Necas, D; Yacoot, A; Valtr, M; Klapetek, P (2023) Demystifying data evaluation in the measurement of periodic structures. Measurement Science and Technology, 34 (5). 055015

Sun, X Z; Heaps, E; Yacoot, A; Yang, Q P; Grolich, P; Klapetek, P (2021) Three-dimensional drift correction of scan data from atomic force microscopy using Lissajous scanning paths. Measurement Science and Technology, 32 (11). 115010

Garnæs, J; Nečas, D; Nielsen, L; H Madsen, M; Torras-Rosell, A; Zeng, G; Klapetek, P; Yacoot, A (2020) Algorithms for using silicon steps for scanning probe microscope evaluation. Metrologia, 57 (6). 064002 ISSN 0026-1394

Hu, X; Dai, G; Sievers, S; Fernández-Scarioni, A; Corte-Leon, H; Puttock, R; Barton, C; Kazakova, O; Ulvr, M; Klapetek, P; Havlíček, M; Nečas, D; Tang, Y; Neu, V; Schumacher, H W (2020) Round robin comparison on quantitative nanometer scale magnetic field measurements by magnetic force microscopy. Journal of Magnetism and Magnetic Materials, 511. 166947 ISSN 03048853

Guen, E; Klapetek, P; Puttock, R; Hay, B; Allard, A; Maxwell, T; Chapuis, P O; Renahy, D; Davee, G; Valtr, M; Martinek, J; Kazakova, O; Gomès, S (2020) SThM-based local thermomechanical analysis: Measurement intercomparison and uncertainty analysis. International Journal of Thermal Sciences, 156. 106502 ISSN 12900729

Klapetek, P; Yacoot, A; Hortvík, V; Duchoň, V; Dongmo, H; Řeřucha, Š; Valtr, M; Nečas, D (2020) Multiple-fibre interferometry setup for probe sample interaction measurements in atomic force microscopy. Measurement Science and Technology, 31 (9). 094001 ISSN 0957-0233

Heaps, E; Yacoot, A; Dongmo, H; Picco, L; Payton, O D; Russell-Pavier, F; Klapetek, P (2020) Bringing real-time traceability to high-speed atomic force microscopy. Measurement Science and Technology, 31 (7). 074005 ISSN 0957-0233

Corte‐León, H; Neu, V; Manzin, A; Barton, C; Tang, Y J; Gerken, M; Klapetek, P; Schumacher, H W; Kazakova, O (2020) Comparison and Validation of Different Magnetic Force Microscopy Calibration Schemes. Small, 16 (11). 1906144 ISSN 1613-6810

Yacoot, A; Klapetek, P; Valtr, M; Grolich, P; Dongmo, H; Lazzerini, M G; Bridges, A (2019) Design and performance of a test rig for evaluation of nanopositioning stages. Measurement Science and Technology, 30 (3). 035002 ISSN 0957-0233

Nečas, D; Klapetek, P; Neu, V; Havlíček, M; Puttock, R; Kazakova, O; Hu, X; Zajíčková, L (2019) Determination of tip transfer function for quantitative MFM using frequency domain filtering and least squares method. Scientific Reports, 9 (1). 3880 ISSN 2045-2322

Guen, E; Chapuis, P-O; Klapetek, P; Puttock, R; Hay, B; Allard, A; Maxwell, T; Renahy, D; Valtr, M; Martinek, J; Gomes, S (2018) Local Thermophysical Properties Measurements on Polymers using Doped Silicon SThM Probe: Uncertainty Analysis and Interlaboratory Comparison. In: 2018 24th International Workshop on Thermal Investigations of ICs and Systems (THERMINIC), 26-28 September 2018, Stockholm, Sweden.