Pollard, A; Castro, F; Edwards, G; Gee, M; Giannis, S; Kitchen, S; Williams, J (2024) Advanced Materials Metrology Strategy. Other.

Kieler, O; Karlsen, B; Ohlckers, P A; Bardalen, E; Akram, M N; Behr, R; Ireland, J; Williams, J; Malmbekk, H; Palafox, L; Wendisch, R (2019) Optical Pulse-Drive for the Pulse-Driven AC Josephson Voltage Standard. IEEE Transactions on Applied Superconductivity, 29 (5). 1200205 ISSN 1051-8223

Ireland, J; Williams, J; Kieler, O; Behr, R; Houtzager, E; Hornecker, R; van den Brom, H E (2019) An Optoelectronic Pulse Drive for Quantum Voltage Synthesizer. IEEE Transactions on Instrumentation and Measurement, 68 (6). pp. 2066-2071. ISSN 0018-9456

Williams, J; Szyniszewski, M (2019) Constant failings. Physics World, 32 (3). p. 29. ISSN 0953-8585

Belcher, A; Williams, J; Ireland, J; Iuzzolino, R; Bierzychudek, M E; Dekker, R; Herick, J; Behr, R; Schaapman, K (2018) Towards a Metrology class ADC based on Josephson junction devices. Journal of Physics: Conference Series, 1065. 052044 ISSN 1742-6588

Iuzzolino, R; Bierzychudek, M E; Belcher, A; Dekker, R; Herick, J; Williams, J; Ireland, J; Schaapman, K (2018) Design and Simulation of a High-Order Sigma-Delta Continuous-Time Modulator. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.

Ireland, J; Williams, J; Kieler, O; Behr, R; Houtzager, E; Hornecker, R; Van den Brom, H E (2018) An Optoelectronic Pulse Drive for Quantum Voltage Synthesizer. In: 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), 8-13 July 2018, Paris, France.

Esward, T J; Knox, S; Jones, H*; Brewer, P J; Murphy, C E; Wright, L; Williams, J (2011) A metrology perspective on the dark injection transient current method for charge mobility determination in organic semiconductors. J. Appl. Phys., 109 (9). 093707

Henderson, L C A; Williams, J (1999) A guide to measuring resistance and impedance below 1 MHz. IEE Colloq. Dig., 019. pp. 1/1-2.