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Towards a Metrology class ADC based on Josephson junction devices

Belcher, A; Williams, J; Ireland, J; Iuzzolino, R; Bierzychudek, M E; Dekker, R; Herick, J; Behr, R; Schaapman, K (2018) Towards a Metrology class ADC based on Josephson junction devices. Journal of Physics: Conference Series, 1065. 052044 ISSN 1742-6588

Full text not available from this repository.
Item Type: Article
Notes: This is an open access publication. A copy can be downloaded from the publisher's website by clicking on the Official URL link above.
Subjects: Quantum Phenomena > Nanophysics
Divisions: Quantum Science
Identification number/DOI: 10.1088/1742-6596/1065/5/052044
Last Modified: 18 Feb 2019 14:01
URI: http://eprintspublications.npl.co.uk/id/eprint/8298

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