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Publications

Items where Author is "Tiddia, M"

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Number of items: 6.

Article

Marchesini, S; Reed, B P; Jones, H; Matjacic, L; Rosser, T E; Zhou, Y; Brennan, B; Tiddia, M; Jervis, R; Loveridge, M J; Raccichini, R; Park, J; Wain, A J; Hinds, G; Gilmore, I S; Shard, A G; Pollard, A P (2022) Surface Analysis of Pristine and Cycled NMC/Graphite Lithium-Ion Battery Electrodes: Addressing the Measurement Challenges. ACS Applied Materials & Interfaces, 14 (47). pp. 52779-52793.

Rakowska, P D; Tiddia, M; Faruqui, N; Bankier, C; Pei, Y W; Pollard, A J; Zhang, J T; Gilmore, I S (2021) Antiviral surfaces and coatings and their mechanisms of action. Communications Materials, 2 (1). 53

Trindade, G F; Wang, F; Im, J; He, Y; Balogh, A; Scurr, D; Gilmore, I; Tiddia, M; Saleh, E; Perven, D; Turyanska, L; Tuck, C J; Wildman, R; Hague, R; Roberts, C J (2021) Residual polymer stabiliser causes anisotropic electrical conductivity during inkjet printing of metal nanoparticles. Communications Materials, 2 (1). 47

Tiddia, M; Seah, M P; Shard, A G; Mula, G; Havelund, R; Gilmore, I S (2020) Argon cluster cleaning of Ga + FIB‐milled sections of organic and hybrid materials. Surface and Interface Analysis, 52 (6). pp. 327-334. ISSN 0142-2421

Tiddia, M; Mihara, I; Seah, M P; Trindade, G F; Kollmer, F; Roberts, C J; Hague, R; Mula, G; Gilmore, I S; Havelund, R (2019) Chemical Imaging of Buried Interfaces in Organic–Inorganic Devices Using Focused Ion Beam-Time-of-Flight-Secondary-Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 11 (4). pp. 4500-4506. ISSN 1944-8244

Havelund, R; Seah, M P; Tiddia, M; Gilmore, I S (2018) SIMS of organic materials-interface location in argon gas cluster depth profiles using negative-secondary ions. Journal of the American Society for Mass Spectrometry, 29 (4). pp. 774-785.

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