Chunnilall, C J; Lepert, G; Allerton, J J; Hart, C J; Sinclair, A G (2014) Traceable metrology for characterizing quantum optical communication devices. Metrologia, 51 (6). S258-S266

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Abstract

Industrial technologies based on the production, manipulation, and detection of single and entangled photons are emerging. Quantum key distribution is one of the most commercially advanced, and among the first to directly harness the peculiar laws of quantum physics. To assist the development of this quantum industry, the National Physical Laboratory (NPL) is using traditional, and quantum, approaches to develop traceable performance metrology for the quantum devices used in these technologies. We report on the instrumentation we have developed to characterise such systems

Item Type:	Article
Keywords:	Metrology, Quantum Key Distribution, Single-photon
Subjects:	Quantum Phenomena Optical Radiation and Photonics Quantum Phenomena > Quantum Information Processing and Communication Optical Radiation and Photonics > Few Photon Science
Identification number/DOI:	10.1088/0026-1394/51/6/S258
Last Modified:	02 Feb 2018 13:13
URI:	https://eprintspublications.npl.co.uk/id/eprint/6436