiffer substrates including the effect of Poisson's ratios. Nanotechnology, 20 (14). 145708

Decker, J E*; Walker, A R H*; Bosnick, K*; Clifford, C A; Dai, L*; Fagan, J*; Hooker, S*; Jakubek, Z J*; Kingston, C*; Makar, J*; Mansfield, E*; Postek, M T*; Simard, B*; Sturgeon, R*; Wise, S*; Vladar, A E*; Yang, L*; Zeisler, R* (2009) Sample preparation protocols for realization of reproducible characterization of single-walled carbon nanotubes. Metrologia, 46 (6). pp. 682-692.

Clifford, C A; Seah, M P (2009) Simplified drift characterisation in scanning probe microscopes using a simple two-point method. Meas. Sci. Technol., 20 (9). 095103

Clifford, C A; Seah, M P (2006) Interlaboratory comparison of reduced modulus measurement of polymers at the nanoscale using an AFM or a nanoindenter - protocol for analysis. NPL Report. DQL-AS 030

Clifford, C A; Seah, M P (2006) Modelling of nanomechanical nanoindentation measurements using an AFM or nanoindenter for compliant layers on stiffer substrates. Nanotechnology, 17. pp. 5283-5292.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Cumpson, P J; Hedley, J*; Clifford, C A (2005) Microelectromechanical device for lateral force calibration in the atomic force microscope: lateral electrical nanobalance. J. Vac. Sci. Technol. B, 23 (5). pp. 1992-1997.

Clifford, C A; Seah, M P (2005) Quantification issues in the identification of nanoscale regions of homopolymers using modulus measurements via AFM nanoindentation. Appl. Surf. Sci., 252 (5). pp. 1915-1933.

Seah, M P; Clifford, C A; Green, F M; Gilmore, I S (2005) An accurate semi-empirical equation for sputtering yields, I: for argon ions. Surf. Interface Anal., 37. pp. 444-458.

Clifford, C A; Seah, M P (2005) The determination of atomic force microscope cantilever spring constants via dimensional methods for nanomechanical analysis. Nanotechnology, 16 (9). pp. 1666-1680.

Cumpson, P J; Hedley, J*; Clifford, C A; Chen, X*; Allen, S* (2004) Microelectromechanical systems device for calibration of atomic force microscope cantilever spring constants between 0.01 and 4 N/m. J. Vac. Sci. Technol. A, 22 (4). pp. 1444-1449.

Clifford, C A; Cumpson, P J; Seah, M P (2004) Nano-analysis using Atomic Force Microscopy. VAM Bulletin, 31. pp. 21-25.

Cumpson, P J; Clifford, C A; Hedley, J* (2004) Quantitative analytical atomic force microscopy: a cantilever reference device for easy and accurate AFM spring-constant calibration. Meas. Sci. Technol., 15. pp. 1337-1346.