Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Phase and fringe order determination in wavelength scanning interferometry. Opt. Express, 24 (8). pp. 8997-9012.

Moschetti, G; Forbes, A B; Leach, R K*; Jiang, X*; O'Connor, D (2016) Quadrature wavelength scanning interferometry. Appl. Opt., 55 (20). pp. 5332-5340.

Leach, R K*; Giusca, C L; Haitjema, H*; Evans, C*; Jiang, X* (2015) Calibration and verification of areal surface texture measuring instruments. CIRP Ann. - Manuf. Technol., 64 (2). pp. 797-813.

Wang, J; Leach, R K; Jiang, X* (2014) Advances in sampling techniques for surface topography measurement - a review. NPL Report. ENG 55

Wang, J; Leach, R K; Jiang, X* (2014) Review of data fusion for surface topography measurement. NPL Report. ENG 54

Leach, R K; Harris, P M; Smith, I; Giusca, C L; Jiang, X*; Scott, P* (2013) Software measurement standards for areal surface texture parameters. In: Metrology and Properties of Engineering Surfaces, 2013: Proceedings of the 14th International Conference (14th MPES)., 17-21 June 2013, Taipei, Taiwan.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) Intelligent sampling for the measurement of structured surfaces. Meas. Sci. Technol., 23 (8). 085006

Harris, P M; Smith, I M; Leach, R K; Giusca, C; Jiang, X*; Scott, P* (2012) Software measurement standards for areal surface texture parameters: Part I - algorithms. Meas. Sci. Technol., 23 (10). 105008

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2012) A boundary segmentation algorithm for extracting micro-scale dimensional parameters in the measurement of structured surfaces. In: 12th euspen International Conference, 4-8 June 2012, Stockholm, Sweden.

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2011) Efficiency of adaptive sampling in surface texture measurement for structured surfaces. IOP Conf. Ser., 311. 012017

Wang, J*; Jiang, X*; Blunt, L A*; Leach, R K; Scott, P J* (2011) Efficiency of adaptive sampling in surface texture measurement for structured surfaces. In: 13th International Conference on Metrology and Properties of Engineering Surfaces., 12-15 April 2011, Twickenham Stadium, UK.

Leach, R K; Li, T*; Jiang, X*; Blunt, L*; Giusca, C (2010) Comparison of commercial software packages for calculating surface texture parameters. In: 10th International Conference of the European Society for Precision Engineering & Nanotechnology (euspen), 31 May - 4 June 2010, Delft, Netherlands.

Zeng, W*; Jiang, X*; Smith, I M; Scott, P* (2010) Transient signal separation in Watt balance experiements. Phys. Lett. A, 374 (11-12). pp. 1301-1306.

Li, T*; Leach, R K; Jiang, X*; Blunt, L A* (2009) Comparison of type F2 software measurement standards for surface texture. NPL Report. ENG 16

Leach, R K; Brown, L*; Jiang, X*; Blunt, R*; Conroy, M*; Mauger, D* (2008) Guide to the measurement of smooth surface topography using coherence scanning interferometry. Measurement Good Practice Guide. 108

Jiang, X*; Zeng, G*; Smith, I M; Scott, P*; Malétras, F-X* (2007) The detection of transient behaviour in environmental vibration for the Watt balance. Meas. Sci. Technol., 18 (5). pp. 1487-1494.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2006) Propagation of uncertainty in discretely sampled surface roughness profiles. In: Proceedings of the International Workshop on Advanced Mathematical and Computational Tools in Metrology VII, 2006.

Blunt, L*; Jiang, X*; Xiao, S*; Li, T*; Feng, X*; Brennan, J*; Scott, P*; Leach, R K; Harris, P M; Parkin, G I (2005) Development and dissemination of SOFTGAUGES for surface topography. Technical Report. Centre for Precision Technologies, University of Huddersfield.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Approximation of surface texture profiles. J. Phys., Conf. Ser., 13. pp. 264-267.

Blunt, L*; Leach, R K; Jiang, X*; Scott, P*; Harris, P M; Xiao, S*; Li, T*; Parkin, G I (2005) Development of softgauges for surface metrology. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Brennan, J K*; Crampton, A*; Jiang, X*; Leach, R K; Harris, P M (2005) Reconstruction of continuous surface profiles from discretely sampled data. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Blunt, L*; Jiang, X*; Leach, R K; Harris, P M; Scott, P* (2005) The development of user-friendly software measurement standards for surface topography software assessment. In: Proceedings 10th International Conference on Metrology and Properties of Engineering Surfaces, 4-7 July 2005, St Ettiane, France.

Brennan, J K*; Mason, J C*; Jiang, X*; Leach, R K; Harris, P M (2004) Approximation of surface texture profiles and parameters. In: 4th euspen International Conference, 31 May 2004 - 2 June 2004, Glasgow, UK.