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Publications

Items where Author is "Sun, W"

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Number of items: 23.

Report/Guide

Boesch, H; Brindley, H; Carminati, F; Fox, N; Helder, D; Hewison, T; Houtz, D; Hunt, S; Kopp, G; Mlynczak, M; Pagano, T S; Revercomb, H; Richard, E; Rosenkranz, P; Shea, Y; Simis, S; Smith, D; Stone, T C; Sun, W; Xiong, J; Wielicki, B; Yang, H; Ye, X (2022) SI-traceable space-based climate observation system: a CEOS and GSICS workshop, National Physical Laboratory, London, UK, 9-11 Sept 2019. Other.

Sun, W; Giusca, C; Lancaster, A (2017) Surface texture measurements of gear surfaces using stylus instruments. Measurement Good Practice Guide. 147

Sun, W; Brown, S B; Leach, R K (2012) An overview of industrial X-ray computed tomography. NPL Report. ENG 32

Sun, W; Leach, R K (2010) Measurement of the internal geometry of MEMS structures. NPL Report. ENG 24

Hughes, E B; Forbes, A B; Sun, W; Maropoulos, P*; Muelaner, J*; Jamshidi, J*; Wang, Z* (2010) iGPS capability study. NPL Report. ENG 23

Article

Sun, W; Chretien, S; Biguri, A; Soleimani, M; Blumensath, T; Talbot, J (2023) The realisation of fast X-ray computed tomography using a limited number of projection images for dimensional metrology. NDT & E International, 137. 102852

Yang, X; Sun, W; Giusca, C (2022) An automated surface determination approach for computed tomography. NDT & E International, 131. 102697

Rossides, C; Towsyfyan, H; Biguri, A; Deyhle, H; Lindroos, R; Mavrogordato, M; Boardman, R; Sun, W; Blumensath, T (2022) Effects of fast x-ray cone-beam tomographic measurement on dimensional metrology. Metrologia, 59 (4). 044003

Chretien, S; Giampiccolo, C; Sun, W; Talbott, J (2021) Fast hyperparameter calibration of sparsity enforcing penalties in Total Generalised Variation penalised reconstruction methods for XCT using a planted virtual reference image. Mathematics, 9 (22). 2960

Ridler, N M; Johny, S; Salter, M J; Shang, X; Sun, W; Wilson, A (2021) Establishing waveguide lines as primary standards for scattering parameter measurements at submillimetre wavelengths. Metrologia, 58 (1). 015015 ISSN 0026-1394

Lohvithee, M; Sun, W; Chretien, S; Soleimani, M (2021) Ant Colony-Based Hyperparameter Optimisation in Total Variation Reconstruction in X-ray Computed Tomography. Sensors, 21 (2). 591 ISSN 1424-8220

Flay, N; Brown, S; Sun, W; Blumensath, T; Su, R (2020) Effects of off-focal radiation on dimensional measurements in industrial cone-beam micro-focus X-ray computed tomography systems. Precision Engineering, 66. pp. 472-481. ISSN 01416359

Ridler, N M; Johny, S; Shang, X; Sun, W; Wilson, A (2020) Comparing Standardized and Manufacturers’ Interfaces for Waveguides Used at Submillimeter Wavelengths. IEEE Transactions on Terahertz Science and Technology, 10 (5). pp. 453-459. ISSN 2156-342X

Chretien, S; Lohvithee, M; Sun, W; Soleimani, M (2020) Efficient Hyper-Parameter Selection in Total Variation-Penalised XCT Reconstruction Using Freund and Shapire’s Hedge Approach. Mathematics, 8 (4). 493 ISSN 2227-7390

Atkins, C; Brzozowski, W; Dobson, N; Milanova, M; Todd, S; Pearson, D; Bourgenot, C J; Brooks, D; Snell, R M; Sun, W; Cooper, P; Alcock, S G; Nistea, I T; Hallibert, P; Hull, T B; Kim, D W (2019) Additively manufactured mirrors for CubeSats. Proceedings of the SPIE, 11116. 1111616

Atkins, C; Brzozowski, W; Dobson, N; Milanova, M; Todd, S; Pearson, D; Bourgenot, C J; Brooks, D; Snell, R M; Sun, W; Cooper, P; Alcock, S G; Nistea, I T; Hallibert, P; Hull, T B; Kim, D W (2019) Lightweighting design optimisation for additively manufactured mirrors. Proccedings of the SPIE, 11116. 1111617

Sun, W; Brown, S B; Flay, N; McCarthy, M B; McBride, J* (2016) A reference sample for investigating the stability of the imaging system of x-ray computed tomography. Meas. Sci. Technol., 27 (8). 085004

Leach, R K; Claverley, J D; Giusca, C; Jones, C W; Nimishakavi, L P; Sun, W; Tedaldi, M; Yacoot, A (2012) Advances in engineering nanometrology at the National Physical Laboratory. Meas. Sci. Technol., 23 (7). 074002

Hughes, E B; Forbes, A B; Lewis, A; Sun, W; Veal, D; Nasr, K (2011) Laser tracker error determination using a network measurement. Meas. Sci. Technol., 22 (4). 045103

Sun, W; Leach, R K (2010) Advanced optical techniques for the measurement of the internal geometry of MEMS structures. Proc. SPIE - Int. Soc. Opt. Eng., 7544. pp. 754461-1.

Hughes, E B; Sun, W; Forbes, A B; Lewis, A (2010) Determining laser tracker alignment errors using a network measurement. J. CMSC, 5 (2). pp. 26-32.

Conference or Workshop Item

Sun, W; Chen, X; Giusca, C; Lou, S; Jones, C W; Boulter, H; Brown, S (2022) Evaluation of X-ray computed tomography for surface texture measurements using a prototype additively manufactured reference standard. In: 11th Conference on Industrial Computed Tomography (iCT 2022), 08-11 February 2022, Wels, Austria.

Liu, W; Chen, X; Zeng, W; Sun, W; Jiang, X; Scott, P; Lou, S (2021) FVM and XCT Measurement of Surface Texture of Additively Manufactured Parts. In: 2021 26th International Conference on Automation and Computing (ICAC), 02-04 September 2023, Portsmouth, UK.

This list was generated on Wed Oct 29 10:32:59 2025 GMT.