Stanley, M; Shang, X; Celep, M; Salter, M; de Graaf, S; Lindstrom, T; Shin, S-H; Skinner, J; Singh, D; Stokes, D; Acharya, M; Ridler, N M (2024) RF and Microwave Metrology for Quantum Computing – Recent Developments at the UK’s National Physical Laboratory. International Journal of Microwave and Wireless Technologies, 16 (4). pp. 535-543.

Stanley, M; Salter, M; Urbonas, J; Skinner, J; Shin, S-H; de Graaf, S; Ridler, N M (2024) Characterizing S-Parameters of Microwave Coaxial Devices with up to Four Ports at Temperatures of 3 K and Above for Quantum Computing Applications. IEEE Transactions on Instrumentation and Measurement, 73. 1500906

Stanley, M; de Graaf, S; Lindstrom, T; Salter, M; Skinner, J; Ridler, N M (2023) Design of Microwave Calibration Standards for Characterising S-Parameters of Quantum Integrated Circuits at Millikelvin Temperatures. In: 2021 51st European Microwave Conference (EuMC), 04-06 April 2022, London, UK.

Allal, D; Bannister, R; Buisman, K; Capriglione, D; Di Capua, G; Garcia-Patron, M; Gatzweiler, T; Gellersen, F; Harzheim, T; Heuermann, H; Hoffmann, J; Izbrodin, A; Kuhlmann, K; Lahbacha, K; Maffucci, A; Miele, G; Mubarak, F; Salter, M; Pham, T D; Sayegh, A; Singh, D; Stein, F; Zeier, M (2022) RF Measurements for Future Communication Applications: an Overview. In: 2022 IEEE International Symposium on Measurement & Networking (M&N), 18-20 July 2022, Padua, Italy.

Salter, M; Singh, D; Stant, L (2021) Nonlinear measurements for 5G devices and the associated uncertainties. In: Metrology for 5G and Emerging Wireless Technologies. IET, pp. 55-83. ISBN 9781839532788

Singh, D; Salter, M; Skinner, J; Ridler, N M (2021) Commissioning of a VNA dynamic uncertainty tool for microwave S-parameter measurements. NPL Report. TQE 16

Koo, H; Salter, M; Kang, N W; Ridler, N M; Hong, Y P (2021) Uncertainty of S-parameter Measurements on PCBs due to Imperfections in the TRL Line Standard. Journal of Electromagnetic Engineering and Science, 21 (5). pp. 369-378.

Singh, D; Salter, M; Ridler, N M (2019) Comparison of Vector Network Analyser (VNA) calibration techniques at microwave frequencies. NPL Report. TQE 14

Salter, M; Stant, L; Buisman, K; Nielsen, T (2018) An Inter-Laboratory Comparison of NVNA Measurements. In: 2018 International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMIC), 5-6 July 2018, Brive la Gaillarde, France.

Zinal, S*; Allal, D*; Salter, M (2016) Comparison of calibration methods for multiport VNA measurements up to 67 GHz. In: 2016 Conference for Precision Electromagnetic Measurements (CPEM), 10-15 July 2016, Ottawa, Canada.

Ziade, F*; Hudlicka, M*; Salter, M; Pavlicek, T*; Allal, D* (2016) Uncertainty evaluation of balanced S-parameter measurements. In: 2016 Conference on Precision Electromagnetic Measurements (CPEM), 10-15 July 2016, Ottawa, Canada.

Alexander, M J; Salter, M; Cheadle, D (2013) Near-field validation of calculable dipole antennas in a fully anechoic room from 20 MHz to 1000 MHz: with applications to validation of EMC test sites and calibration of EMC antennas. In: Proceedings of the 2013 International Symposium on Electromagnetic Compatibility (EMC Europe 2013), 2-6 September 2013, Brugge, Belgium.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2013) The trace is on measurements: developing traceability for S-parameter measurements at millimeter and submillimeter wavelengths. IEEE Microw. Mag., 14 (7). pp. 67-74.

Shelton, D*; Salter, M; Ridler, N M; Horibe, M* (2012) Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies. In: 80th ARFTG Microwave Measurement Conference, 29-30 November 2012, San Diego, CA, USA.

Shelton, D*; Salter, M; Ridler, N M; Horibe, M* (2012) Characterizing artefact standards for use with coaxial vector network analyzers at millimeter-wave frequencies. In: 2012 80th ARFTG Microwave Measurement Conference, 29-30 November 2012, San Diego, CA, USA.

Ridler, N M; Clarke, R*; Salter, M; Wilson, A (2011) Traceability to national standards for S-parameter measurements in waveguide at frequencies from 220 GHz to 330 GHz. In: 78th ARFTG Microwave Measurement Symposium, 1 - 2 December 2011, Tempe, AZ, USA.

Wickham, M; Salter, M; Ridler, N M; Dusek, M; Hunt, C (2008) On-wafer testing of PCB lines as a production assessment method for anisotropic conductive film bonding. NPL Report. MAT 18

Singh, D; Salter, M; Ridler, N Characterisation of power transistors for wireless network applications using passive and active load-pull. In: 2024 IEEE International Symposium on Measurements & Networking (M&N), 02-05 July 2024, Rome, Italy.