Report/Guide

Hart, A; Haycocks, J; Jackson, K; Law, A; Leach, R K (2002) Measurement of surface texture in CBTLM: a three-year review of instrument capabilities. NPL Report. CBTLM 21

Leach, R K; Hart, A; Jackson, K (1999) Measurement of gauge blocks by interferometry: an investigation into the variability in wringing film thickness. NPL Report. CLM 3

Leach, R K; Jackson, K; Hart, A (1997) Measurement of gauge blocks by interferometry: measurement of the phase change at reflection. NPL Report. MOT 11

Leach, R K; Jackson, K; Hart, A (1997) Design of two systems to measure the phase change at reflection and one system to measure the variability in contact error due to wringing. NPL Report. MOT 10

Article

Haycocks, J; Jackson, K (2007) Detecting and addressing the surface following errors in the calibration of step heights by atomic force microscopy. Meas. Sci. Technol., 18 (2). pp. 469-475.

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2006) Recent advances in traceable nanoscale dimension and force metrology in the UK. Meas. Sci. Technol., 17. pp. 467-476.

Haycocks, J; Jackson, K (2005) Traceable calibration of transfer standards for scanning probe microscopy. Precision Engineering, 29. pp. 168-175.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2001) Advances in traceable nanometrology at the National Physical Laboratory. Nanotechnology, 12. pp. R1-R6.

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (2000) Combined optical and x-ray interferometry for high precision dimensional metrology. Proc. R. Soc. Lond. A, 456. pp. 701-729.

Franks, A; Jackson, K; Yacoot, A (2000) A parabolic mirror x-ray collimator. Meas. Sci. Technol., 11. pp. 484-488.

Conference or Workshop Item

Leach, R K; Chetwynd, D*; Blunt, L*; Haycocks, J; Harris, P M; Jackson, K; Oldfield, S; Reilly, S (2005) Recent advances in traceable nanoscale dimension and force metrology in the UK. In: ISMTII 2005 - 7th International Symposium Series on Measurement Technology and Intelligent Instruments., 6-8 September 2005, Huddersfield, UK.

Haycocks, J; Jackson, K; Leach, R K; Garratt, J*; McDonnell, I*; Rubert, P*; Lamb, J*; Wheeler, S* (2005) Tackling the challenge of traceable surface texture measurement in three dimensions. In: 5th International Conference and 7th Annual General Meeting of the European Society for Precision Engineering and Nanotechnology, 8-11 May 2005, Montpellier, France.

Leach, R K; Haycocks, J; Jackson, K; Lewis, A; Oldfield, S; Yacoot, A (2000) Advances in traceable nanometrology at the National Physical Laboratory. In: Proc. Int. Seminar Future Directions of Nanotechnology in Europe and Japan., 18-19 September 2000, Warwick University.

Haycocks, J; Jackson, K; Robbie, C J; Stedman, M (1997) Traceable metrology for scanning probe microscopes. In: Proc. 2nd Seminar on Quantitive Microscopy, November 1997, PTB, Germany.

Basile, G*; Becker, P*; Bergamin, A*; Cavagnero, G*; Franks, A; Jackson, K; Kuetgens, U*; Mana, G*; Palmer, E W; Robbie, C J; Stedman, M; Stumpel, J*; Yacoot, A; Zosi, G* (1993) COXI - Combined optical and x-ray interferometry for high precision dimensional metrology. In: 7th International Precision Engineering Seminar, May 1993, Kobe, Japan.