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Publications

Items where Author is "Wilson, A"

Group by: Item Type | No Grouping
Number of items: 17.

Report/Guide

Wilson, A; Leach, R K (2009) Manufacturing and testing of a micro-stylus suitable for tactile probing in dimensional metrology. NPL Report. ENG 15

Leach, R K; Murphy, J; Wilson, A (2004) Design of a co-ordinate measuring probing system for characterising three-dimensional micro-structures. NPL Report. CBTLM 30

Article

Jones, D J M; Aikomo, M; Ashford, S; Ashkhasi, A; Davis, J A; Devine, B; Eglin, B; Everett, S B; Foot, R; Galbraith, D; Hendricks, R J; Khatry, K; Langham, C; Lewis, R; Newton-Griffiths, J; Owen, H; Shemar, S L; Sheppard, A; Smyth, C; Szymaniec, K; Walby, S; Weston, D F M; Whale, J; Whibberley, P B; Wilson, A; Wilson, C; Margolis, H S (2024) A new resilient time and frequency infrastructure for UTC(NPL). Journal of Physics: Conference Series, 2889. 012025

Sun, W J; Giusca, C; Lou, S; Yang, X Y; Chen, X; Fry, T; Jiang, X Q; Wilson, A; Brown, S; Boulter, H (2022) Establishment of X-ray computed tomography traceability for additively manufactured surface texture evaluation. Additive Manufacturing, 50. 102558

Ridler, N M; Johny, S; Salter, M J; Shang, X; Sun, W; Wilson, A (2021) Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths. Metrologia, 58 (1). 015015 ISSN 0026-1394

Ridler, N M; Johny, S; Shang, X; Sun, W; Wilson, A (2020) Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 453-459. ISSN 2156-342X

Crompton, A; Gamage, K; Bell, S; Wilson, A; Jenkins, A; Trivedi, D (2017) First Results of Using a UVTron Flame Sensor to Detect Alpha-Induced Air Fluorescence in the UVC Wavelength Range. Sensors, 17 (12). 2756 ISSN 1424-8220

Arinc, A; Parfitt, M J; Keightley, J D; Wilson, A (2016) Defined solid angle alpha counting at NPL. Appl. Radiat. Isot., 109. pp. 198-204.

Saunders, P*; Wilson, A; Orchard, N*; Tatman, N*; Maropoulos, P* (2014) An exploration into measurement consistency on coordinate measuring. Procedia CIRP, 25. pp. 19-26.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2013) The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths. IEEE Microw. Mag., 14 (7). pp. 67-74.

Marson, S*; Attia, U M*; Lucchetta, G*; Wilson, A; Alcock, J R*; Allen, D M* (2011) Flatness optimization of micro-injection moulded parts: the case of a PMMA microfludic component. J. Micromechan. Microeng., 21 (11). 115024

Yacoot, A; Leach, R K; Hughes, B; Giusca, C; Jones, C W; Wilson, A (2009) Dimensional nanometrology at The National Physical Laboratory. Proc. SPIE - Int. Soc. Opt. Eng., 7133. pp. 713345-1.

Conference or Workshop Item

Shang, X B; Ridler, N M; Sun, W J; Cooper, P; Wilson, A (2019) Preliminary Study on WM-380 Waveguide TRL Calibration Line Standards at the UK's National Physical Laboratory. In: 2019 92nd ARFTG Microwave Measurement Conference (ARFTG), 19-22 January 2019, Orlando, Fl, USA.

Horibe, M*; Ridler, N M; Wilson, A (2012) Traceability via precision dimensional measurements of WM-864 (WR-03) waveguide standard shims including comparison between NPL and NMIJ. In: 79th ARFTG Microwave Measurement Conference, 22 June 2012, Montreal, Canada.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2011) Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz. In: 78th ARFTG Microwave Measurement Symposium, 1 - 2 December 2011, Tempe, AZ, USA.

Ridler, N M; Salter, M J; Wilson, A; Pollard, R*; Clarke, R* (2009) Traceability to National Standards for S parameter measurements of waveguide devices from 110 GHz to 170 GHz. In: 73rd ARFTG Microwave Measurement Conference, 12 June 2009, Boston, USA.

Stoyanov, S*; Bailey, C*; Leach, R K; Hughes, B; Wilson, A; O'Neill, W*; Dorey, R A*; Shaw, C*; Underhill, D*; Almond, H J* (2008) Modelling and prototyping the conceptual design of 3D CMM micro-probe. In: 2nd Electronics Systemintegration Technology Conference, 2008, Greenwich, UK.

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